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Halogen monolayer on a silicon surface is attracting active attention for applications in electronic device fabrication with individual impurities. To create a halogen mask for the impurities incorporation, it is desirable to be able to…

材料科学 · 物理学 2022-04-20 T. V. Pavlova , V. M. Shevlyuga , B. V. Andryushechkin , K. N. Eltsov

Although fabrication capabilities of Silicon Dangling Bonds have rapidly advanced from manual labor-driven laboratory work to automated manufacturing in just recent years, sub-nanometer substrate defects still pose a hindrance to production…

We theoretically study the electronic band structure of isolated unpaired and paired dangling bonds (DB), DB wires and DB clusters on H:Si(100)-(2$\times$1) surface using Extended H\"uckel Theory (EHT) and report their effect on the Si band…

介观与纳米尺度物理 · 物理学 2008-01-29 Hassan Raza

We report the study of single dangling bonds (DB) on the hydrogen terminated silicon (100) surface using a low temperature scanning tunneling microscope (LT-STM). By investigating samples prepared with different annealing temperatures, we…

Dangling bonds (DBs) are common defects in silicon that affect its electronic performance by trapping carriers at the in-gap levels. For probing the electrical properties of individual DBs, a scanning tunneling microscope (STM) is an…

材料科学 · 物理学 2025-10-20 T. V. Pavlova , V. M. Shevlyuga

Using combined low temperature scanning tunneling microscopy (STM) and atomic force microscopy (AFM), we demonstrate hydrogen passivation of individual, selected dangling bonds (DBs) on a hydrogen-passivated Si(100)-2$\times$1 surface…

材料科学 · 物理学 2017-06-12 Niko Pavliček , Zsolt Majzik , Gerhard Meyer , Leo Gross

The nature of the atomic defects on the hydrogen passivated Si (100) surface is analyzed using deep learning and scanning tunneling microscopy (STM). A robust deep learning framework capable of identifying atomic species, defects, in the…

材料科学 · 物理学 2020-02-19 Maxim Ziatdinov , Udi Fuchs , James H. G. Owen , John N. Randall , Sergei V. Kalinin

Here we report the direct observation of single electron charging of a single atomic Dangling Bond (DB) on the H-Si(100) 2x1 surface. The tip of a scanning tunneling microscope is placed adjacent to the DB to serve as a single electron…

介观与纳米尺度物理 · 物理学 2015-06-15 Marco Taucer , Lucian Livadaru , Paul G. Piva , Roshan Achal , Hatem Labidi , Jason L. Pitters , Robert A. Wolkow

The sp${}^3$ dangling bond on the diamond surface plays a critical role in the performance and fabrication of diamond quantum technologies. For the former, the magnetic and electric properties of this defect can impede the performance of…

介观与纳米尺度物理 · 物理学 2026-01-30 Lachlan Oberg , Yi-Ying Sung , Cedric Weber , Marcus W. Doherty , Christopher I. Pakes

We report an ab initio study of the electronic properties of surface dangling-bond (SDB) states in hydrogen-terminated Si and Ge nanowires with diameters between 1 and 2 nm, Ge/Si nanowire heterostructures, and Si and Ge (111) surfaces. We…

介观与纳米尺度物理 · 物理学 2010-09-30 R. Kagimura , R. W. Nunes , H. Chacham

We present here a theory and a computational tool, Silicon-{\sc Qnano}, to describe atomic scale quantum dots in Silicon. The methodology is applied to model dangling bond quantum dots (DBQDs) created on a passivated H:Si-(100)-(2$\times$1)…

材料科学 · 物理学 2019-07-26 Alain Delgado , Marek Korkusinski , Pawel Hawrylak

During fabrication and scanning-tunneling-microscope (STM) imaging of dangling bonds (DBs) on a hydrogenated silicon surface, we consistently observed halo-like features around isolated DBs for specific imaging conditions. These surround…

介观与纳米尺度物理 · 物理学 2015-03-19 Lucian Livadaru , Jason Pitters , Marco Taucer , Robert A. Wolkow

Negative differential resistance remains an attractive but elusive functionality, so far only finding niche applications. Atom scale entities have shown promising properties, but viability of device fabrication requires fuller understanding…

The hydrogen-terminated Silicon(100)-2x1 surface (H-Si(100)-2x1) provides a promising platform for the development of atom scale devices, with recent work showing their creation through precise desorption of surface hydrogen atoms. While…

材料科学 · 物理学 2020-09-21 Jeremiah Croshaw , Thomas Dienel , Taleana Huff , Robert A. Wolkow

It is discovered that the zero-dimensional character of the silicon atom dangling bond (DB) state allows controlled formation and occupation of a new form of quantum dot assemblies. Whereas on highly doped n-type substrates isolated DBs are…

Using a non-contact atomic force microscope we track and manipulate the position of single electrons confined to atomic structures engineered from silicon dangling bonds (DBs) on the hydrogen terminated silicon surface. By varying the…

介观与纳米尺度物理 · 物理学 2018-10-31 Mohammad Rashidi , Wyatt Vine , Thomas Dienel , Lucian Livadaru , Jacob Retallick , Taleana Huff , Konrad Walus , Robert Wolkow

Dimer vacancy (DV) defect complexes in the Si(001)2x1 surface were investigated using high-resolution scanning tunneling microscopy and first principles calculations. We find that under low bias filled-state tunneling conditions, isolated…

Si dangling bonds without H termination at the interface of quasi-free standing monolayer graphene (QFMLG) are known scattering centers that can severely affect carrier mobility. In this report, we study the atomic and electronic structure…

We devise a scheme to characterize tunneling of an excess electron shared by a pair of tunnel-coupled dangling bonds on a silicon surface -- effectively a two-level system. Theoretical estimates show that the tunneling should be highly…

介观与纳米尺度物理 · 物理学 2014-02-05 Zahra Shaterzadeh-Yazdi , Lucian Livadaru , Marco Taucer , Josh Mutus , Jason Pitters , Robert A. Wolkow , Barry C. Sanders

Near-surface nitrogen-vacancy centres are critical to many diamond-based quantum technologies such as information processors and nanosensors. Surface defects play an important role in the design and performance of these devices. The…

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