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Oblique angle deposition of oxides is being famous for fabricating inhomogeneous thin films with variation of refractive index along thickness in a functional form. Inhomogeneous layers play a key role in the development of rugate…

材料科学 · 物理学 2014-06-27 R B Tokas , S Jena , P Sarkar , Shyam polaki , S Thakur , S Basu , N K Sahoo

Inspired by nature, we investigate the short-range order effect on the physical properties of amorphous materials. Amorphous Al2O3 thin films exhibit a higher proportion of their 4-coordinated Al sites close to the surface, causing…

材料科学 · 物理学 2019-05-22 Yael Etinger-Geller , Ekaterina Zoubenko , Maria Baskin , Lior Kornblum , Boaz Pokroy

In the present work, a set of ZrO2 thin films have been deposited at 82 degree angle of deposition at several substrate rotation speeds and at 0 degree. The effect of substrate rotation on optical, structural, morphological properties and…

The synthesis of the photochromic YHO films is based on the oxidation of deposited yttrium hydride in ambient conditions. The actual state of the films during the deposition process, which is influenced by the deposition pressure and the…

In this work, amorphous thin films in Mg-Si-O-N system were prepared in order to investigate the dependence of optical and mechanical properties on Mg composition. Reactive RF magnetron co-sputtering from magnesium and silicon targets were…

In the present work, HfO2 thin film (100nm) has been deposited by sputtering technique and annealed at various temperatures ranging from 400 to 1000\degree (in step of 200 \degree) in O2 ambient for 10 min. The samples have been…

材料科学 · 物理学 2016-05-05 Shilpi Pandey , Prateek Kothari , Sunil Kumar Sharma , Seema Verma , K. J. Rangra

Oblique angle deposition (OAD) is a nanostructuration method widely used to tune the optical properties of thin films. The introduction of porosity controlled by the deposition angle is used to develop the architecture of each layer and…

Sculptured copper thin films were deposited on glass substrates, using different deposition rates. The nano-structure and morphology of the films were obtained, using X-ray diffraction (XRD), atomic force microscopy (AFM) and scanning…

光学 · 物理学 2010-11-09 H. Savaloni , F. Babaei , S. Song , F. Placido

Organisms in nature can alter the short-range order of an amorphous precursor phase, thereby controlling the resulting crystalline structure. This phenomenon inspired an investigation of the effect of modifying the short-range order within…

材料科学 · 物理学 2020-01-13 Yael Etinger-Geller , Alex Katsman , Boaz Pokroy

The present work is essentially focused on the study of optical and structural properties of hydrogenated amorphous silicon thin films (a-Si:H) prepared by radio-frequency cathodic sputtering. We examine separately the influence of hydrogen…

材料科学 · 物理学 2007-05-23 A. Barhdadi , M. Chafik El Idrissi

The micro-properties (structure and composition), and macro-properties (electrical and optical properties) of zinc oxide (ZnO) thin films deposited on glass substrates using a filtere vacuum arc deposition (FVAD) system were investigated as…

材料科学 · 物理学 2009-11-11 T. David , S. Goldsmith , R. L. Boxman

Copper oxide thin films are deposited on quartz substrates by DC magnetron sputtering and the effect of deposition temperature on their optoelectronic properties is examined in detail. Scanning Electron Microscopy (SEM), X-ray diffraction…

材料科学 · 物理学 2022-12-26 Aarju Mathew Koshy , A Sudha , Satyesh Kumar Yadav , Parasuraman Swaminathan

We have previously shown that azopolymer thin films exposed to coherent light that has travelled through a turbulent medium produces a surface relief grating containing information about the intensity of the turbulence; for instance, a…

The depth dependence of crystalline structure within thin films is critical for many technological applications, but has been impossible to measure directly using common techniques. In this work, by monitoring diffraction peak intensity and…

应用物理 · 物理学 2018-05-24 Eliot Gann , Mario Caironi , Yong-Young Noh , Yun-Hi Kim , Christopher R. McNeill

The structural interface properties of layered Pt/Ti/SiO2/Si electrodes have been investigated using high-resolution specular and diffuse x-ray reflectivity under grazing angles. Currently this multilayer system represents a technological…

材料科学 · 物理学 2007-05-23 M. Aspelmeyer , U. Klemradt , W. Hartner , H. Bachhofer , G. Schindler

This paper reports optical and nanomechanical properties of seldom studied highly a-axis oriented AlN thin films for the first time. These films were deposited by reactive DC magnetron sputtering technique at an optimal target to substrate…

Oxide thin films exhibit versatile physical properties such as magnetism, ferroelectricity, piezoelectricity, metal-insulator transition (MIT), multiferroicity, colossal magnetoresistivity, switchable resistivity, etc. More importantly, the…

材料科学 · 物理学 2016-07-12 Huali Yang , Baomin Wang , Xiaojian Zhu , Jie Shang , Bin Chen , Run-Wei Li

Freestanding oxide films offer significant potential for integrating exotic quantum functionalities with semiconductor technologies. However, their performance is critically limited by surface roughness and interfacial imperfection caused…

材料科学 · 物理学 2025-11-04 Huaicheng Yuan , Yu-Chen Liu , Li-Shu Wang , Zehao Dong , Jan-Chi Yang , Zhen Chen

Two-dimensional (2D) compounds provide unique building blocks for novel layered devices and hybrid photonic structures. However, large surface-to-volume ratio in thin films enhances the significance of surface interactions and charging…

The discovery of ferroelectricity in both pure and doped HfO$_2$-based thin films have revitalized the interest in using ferroelectrics for nanoscale device applications. To take advantage of this silicon-compatible ferroelectric,…

材料科学 · 物理学 2019-05-22 Shi Liu , Brendan M Hanrahan
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