相关论文: An iterative method for reference pattern selectio…
The spatial variation in martensite tetragonality (c/a ratio) in Fe-0.77C (wt.%) alloy was investigated by means of pattern matching of electron backscatter diffraction patterns combined with high angular resolution electron backscatter…
The association of scanning transmission electron microscopy (STEM) and the detection of a diffraction pattern at each probe position (so-called 4D-STEM) represents one of the most promising approaches to analyze structural properties of…
A new reference design is introduced for holographic coherent diffraction imaging. This consists in two references - "block" and "pinhole" shaped regions - placed adjacent to the imaging specimen. An efficient recovery algorithm is provided…
Reflection high-energy electron diffraction (RHEED) is a powerful tool for characterizing crystal surface structures. However, the setup geometry leads to distorted and complicated patterns, which are not straightforward to link to the…
Electron diffraction through a thin patterned silicon membrane can be used to create complex spatial modulations in electron distributions by varying the intensity of different reflections using parameters such as crystallographic…
The displacement field in highly non uniformly strained crystals is obtained by addition of constraints to an iterative phase retrieval algorithm. These constraints include direct space density uniformity and also constraints to the sign…
Experimentally obtained X-ray diffraction (XRD) patterns can be difficult to solve, precluding the full characterization of materials, pharmaceuticals, and geological compounds. Herein, we propose a method based upon a multi-objective…
Energy-dispersive X-ray diffraction (EDXRD) is extremely insensitive to sample morphology when implemented in a back-reflection geometry. The capabilities of this non-invasive technique for cultural heritage applications have been explored…
When a sample's X-ray diffraction pattern (XRD) is measured, the corresponding crystal structure is usually determined by searching for similar XRD patterns in the database. However, if a similar XRD pattern is not found, it is tremendously…
The accuracy of the information that can be extracted from electron diffraction patterns is often limited by the presence of optical distortions. Existing distortion characterization techniques typically require knowledge of the reciprocal…
The diffraction patterns of crystalline materials with local order contain sharp Bragg reflections as well as highly structured diffuse scattering. The instrumental requirements, experimental parameters and data processing techniques for…
The Scanning electron microscope (SEM) and Electron-Dispersive Spectroscope (EDS) are two highly effective instruments in the field of nanoscience and nanotechnology. The quality of these instruments is determined by various factors, with…
Zircaloy-4 is used as a fuel cladding material for water reactors, as it has good mechanical properties, corrosion resistance, and a low thermal neutron absorption cross section. However, the mechanical performance of Zircaloy-4 can be…
Measurements of the local tetragonality in Fe-C martensite at microstructural length-scale through pattern matching of electron backscatter diffraction patterns (EBSPs) and careful calibration of detector geometry are presented. It is found…
The Event Horizon Telescope (EHT) has produced horizon-resolving images of Sagittarius A* (Sgr A$^*$). Scattering in the turbulent plasma of the interstellar medium distorts the appearance of Sgr A$^*$ on scales only marginally smaller than…
Recent years have witnessed the prosperity of reference-based image super-resolution (Ref-SR). By importing the high-resolution (HR) reference images into the single image super-resolution (SISR) approach, the ill-posed nature of this…
Backscatter limits many interferometric measurements, including gravitational wave detectors, by creating spurious interference. We describe an experimental method to directly and quantitatively measure the backscatter interference. We…
We present a method for obtaining qualitatively accurate grain boundary plane distributions (GBPD) for textured microstructures using a stereological calculation applied to two-dimensional electron backscatter diffraction (EBSD) orientation…
We report a promising InSiO film that allows simultaneous observation of sample morphology and Kikuchi patterns in raster scan mode of scanning electron microscopy. This new experimental observation suggests potential mechanism beyond…
Possible ways of identification are discussed of an electronic order of higher multipoles such as octupoles and hexadecapoles. A particularly powerful method is resonant X-ray scattering (RXS) using quadrupolar resonance processes called…