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相关论文: Analysis of point defects in graphene using low do…

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We have studied the effect of photoelectrons on defect formation in graphene during extreme ultraviolet (EUV) irradiation. Assuming the major role of these low energy electrons, we have mimicked the process by using low energy primary…

材料科学 · 物理学 2014-08-26 A. Gao , C. J. Lee , F. Bijkerk

Graphene is expected to be rather insensitive to ionizing particle radiation. We demonstrate that single layers of exfoliated graphene sustain significant damage from irradiation with slow highly charged ions. We have investigated the ion…

材料科学 · 物理学 2013-10-24 J. Hopster , R. Kozubek , B. Ban-d'Etat , S. Guillous , H. Lebius , M. Schleberger

Irradiation with high-energy ions has been widely suggested as a tool to engineer properties of graphene. Experiments show that it indeed has a strong effect on its transport, magnetic and mechanical characteristics. However, to use ion…

介观与纳米尺度物理 · 物理学 2014-11-07 Ossi Lehtinen , I-Ling Tsai , Rashid Jalil , Rahul R. Nair , Juhani Keinonen , Ute Kaiser , Irina V. Grigorieva

Deviations from the perfect atomic arrangements in crystals play an important role in affecting their properties. Similarly, diffusion of such deviations is behind many microstructural changes in solids. However, observation of point defect…

材料科学 · 物理学 2014-07-28 Jani Kotakoski , Clemens Mangler , Jannik C. Meyer

Many of the proposed future applications of graphene require the controlled introduction of defects into its perfect lattice. Energetic ions provide one way of achieving this challenging goal. Single heavy ions with kinetic energies in the…

Defects in the lattice are of primal importance to tune graphene chemical, thermal and electronic properties. Electron-beam irradiation is an easy method to induce defects in graphene following pre-designed patterns, but no systematic study…

材料科学 · 物理学 2023-06-28 Nicola Melchioni , Luca Bellucci , Alessandro Tredicucci , Federica Bianco

The extreme sensitivity of 2D materials to defects and nanostructure requires precise imaging techniques to verify presence of desirable and absence of undesirable features in the atomic geometry. Helium-ion beams have emerged as a…

材料科学 · 物理学 2022-05-19 Alina Kononov , Alexandra Olmstead , Andrew D. Baczewski , Andre Schleife

We present a Raman study of Ar(+)-bombarded graphene samples with increasing ion doses. This allows us to have a controlled, increasing, amount of defects. We find that the ratio between the D and G peak intensities for a given defect…

While imaging individual atoms can routinely be achieved in high resolution transmission electron microscopy, visualizing the potential distribution of individually charged adsorbates leading to a phase shift of the probing electron wave is…

介观与纳米尺度物理 · 物理学 2017-08-08 Tatiana Latychevskaia , Flavio Wicki , Conrad Escher , Hans-Werner Fink

Chemical, mechanical, thermal and/or electronic properties of bulk or low-dimensional materials can be engineered by introducing structural defects to form novel functionalities. When using particles irradiation, these defects can be…

材料科学 · 物理学 2022-02-07 L. Basta , A. Moscardini , S. Veronesi , F. Bianco

Controlled modification of graphene properties is essential for its proposed electronic applications. Here we describe a possibility of tuning electrical properties of graphene via electron beam irradiation. We show that by controlling the…

材料科学 · 物理学 2015-10-28 G. Liu , D. Teweldebrhan , A. A. Balandin

Here we report a facile method to generate a high density of point defects in graphene on metal foil and show how the point defects affect the electronic structures of graphene layers. Our scanning tunneling microscopy (STM) measurements,…

介观与纳米尺度物理 · 物理学 2013-10-08 Hui Yan , Cheng-Cheng Liu , Ke-Ke Bai , Xuejiao Wang , Mengxi Liu , Wei Yan , Lan Meng , Yanfeng Zhang , Zhongfan Liu , Jia-Cai Nie , Yugui Yao , Lin He

Mechanically exfoliated graphene layers deposited on SiO2 substrate were irradiated with Ar+ ions in order to experimentally study the effect of atomic scale defects and disorder on the low-energy electronic structure of graphene. The…

介观与纳米尺度物理 · 物理学 2009-01-21 Levente Tapaszto , Gergely Dobrik , Peter Nemes-Incze , Gabor Vertesy , Philippe Lambin , Laszlo P Biro

Understanding radiation-induced defect formation in carbon materials is crucial for nuclear technology and for the manufacturing of nanostructures with desired properties. Using first principles molecular dynamics, we perform a systematic…

材料科学 · 物理学 2007-05-23 Oleg V. Yazyev , Ivano Tavernelli , Ursula Rothlisberger , Lothar Helm

We investigate the possibility of non-destructive electron diffraction imaging of a single molecule to determine its structure. The molecular specimen will be held on a free-standing sheet of graphene. Due to the high conductivity of…

化学物理 · 物理学 2009-11-13 E. E. Fill , F. Krausz , M. Raizen

Low-energy ion beam modification was proposed to create graphene on the top of the insulated diamond-like carbon films. In such low-temperature fabrication process the surface of the amorphous carbon could crystallize to graphene as a…

材料科学 · 物理学 2015-05-27 Savcho Tinchev

Molecular dynamics (MD) simulations were performed to study the formation process of nanopores in a suspended graphene sheet irradiated by using energetic ions though a mask. By controlling the ion parameters including mass, energy and…

介观与纳米尺度物理 · 物理学 2016-03-10 Weisen Li , Li Liang , Shijun Zhao , Shuo zhang , Jianming Xue

Strains strongly affect the properties of low-dimensional materials, such as graphene. By combining in situ, in operando, reflection high energy electron diffraction experiments with first-principles calculations, we show that large…

材料科学 · 物理学 2013-09-03 Nils Blanc , Fabien Jean , Arkady V. Krasheninnikov , Gilles Renaud , Johann Coraux

We use Raman spectroscopy to show that exposing few-layer graphene to extreme ultraviolet (EUV, 13.5 nm) radiation, i.e. relatively low photon energy, results in an increasing density of defects. Furthermore, exposure to EUV radiation in a…

材料科学 · 物理学 2013-08-27 A. Gao , P. J. Rizo , E. Zoethout , L. Scaccabarozzi , C. J. Lee , V. Banine , F. Bijkerk

Point Projection Microscopy (PPM) is used to image suspended graphene using low-energy electrons (100-200eV). Because of the low energies used, the graphene is neither damaged or contaminated by the electron beam. The transparency of…

介观与纳米尺度物理 · 物理学 2015-03-18 J. Y. Mutus , L. Livadaru , J. T. Robinson , R. Urban , M. H. Salomons , M. Cloutier , P. E. Sheehan , R. A. Wolkow
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