相关论文: PRISA: a simple software for determining refractiv…
Spectroscopic ellipsometry is a powerful method with high surface sensitivity that can be used to monitor the growth of even sub-monolayer film. However, the analysis of ultrathin films is complicated by the correlation of the dielectric…
In semiconductor manufacturing processes, silicon dioxide films are commonly used as barrier layers, insulating layers, and protective layers. Coherence scanning interferometry (CSI) offers thin film thickness measurements with a…
Reliable control of the deposition process of optical films and coatings frequently requires monitoring of the refractive index profile throughout the layer. In the present work a simple in situ approach is proposed which uses a WKBJ matrix…
White light spectral interferometry is applied to measure the refractive index in absorbing liquids in the spectral range from 400 to 1000 nm. We analyze the influence of absorption on the visibility of interferometric fringes and,…
Designing optoelectronic devices based on cesium lead chloride (CsPbCl${_3}$) perovskites requires accurate values of their optical constants. Unfortunately, experimental data for this material is very limited thus far. Therefore, here, we…
The problem of determining the porous silicon (PSi) optical constants, thickness, porosity, and surface quality using just reflectance data is board employing evolutionary algorithms. The reflectance measurements were carried out of PSi…
This paper describes a method to determine the complex permittivity of a thin dielectric film from finite element analysis and microstrip line measurements. Two transmission line equivalent circuit models were used for the cases of an…
Extinction coefficient is fundamental to analyze radiative transport in micro/nano particle suspensions. In the traditional transmission method for measuring the extinction coefficient of particles in a cuvette, a reference system is used…
In light refraction between two transparent media, Snell's law describes the relationship between the incident angle and refraction angle. The refractive index is usually determined from Snell's law using the minimum deviation angle through…
We have developed a range of theoretical and numerical techniques for modeling the multi-mode, 210-34 micron, ultra-low-noise Transition Edge Sensors that will be used on the SAFARI instrument on the ESA/JAXA cooled-aperture FIR space…
The ability of snapshot compressive imaging (SCI) systems to efficiently capture high-dimensional (HD) data depends on the advent of novel optical designs to sample the HD data as two-dimensional (2D) compressed measurements. Nonetheless,…
Photon transport through a diffusing slab can be described by the radiative transfer equation (RTE). When the slab is highly scattering and weakly absorbing, the RTE simplifies to the diffusion equation. In this paper, an inverse diffusion…
Light-absorbing materials are widely used, and their optical properties are an important factor. Snell's law does not hold in materials that partially absorb light. Hence, the optical path in refraction is calculated from Maxwell's law. We…
Precise measurements of the geometrical thickness of a sample and its refractive index are important for materials science, engineering, and medical diagnosis. Among the possible non-contact evaluation methods, optical interferometric…
To design semiconductor-based optical devices, the optical properties of the used semiconductor materials must be precisely measured over a large band. Transmission spectroscopy stands out as an inexpensive and widely available method for…
We deposit thin titanium-nitride (TiN) and TiN/Ti/TiN multilayer films on sapphire substrates and measure the reflectance and transmittance in the wavelength range from 400 nm to 2000 nm using a spectrophotometer. The optical constants…
Scientific and environmental imagery often suffer from complex mixtures of noise related to the sensor and the environment. Existing restoration methods typically remove one degradation at a time, leading to cascading artifacts,…
We present a robust, precise, and accurate method to simultaneously measure the refractive indices of two transparent materials within an interference coating. This is achieved by measuring both a photometrically accurate transmittance…
With the development of terahertz time-domain spectroscopy, methods have been proposed to precisely estimate the thickness, refractive index, and attenuation coefficient of a sample. In this article, we propose a new method to compute these…
The problem of phase retrieval (PR) involves recovering an unknown image from limited amplitude measurement data and is a challenge nonlinear inverse problem in computational imaging and image processing. However, many of the PR methods are…