相关论文: Determining sample alignment in X-ray Reflectometr…
Intelligent reflecting surface (IRS) is a promising technology for wireless communications, thanks to its potential capability to engineer the radio environment. However, in practice, such an envisaged benefit is attainable only when the…
The inclination angle of substructures in active galaxies gives insights into physical components from scales of the vicinity of the central black hole to the entire host galaxy. We use the self-consistent reflection spectral model…
Deep anomaly detection models using a supervised mode of learning usually work under a closed set assumption and suffer from overfitting to previously seen rare anomalies at training, which hinders their applicability in a real scenario. In…
Grazing incidence x-ray scattering provides nanostructural information for thin film samples, but single images generally do not provide information on film thickness or the full complex index of refraction. Additionally, for thin films…
We report the results of GIXRR, UV-VIS NIR and XPS measurements on Si and Ge thin films of various thicknesses. While GIXRR measurements show no presence of oxide on the top of these films, XPS measurements show small amount of oxides.…
Using a custom-built scanning system, we generated maps of birefringence on reflection at $\lambda=1064$~nm from single-crystal GaAs/Al$_{0.92}$Ga$_{0.08}$As Bragg reflectors (henceforth ``AlGaAs coatings''). Ten coatings were bonded to…
This study was aimed to investigate the thickness dependent morphological changes of Mn films deposited on GaAs substrates by thermal evaporation technique. Ni films were deposited under same conditions to perform comparative study of the…
Mahdavi et al. find that the degree of agreement between weak lensing and X-ray mass measurements is a function of cluster radius. Numerical simulations also point out that X-ray mass proxies do not work equally well at all radii. The…
Semiconductor material based on the rad-optic effect enables ultra-fast detection of X-rays and plays an important role in fusion diagnostics. Obtaining the accurate noise equivalent power (NEP) of the semiconductor ultrafast response…
To study the size and strain rate dependency of copper polycrystalline microstructures, a multi-layered copper/Al$_2$O$_3$ thin film was deposited on a Si substrate using a hybrid deposition system (combining physical vapour and atomic…
A simple, non-invasive method using Raman spectroscopy for the estimation of the thickness of graphene layers grown epitaxially on silicon carbide (SiC) is presented, enabling simultaneous determination of thickness, grain size and disorder…
UV-FIR SED modeling is an effective way to disentangle emission between star formation (SF) and active galactic nuclei (AGN) in galaxies; however, this approach becomes uncertain for composite AGN/SF galaxies that comprise 50-70% of…
Many open questions in X-ray astronomy are limited by the relatively small number of objects in uniform optically-identified samples, especially when rare subclasses are considered, or subsets isolated to search for evolution or…
Symbolic regression (SR) is a regression analysis based on genetic algorithms to search for mathematical expressions that best fit a given data set, by allowing the expressions themselves to mutate. We use the SR to analyze the parameter…
Series of GaN/AlN superlattices (SLs) with various periods and the same thicknesses of GaN quantum wells and AlN barriers have been investigated. X-ray diffraction, photoluminescence (PL) and transmission electron microscopy (TEM)…
Resonant (elastic) soft x-ray scattering (RSXS) offers a unique element, site, and valence specific probe to study spatial modulations of charge, spin, and orbital degrees of freedom in solids on the nanoscopic length scale. It cannot only…
While 3D Gaussian splatting (3DGS) offers explicit and efficient scene representations for cone-beam computed tomography reconstruction, conventional photometric optimization inherently suffers from spectral bias under ultra sparse-view…
For measurements designed to accurately determine layer thickness, there is a natural trade-off between sensitivity to optical thickness and lateral resolution due to the angular ray distribution required for a focused beam. We demonstrate…
We demonstrate nonlinear metamaterial split ring resonators (SRRs) on GaAs at terahertz frequencies. For SRRs on doped GaAs films, incident terahertz radiation with peak fields of ~20 - 160 kV/cm drives intervalley scattering. This reduces…
We investigated elastic loss in GaAs/AlGaAs multilayers to help determine the suitability of these coatings for future gravitational wave detectors. We measured large ($\approx 70$-mm diameter) substrate-transferred crystalline coating…