相关论文: A Method to Determine Broadband Complex Permittivi…
We describe the use of a near-field scanning microwave microscope to image the permittivity and tunability of bulk and thin film dielectric samples on a length scale of about 1 micron. The microscope is sensitive to the linear permittivity,…
This manuscript presents a novel method for characterizing the permittivities of low-loss dielectric slabs in sub-terahertz (sub-THz) frequencies, specifically above 100 GHz using a quasi-optical system. The algorithm is introduced with…
We perform broadband phase sensitive measurements of the reflection coefficient from 45 MHz up to 20 GHz employing a vector network analyzer with a 2.4 mm coaxial sensor which is terminated by the sample under test. While the material…
We describe the use of a near-field scanning microwave microscope to quantitatively image the dielectric permittivity and tunability of thin-film dielectric samples on a length scale of 1 micron. We demonstrate this technique with…
We suggest the nondestructive method for determination of the dielectric constant of substrate-deposited thin films by capacitance measurement with two parallel wires placed on top of the film. The exact analytical formula for the…
The dielectric properties of thin films are of paramount important in a variety of technological applications, and of fundamental importance for solid state research. In spite of this, there is currently no theoretical understanding of the…
In this work, a complementary resonant structure etched on the ground plane of a microstrip line is proposed for characterizing dielectric materials. The resonant sensor is designed to operate in S-band (2 to 4 GHz). The sensor is designed…
A method for determining the permittivity and permeability for specimens with high refractive index and variable shape is investigated. The method extracts the permeability and permittivity tensor elements from reflection measurements made…
This paper presents a complex permittivity measurement method for low-dispersive materials as a function of frequency. The introduced method relies only on transmitted power signals which are collected using a spectrum analyzer/power meter,…
We propose a theoretical study for Si thin film thickness measurement that is based on incident low energy electron beam on the film and counting the transmitted/incident electron fraction. It estimates the thin film thickness distribution…
The electrical conductivity of a CdS thin film, controlled by grain structures is essential to enhance its photoconductivity to be able to be fit as a window material in CdS/CdTe heterojunction solar cell. In order to characterize a thin…
The electric field grading of dielectric permittivity gradient devices is an effective way of enhancing their insulation properties. The in-situ electric field-driven assembly is an advanced method for the fabrication of insulation devices…
We previously reported on the complex permittivity and dc conductivity of waste-activated sludge. The measurements, spanning a frequency range of 3 MHz to 40 GHz, were made using an open-ended coaxial transmission line. Although this…
Theoretical approach is proposed to description of dielectric properties of matrix disperse systems which consists of dielectric matrix with embedded in metallic inclusions. On the basis of effective differential medium approximation the…
Material susceptibilities govern interactions between electromagnetic waves and matter and are of a crucial importance for basic understanding of natural phenomena and for tailoring practical applications. Here we present a new…
We present a method for extracting high-spatial resolution dielectric constant data at microwave frequencies. A scanning near field microwave microscope probes a sample and acquires data in the form of the frequency and quality factor…
We present an X-band waveguide (WR90) and UHF waveguide (WR1500) measurement method that permits the extraction of the complex permittivity for low dielectric loss tangent material specimen. The extraction method relies on computational…
The electrodynamic properties of BiFeO$_3$ films in the THz region are investigated via time domain spectroscopy. Combining the use of transmission ($\tilde{T}$) and reflection ($\tilde{R}$) measurements under normal incidence, the…
We have fabricated a layered nano-composite by alternating metal and gain medium layers, the gain dielectric consisting of a polymer incorporating optically pumped dye molecules. Exploiting an improved version of the effective medium…
We present a high-resolution microwave spectrometer to measure the frequency-dependent complex conductivity of a superconducting thin film near the critical temperature. The instrument is based on a broadband measurement of the complex…