中文
相关论文

相关论文: Estimation of Z-Thickness and XY-Anisotropy of Ele…

200 篇论文

Here a new microscopic method is proposed to image and characterize very thin samples like few-layer materials, organic molecules, and nanostructures with nanometer or sub-nanometer resolution using electron beams of energies lower than 20…

仪器与探测器 · 物理学 2016-01-06 Ing-Shouh Hwang

Serial section Microscopy is an established method for volumetric anatomy reconstruction. Section series imaged with Electron Microscopy are currently vital for the reconstruction of the synaptic connectivity of entire animal brains such as…

计算机视觉与模式识别 · 计算机科学 2016-06-20 Philipp Hanslovsky , John A. Bogovic , Stephan Saalfeld

Motivation: Serial section microscopy is an established method for detailed anatomy reconstruction of biological specimen. During the last decade, high resolution electron microscopy (EM) of serial sections has become the de-facto standard…

计算机视觉与模式识别 · 计算机科学 2016-06-20 Philipp Hanslovsky , John A. Bogovic , Stephan Saalfeld

Scanning Transmission Electron Microscopy (STEM) offers high-resolution images that are used to quantify the nanoscale atomic structure and composition of materials and biological specimens. In many cases, however, the resolution is limited…

信号处理 · 电气工程与系统科学 2021-12-23 Daniel Nicholls , Alex Robinson , Jack Wells , Amirafshar Moshtaghpour , Mounib Bahri , Angus Kirkland , Nigel Browning

The scanning electron microscope (SEM) produces an image of a sample by scanning it with a focused beam of electrons. The electrons interact with the atoms in the sample, which emit secondary electrons that contain information about the…

计算机视觉与模式识别 · 计算机科学 2017-09-08 Shahar Tsiper , Or Dicker , Idan Kaizerman , Zeev Zohar , Mordechai Segev , Yonina C. Eldar

Nowadays, modern electron microscopes deliver images at atomic scale. The precise atomic structure encodes information about material properties. Thus, an important ingredient in the image analysis is to locate the centers of the atoms…

计算机视觉与模式识别 · 计算机科学 2017-09-13 Benjamin Berkels , Benedikt Wirth

Sample thickness is an important parameter in transmission electron microscopy (TEM) imaging, for interpreting image contrast and understanding the relationship between properties and microstructure. In this study, we introduce a method for…

材料科学 · 物理学 2021-11-15 Pengfei Nan , Zhiyao Liang , Yue Zhang , Yangrui Liu , Dongsheng Song , Binghui Ge

Mechanical strain and stress play a major role in biological processes such as wound healing or morphogenesis. To assess this role quantitatively, fixed or live images of tissues are acquired at a cellular precision in large fields of…

组织与器官 · 定量生物学 2019-06-12 M. Durande , S. Tlili , T. Homan , B. Guirao , F. Graner , H. Delanoë-Ayari

A major limitation of two-dimensional scanning electron microscopy (SEM) in imaging porous membranes is its inability to resolve three-dimensional pore architecture and interconnectivity, which are critical factors governing membrane…

Comprehensive, synapse-resolution imaging of the brain will be crucial for understanding neuronal computations and function. In connectomics, this has been the sole purview of volume electron microscopy (EM), which entails an excruciatingly…

图像与视频处理 · 电气工程与系统科学 2023-03-03 Yicong Li , Yaron Meirovitch , Aaron T. Kuan , Jasper S. Phelps , Alexandra Pacureanu , Wei-Chung Allen Lee , Nir Shavit , Lu Mi

Microscopy is one of the most essential imaging techniques in life sciences. High-quality images are required in order to solve (potentially life-saving) biomedical research problems. Many microscopy techniques do not achieve sufficient…

计算机视觉与模式识别 · 计算机科学 2018-10-24 Joris Roels , Jan Aelterman , Jonas De Vylder , Hiep Luong , Yvan Saeys , Wilfried Philips

Single particle electron cryomicroscopy (cryo-EM) allows for structures of proteins and protein complexes to be determined from images of non-crystalline specimens. Cryo-EM data analysis requires electron microscope images of randomly…

仪器与探测器 · 物理学 2015-11-23 Jianhua Zhao , Marcus A. Brubaker , Samir Benlekbir , John L. Rubinstein

Aberration-corrected scanning transmission electron microscopes (STEM) provide sub-angstrom lateral resolution; however, the large convergence angle greatly reduces the depth of field. For microscopes with a small depth of field,…

材料科学 · 物理学 2011-12-15 Robert Hovden , Huolin L. Xin , David A. Muller

Scanning electron microscopy (SEM), a century-old technique, is today a ubiquitous method of imaging the surface of nanostructures. However, most SEM detectors simply count the number of secondary electrons from a material of interest, and…

In this paper we report the development of a new method for the evaluation of thin films mass thickness and composition based on the Energy Dispersive X-Ray Spectroscopy (EDS). The method exploits the theoretical calculation of the in-depth…

Imaging of nanoscale magnetic textures within extended material systems is of critical importance both to fundamental research and technological applications. Whilst high resolution magnetic imaging of thin nanoscale samples is…

The microscopic distribution of strain and stress plays a crucial role for the performance, safety, and lifetime of components in aeronautics, automotive and critical infrastructure [1]. While non-destructive methods for measuring the…

材料科学 · 物理学 2025-04-09 Peter Modregger , James. A. D. Ball , Felix Wittwer , Ahmar Khaliq , Jonathan Wright

Size effects are ubiquitous in the structural, mechanical, and physical properties of materials, making it highly desirable to study the intrinsic properties of thick objects through high-resolution structural analysis in transmission…

材料科学 · 物理学 2025-02-26 Wenfeng Yang , Haozhi Sha , Jizhe Cui , Rong Yu

To optimize electron energy toward in-situ imaging large bio-samples up to 10-um thickness with nanoscale resolution, we implemented an analytical model based on elastic and inelastic characteristic angles [1]. This model can be used to…

应用物理 · 物理学 2023-12-27 Xi Yang , Victor Smaluk , Timur Shaftan
‹ 上一页 1 2 3 10 下一页 ›