Regulating electron diffraction direction with cylindrically symmetric rotating crystal
Materials Science
2022-11-15 v1
Abstract
We report a promising InSiO film that allows simultaneous observation of sample morphology and Kikuchi patterns in raster scan mode of scanning electron microscopy. This new experimental observation suggests potential mechanism beyond existing diffraction theories. We find by simulation that this material has a novel cylindrically symmetric rotational crystalline structure that can control the diffraction direction of electrons through a specific rotational distribution of crystal planes, while being independent of the angle and energy of incident electrons within a certain range.
Cite
@article{arxiv.2211.07144,
title = {Regulating electron diffraction direction with cylindrically symmetric rotating crystal},
author = {L. Cheng and B. Da and X. Liu and K. Shigeto and K. Tsukagoshi and T. Nabatame and J. W. Liu and H. Zhang and H. Yoshikawa and S. Tanuma and Z. S. Gao and H. X. Guo and Y. Sun and J. Hu and Z. J. Ding},
journal= {arXiv preprint arXiv:2211.07144},
year = {2022}
}