相关论文: A Method to Determine Broadband Complex Permittivi…
We propose a new method for calculating reflection and transmission coefficients for an arbitrarily polarized electromagnetic plane wave incident on a one-dimensional dielectric medium of finite thickness and with dielectric permittivity…
Electrical resistivity tomography is a suitable technique for non-invasive monitoring of municipal solid waste landfills, but accurate sensitivity analysis is necessary to evaluate the effectiveness and reliability of geoelectrical…
The micro-continuum method is a novel approach to simulate flow and transport in multiscale porous materials. For such materials, the domain can be divided into three sub-domains depending on the local porosity {\epsilon}: fully resolved…
Silicon nitride thin films play an important role in the realization of sensors, filters, and high-performance circuits. Estimates of the dielectric function in the far- and mid-infrared regime are derived from the observed transmittance…
A novel microfabricated, all-electrical measurement platform is presented for a direct, accurate and rapid determination of the thermal conductivity and diffusivity of liquid and solid materials. The measurement approach is based on the…
This paper reports on 3D-printed dielectric image lines for low-loss subTHz applications between 140 and 220 GHz. In contrast to conventional dielectric waveguides, a conductive copper substrate is used to achieve robust routing and…
An important tool in the field of metamaterials is the extraction of effective material parameters from simulated or measured scattering parameters of a sample. Here we discuss a retrieval method for thin-film structures that can be…
Using Monte Carlo simulation, we studied the electrical conductance of two-dimensional films. The films consisted of a poorly conductive host matrix and highly conductive rodlike fillers (rods). The rods were of various lengths, obeying a…
The microwave properties of polycrystalline MgB2 thin films prepared by the so-called in-situ method are investigated. The characterization of the films at microwave frequencies was obtained by a coplanar resonator technique. The analysis…
We analyze the temperature dependences of the effective dielectric permittivity of P(VDF-TrFE) films with BaTiO3 nanoparticles (with the average size 24 nm). Transition from a weak to a strong nonlinear temperature dependence of the…
We study by numerical simulations the scattering of $s$-polarized light from a rough dielectric film deposited on the planar surface of a semi-infinite perfect conductor. The dielectric film is allowed to be either active or passive,…
Accurate measurements of the cross-plane thermal conductivity {\Lambda}_cross of a high-thermal-conductivity thin film on a low-thermal-conductivity ({\Lambda}_s) substrate (e.g., {\Lambda}_cross/{\Lambda}_s>20) are challenging, due to the…
In semiconductor manufacturing processes, silicon dioxide films are commonly used as barrier layers, insulating layers, and protective layers. Coherence scanning interferometry (CSI) offers thin film thickness measurements with a…
The analytic expressions for the maximum and minimum reflectance of optical films coated with gapped graphene are derived in the application region of the Dirac model with account of multiple reflections. The respective film thicknesses are…
We have investigated the absorption spectrum of multilayer graphene in high magnetic fields. The low energy part of the spectrum of electrons in graphene is well described by the relativistic Dirac equation with a linear dispersion…
We constructed a quasi-analytical self-consistent model of the stripline-based broadband ferromagnetic resonance (FMR) measurements of ferromagnetic films. Exchange-free description of magnetization dynamics in the films allowed us to…
We have studied the electrical conductivity of nanoring-based, transparent conductive films, these being promising elements for flexible electronic devices. Both the wire resistance and the junction resistance were taken into account. We…
In spectroscopic ellipsometry, the optical properties of materials are obtained indirectly by generally assuming dielectric function and optical models. This ellipsometry analysis, which typically requires numerous model parameters, has…
This paper introduces simple analytical formulas for the grid impedance of electrically dense arrays of square patches and for the surface impedance of high-impedance surfaces based on the dense arrays of metal strips or square patches over…
A Bayesian model to infer edge electron density profiles is developed for the JET lithium beam emission spectroscopy system, measuring Li I line radiation using 26 channels with ~1 cm spatial resolution and 10~20 ms temporal resolution. The…