相关论文: Investigating model influence on the analytical re…
Neutron reflectometry (NR) has emerged as a unique technique for the investigation of structure and magnetism of thin films of both biologically relevant and magnetic materials. The advantage of NR with respect to many other…
Neutron reflectometry analysis is an inherently ill-posed, which is to say that there are many possible solutions which agree equally well with the measured data. This leads to the application of model-dependent analysis, where information…
The determination of density profiles with knowing the phase information of complex reflection coefficient for neutron specularly reflected from a film, yields unique results. Recently it has been shown that the phase can be determined by…
Neutron and X-ray reflectometry are powerful techniques facilitating the study of the structure of interfacial materials. The analysis of these techniques is ill-posed in nature requiring the application of a model-dependent methods. This…
Polarized neutron reflectometry is a powerful technique to interrogate the structures of multilayered magnetic materials with depth sensitivity and nanometer resolution. However, reflectometry profiles often inhabit a complicated objective…
In the past decade, several neutron reflectometry methods for determining the modulus and phase of the complex reflection coefficient of an unknown multilayer thin film have been worked out among which the method of variation of…
Recently it has been shown that the modules and phase of complex reflection coefficient can be determined by using a magnetic substrate and polarized neutrons. Several other methods have also been worked out based on measurement of…
By knowing the phase and modules of the reflection coefficient in neutron reflectometry problems, a unique result for the scattering length density (SLD) of a thin film can be determined which will lead to the exact determination of type…
A method is proposed which allows a complete determination of the complex reflection coefficient for any free unknown real potential (i.e., in the case where there is no effective absorption). In this method the unknown layer mounted on top…
The applicability of standard methods for compositional analysis is limited for H-containing films. Neutron reflectometry is a powerful, non-destructive method that is especially suitable for these systems due to the large negative…
Using molecular simulation to aid in the analysis of neutron reflectometry measurements is commonplace. However, reflectometry is a tool to probe large-scale structures, and therefore the use of all-atom simulation may be irrelevant. This…
Neutron reflectometry is a powerful tool used for studies of surfaces and interfaces. In general the absorption in the typical studied materials can be neglected and this technique is limited to the measurement of the reflectivity only. In…
Driven by the availability of modern software and hardware, Bayesian analysis is becoming more popular in neutron and X-ray reflectometry analysis. The understandability and replicability of these analyses may be harmed by inconsistencies…
We have combined neutron reflectometry with rheology in order to investigate the solid boundary of liquids and polymers under shear deformation. Our approach allows one to apply a controlled stress to a material while resolving the…
We implemented the Bayesian analysis to the polarised neutron reflectivity data. Reflectivity data from a magnetic TbCo thin film structure was studied using the bundle of a Monte-Carlo Markov-chain algorithm, likelihood estimation, and…
Ptychographic reconstructions in reflection geometries are commonly interpreted with the same two-dimensional thin-sample model used in transmission, yet the validity of this approximation has not been established. We develop a…
The ever increasing need for product advancement and miniaturization keeps thin film assemblies, membranes, magnetic and non-magnetic multilayer and patterned heterostructures in the limelight of material science and technological…
Atomic-resolution imaging with scanning transmission electron microscopy is a powerful tool for characterizing the nanoscale structure of materials, in particular features such as defects, local strains, and symmetry-breaking distortions.…
The thickness and interfacial geometry of hexagonal boron nitride (hBN) films grown by chemical vapor deposition on polycrystalline nickel foils is studied using low-energy electron microscopy (LEEM). The reflectivity of the electrons,…
A relatively simple and accurate analytical model for studying the reflectivity of neutron multilayer monochromators and supermirrors is proposed. Design conditions that must be fulfilled in order to reach the maximum reflectivity are…