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Optical microscopy is believed to be an efficient method for identifying layer number of two-dimensional 2D materials. However, since illuminants, cameras and their parameters are different from lab to lab, it is impossible to identify…

材料科学 · 物理学 2019-03-27 Jiayu Lei , Jiafan Qu , Peng Wang , Hu Jiang , Hongyan Shi , Xiudong Sun , Bo Gao

The physical and electronic properties of ultrathin two-dimensional (2D) layered nanomaterials are highly related to their thickness. Therefore, the rapid and accurate identification of single- and few- to multi-layer nanosheets is…

材料科学 · 物理学 2013-10-28 Hai Li , Jumiati Wu , Xiao Huang , Gang Lu , Jian Yang , Xin Lu , Qihua Xiong , Hua Zhang

The field of two-dimensional materials has been developing at an impressive pace, with atomically thin crystals of an increasing number of different compounds that have become available, together with techniques enabling their assembly into…

介观与纳米尺度物理 · 物理学 2021-09-15 D. Domaretskiy , N. Ubrig , I. Gutiérrez-Lezama , M. K. Tran , A. F. Morpurgo

Two-dimensional (2D) transition metal dicakcoganite (TMD) materials have unique electronic and optical properties. The electronic band structures of the materials alter as a function of layer numbers, which results in modifications to the…

应用物理 · 物理学 2025-02-18 Bilal Bera Meric , Ayse Erol , Fahrettin Sarcan

Optical spectroscopy techniques such as differential reflectance and transmittance have proven to be very powerful techniques to study 2D materials. However, a thorough description of the experimental setups needed to carry out these…

We study the optical contrast for single and multilayer graphene deposited on a Au/SiO2/Si substrate. Our results prove that optical microscopy allows for easy and quick localization, identification and counting of graphene layers.…

介观与纳米尺度物理 · 物理学 2012-11-07 Igor Wlasny , Pawel Dabrowski , Zbigniew Klusek

A simple optical method is presented for identifying and measuring the effective optical properties of nanometer-thick, graphene-based materials, based on the use of substrates consisting of a thin dielectric layer on silicon. High contrast…

The main objective of this study was to develop a novel method of characterizing nanomaterials based on the number of layers without the aid of state-of-the-art electron and force microscopes. While previous research groups have attempted…

应用物理 · 物理学 2018-12-11 Daniel Cui , Tom Goldstein , Jun Yan

This paper deals with a challenging, frequently encountered, yet not properly investigated problem in two-frame optical flow estimation. That is, the input frames are compounds of two imaging layers -- one desired background layer of the…

计算机视觉与模式识别 · 计算机科学 2016-05-09 Jiaolong Yang , Hongdong Li , Yuchao Dai , Robby T. Tan

Raman spectroscopy is frequently used to identify composition, structure and layer thickness of 2D materials. Here, we describe an efficient first-principles workflow for calculating resonant first-order Raman spectra of solids within…

材料科学 · 物理学 2020-07-15 A. Taghizadeh , U. Leffers , T. G. Pedersen , K. S. Thygesen

Advanced microscopy and/or spectroscopy tools play indispensable role in nanoscience and nanotechnology research, as it provides rich information about the growth mechanism, chemical compositions, crystallography, and other important…

An optical microscope enables image-based findings and diagnosis on microscopic targets, which is indispensable in many scientific, industrial and medical settings. Majority of microscope users are accustomed to standard benchtop…

光学 · 物理学 2025-05-06 Keiichiro Toda , Miu Tamamitsu , Ryoichi Horisaki , Takuro Ideguchi

The detection and classification of exfoliated two-dimensional (2D) material flakes from optical microscope images can be automated using computer vision algorithms. This has the potential to increase the accuracy and objectivity of…

计算机视觉与模式识别 · 计算机科学 2026-02-06 Jan-Lucas Uslu , Alexey Nekrasov , Alexander Hermans , Bernd Beschoten , Bastian Leibe , Lutz Waldecker , Christoph Stampfer

The emerging Au-assisted exfoliation technique provides a wealth of large-area and high-quality ultrathin two-dimensional (2D) materials compared with traditional tape-based exfoliation. Fast, damage-free, and reliable determination of the…

Machine learning methods are changing the way data is analyzed. One of the most powerful and widespread applications of these techniques is in image segmentation wherein disparate objects of a digital image are partitioned and classified.…

介观与纳米尺度物理 · 物理学 2021-03-18 Randy M. Sterbentz , Kristine L. Haley , Joshua O. Island

We investigate graphene and graphene layers on different substrates by monochromatic and white-light confocal Rayleigh scattering microscopy. The image contrast depends sensitively on the dielectric properties of the sample as well as the…

The most widely used method for obtaining high-quality two-dimensional materials is through mechanical exfoliation of bulk crystals. Manual identification of suitable flakes from the resulting random distribution of crystal thicknesses and…

An optical microscope is described that reveals contrast in the Mueller matrix images of a thin, transparent or semi-transparent specimen located within an anisotropic object plane (anisotropic filter). The specimen changes the anisotropy…

Optical approaches have made great strides towards the goal of high-speed, energy-efficient computing necessary for modern deep learning and AI applications. Read-in and read-out of data, however, limit the overall performance of existing…

Optical blur is an inherent property of any lens system and is challenging to model in modern cameras because of their complex optical elements. To tackle this challenge, we introduce a high-dimensional neural representation of…

图像与视频处理 · 电气工程与系统科学 2025-07-18 Esther Y. H. Lin , Zhecheng Wang , Rebecca Lin , Daniel Miau , Florian Kainz , Jiawen Chen , Xuaner Cecilia Zhang , David B. Lindell , Kiriakos N. Kutulakos
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