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相关论文: Simultaneous microscopic imaging of thickness and …

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We present a robust, precise, and accurate method to simultaneously measure the refractive indices of two transparent materials within an interference coating. This is achieved by measuring both a photometrically accurate transmittance…

We describe a high-speed interferometric method, using multiple angles of incidence and multiple wavelengths, to measure the absolute thickness, tilt, the local angle between the surfaces, and the refractive index of a fluctuating…

光学 · 物理学 2020-08-26 Mengfei He , Sidney R. Nagel

Non-contact measurement of the refractive index and thickness of multilayer biological tissues is of great significance for biomedical applications and can greatly improve medical diagnosis and treatment. In this work, we introduce a…

光学 · 物理学 2024-04-19 Yu-Lin Ku , Yao-Gen Shu

Reflectometry is a technique that uses the light reflected by a sample to determine properties of the sample. Interferometric reflectometry uses interference between two beams, one of which is incident on ---and reflected back by--- a…

光学 · 物理学 2019-10-10 Alexander Nahmad-Rohen , Wolfgang Langbein

Refractive index is a fundamental optical property of powder and a key input to the measurement of the size distribution using light scattering and the measurement of the absorption and scattering coefficients using diffuse reflectance…

光学 · 物理学 2024-03-05 Cory Juntunen , Adam J. Rish , Carl Anderson , Yongjin Sung

A key optical parameter characterizing the existence of negative refraction in a thin layer of a composite material is the effective refractive index of an equivalent, homogenized layer with the same physical thickness as the initial…

For measurements designed to accurately determine layer thickness, there is a natural trade-off between sensitivity to optical thickness and lateral resolution due to the angular ray distribution required for a focused beam. We demonstrate…

White light spectral interferometry is applied to measure the refractive index in absorbing liquids in the spectral range from 400 to 1000 nm. We analyze the influence of absorption on the visibility of interferometric fringes and,…

Determination of refractive index of micro-disks of a calcinated ($1100^\circ$C in air) photo-resist SZ2080$^\mathrm{TM}$ was carried out using transmission and reflection spectroscopy. Interference fringes at specific…

Increasing requirements in the sensitivity of interferometric measurements is a common feature of several research fields, from gravitational wave detection to quantum optics. This motivates refined studies of high reflectivity mirrors and…

A simple method was developed to observe the interference patterns of the light reflected by the interfaces of thin liquid films. Employing a fluorescent microscope with epi-illumination, we collected the 2D patterns of interference fringes…

光学 · 物理学 2010-06-14 V. Berejnov , D. Li

In semiconductor manufacturing processes, silicon dioxide films are commonly used as barrier layers, insulating layers, and protective layers. Coherence scanning interferometry (CSI) offers thin film thickness measurements with a…

光学 · 物理学 2025-03-11 Lixuan Xu , Cheng Chen , Rong Su

Measuring temperature fields in semi-transparent media requires the knowledge of material thermo-optic properties. While the current techniques are well established for isothermal thin films, they remain unexplored for thick media where…

应用物理 · 物理学 2025-05-02 Jordan Letessier , Abel Netter , Jérémie Maire , Stéphane Chevalier

We deposit thin titanium-nitride (TiN) and TiN/Ti/TiN multilayer films on sapphire substrates and measure the reflectance and transmittance in the wavelength range from 400 nm to 2000 nm using a spectrophotometer. The optical constants…

光学 · 物理学 2019-01-30 M. Dai , W. Guo , X. Liu , M. Zhang , Y. Wang , L. F. Wei , G. C. Hilton , J. Hubmayr , J. Ullom , J. Gao , M. R. Vissers

We investigate linear resonant absorption by a dense ensemble of molecules confined to a subwavelength layer in two geometries: (i) a free-standing film in homogeneous space and (ii) the same film placed at a controlled distance from a…

光学 · 物理学 2026-04-14 Zeyu Zhou , Maxim Sukharev , Abraham Nitzan , Joseph E. Subotnik

With the development of terahertz time-domain spectroscopy, methods have been proposed to precisely estimate the thickness, refractive index, and attenuation coefficient of a sample. In this article, we propose a new method to compute these…

Digital holographic microscopy is a thriving imaging modality that attracted considerable research interest in quantitative biological cell imaging due to its ability to not only create excellent label-free contrast, but also supply…

光学 · 物理学 2019-04-03 Gili Dardikman , Natan T. Shaked

Total internal reflection fluorescence (TIRF) microscopy and its variants are key technologies for visualizing the dynamics of single molecules or organelles in live cells. Yet, truely quantitative TIRF remains problematic. One unknown…

生物物理 · 物理学 2017-06-07 Maia Brunstein , Lopamudra Roy , Martin Oheim

Most integrated evanescent-field photonic sensors measure changes in either the real part or the imaginary part of the complex refractive index of the sample, i.e., refraction or absorption. Here we propose and experimentally demonstrate a…

Coating thickness measurement and inspection of defects beneath optically opaque surfaces are among the most promising commercial applications of the terahertz (THz) imaging technology. However, there are two main sources of complexity in…

应用物理 · 物理学 2025-05-14 Arash Karimi , Zachery B. Harris , Erica Heller , Paul Vahey , M. Hassan Arbab
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