相关论文: A Novel Analytic Approach to Model Line Edge Rough…
The influence of edge roughness in angle resolved scatterometry at periodically structured surfaces is investigated. A good description of the radiation interaction with structured surfaces is crucial for the understanding of optical…
In this work we consider the inverse problem of reconstructing the optical properties of a layered medium from an elastography measurement where optical coherence tomography is used as the imaging method. We hereby model the sample as a…
The high-volume manufacturing of the next generation of semiconductor devices requires advances in measurement signal analysis. Many in the semiconductor manufacturing community have reservations about the adoption of deep learning; they…
We propose a simple algorithm to train stochastic neural networks to draw samples from given target distributions for probabilistic inference. Our method is based on iteratively adjusting the neural network parameters so that the output…
We extend the latent position random graph model to the line graph of a random graph, which is formed by creating a vertex for each edge in the original random graph, and connecting each pair of edges incident to a common vertex in the…
A method for the evaluation of the angular width of an electron beam generated by a nanoconstriction is proposed and demonstrated. The approach is based on analysis of a narrow-width electron flow, that quantizes into modes inside a…
Electron-beam (e-beam) lithography is widely employed in fabrication of 2-D patterns and 3-D structures. A certain type or shape of the sidewall in the remaining resist profile may be desired in an application, e.g., an undercut for…
Novel schemes for generating ultra-low emittance electron beams have been developed in the last years and promise compact particle sources with excellent beam quality suitable for future high-energy physics experiments and free-electron…
In this paper, a new structure of cooperative learning automata so-called extended learning automata (eDLA) is introduced. Based on the proposed structure, a new iterative randomized heuristic algorithm for finding optimal sub-graph in a…
The demand for efficient edge vision has spurred the interest in developing stochastic computing approaches for performing image processing tasks. Memristors with inherent stochasticity readily introduce probability into the computations…
High quality electron beams, with high spatial and tempo- ral resolution, have an important use in electron diffraction experiments to probe and study the constituents of matter. A cold electron source is being developed based on elec- tron…
Low-energy electron microscopy (LEEM) is a surface science method that works primarily in the UHV environment. It provides information complementary to the other established techniques: it extends the limited view of scanning probe…
Precise alignment of the electron beam is critical for successful application of scanning transmission electron microscopes (STEM) to understanding materials at atomic level. Despite the success of aberration correctors, aberration…
Signatures of stochastic effects in the radiation of a relativistic electron beam interacting with a counterpropagating superstrong short focused laser pulse are investigated in a quantum regime when the electron's radiation dominates its…
The objective of this study is to jointly analyze the data rate and electromagnetic field (EMF) exposure in urban environments. Capitalizing on stochastic geometry (SG), a network level analysis is performed by modelling these environments…
This paper presents a new approach for filter design based on stochastic distances and tests between distributions. A window is defined around each pixel, overlapping samples are compared and only those which pass a goodness-of-fit test are…
Impacts of quantum stochasticity on the dynamics of an ultra-relativistic electron beam head-on colliding with a linearly polarized ultra-intense laser pulse are theoretically investigated in a quasi-classical regime. Generally, the angular…
This publication presents an investigation of the performance of different analytical electron ptychography methods for low-dose imaging. In particular, benchmarking is performed for two model-objects, monolayer MoS$_2$ and apoferritin, by…
Optically active networks show feature-rich emission that depends on the fine details of their geometry, and find diverse applications in random lasers, sensing devices and photonics processors. In these and other systems, a thorough and…
A Bayesian model to infer edge electron density profiles is developed for the JET lithium beam emission spectroscopy system, measuring Li I line radiation using 26 channels with ~1 cm spatial resolution and 10~20 ms temporal resolution. The…