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Graphene-based sponges doped with atomic nitrogen and boron were applied for the electrochemical degradation of persistent organic contaminants in one-pass, flow-through mode, and in a low-conductivity supporting electrolyte. The B-doped…

化学物理 · 物理学 2021-09-30 Luis Baptista-Pires , Giannis-Florjan Norra , Jelena Radjenovic

Graphene and graphene-based materials exhibit exceptional optical and electrical properties with great promise for novel applications in light detection. However, several challenges prevent the full exploitation of these properties in…

材料科学 · 物理学 2018-09-20 Adolfo De Sanctis , Jake D. Mehew , Monica F. Craciun , Saverio Russo

We report on the etching of graphene devices with a helium ion beam, including in situ electrical measurement during lithography. The etching process can be used to nanostructure and electrically isolate different regions in a graphene…

介观与纳米尺度物理 · 物理学 2009-10-08 M. C. Lemme , D. C. Bell , J. R. Williams , L. A. Stern , B. W. H. Baugher , P. Jarillo-Herrero , C. M. Marcus

The effect of oxygen adsorption on the local structure and electronic properties of monolayer graphene grown on SiC(0001) has been studied by means of Low Energy Electron Microscopy (LEEM), microprobe Low Energy Electron Diffraction…

材料科学 · 物理学 2015-06-05 C. Mathieu , B. Lalmi , T. O. Mentes , E. Pallecchi , A. Locatelli , S. Latil , R. Belkhou , A. Ouerghi

Epitaxial films of graphene on SiC(0001) are interesting from a basic physics as well as applications-oriented point of view. Here we study the emerging morphology of in-vacuo prepared graphene films using low energy electron microscopy…

Core-level X-ray Photoelectron Spectroscopy (XPS) is often used to study the surfaces of heterogeneous copper-based catalysts, but the interpretation of measured spectra, in particular the assignment of peaks to adsorbed species, can be…

材料科学 · 物理学 2018-12-26 J. Matthias Kahk , Johannes Lischner

Graphene, a two-dimensional (2D) material with unique electronic properties, appears to be an ideal object for the application of surface-science methods. Among them, a family of scanning probe microscopy methods (STM, AFM, KPFM) and the…

材料科学 · 物理学 2015-03-30 Yuriy Dedkov , Elena Voloshina , Mikhail Fonin

The type and distribution of oxygen functional groups in graphene oxide (GO) and reduced graphene oxide (RGO) remain still a subject of great debate. Local analytic techniques are required to access the chemistry of these materials at a…

材料科学 · 物理学 2016-12-13 Anna Tararan , Alberto Zobelli , Ana M. Benito , Wolfgang K. Maser , Odile Stéphan

Intercalation is a robust approach for modulating the properties of epitaxial graphene on SiC and stabilizing two-dimensional (2D) intercalant layers at the graphene/SiC interface. In this work, we present synchrotron-based angle resolved…

介观与纳米尺度物理 · 物理学 2025-05-14 Bharti Matta , Philipp Rosenzweig , Kathrin Küster , Craig Polley , Ulrich Starke

Understanding interfacial interactions in two-dimensional (2D) heterostructures is essential for advancing optoelectronic and quantum technologies. We investigate metal-organic chemical vapor deposition (MOCVD)-grown WSe$_2$ films (one to…

The structural and electronic properties of oxidized graphene are investigated on the basis of the genetic algorithm and density functional theory calculations. We find two new low energy semiconducting phases of the fully oxidized graphene…

材料科学 · 物理学 2010-01-05 H. J. Xiang , Su-Huai Wei , X. G. Gong

While doping and defects are often considered detrimental to material performance, at the nanoscale, modifications are needed to create novel properties beneficial for device applications. In this work, we focus on optimizing graphene as a…

应用物理 · 物理学 2025-05-21 Raju Kumar Yadav , Prince Philip , Boddepalli SanthiBhushan

Fully energy-filtered X-ray photoelectron emission microscopy is used to analyze the spatial distribution of the silicon sub-oxide structure at the SiO2/Si interface as a function of underlying doping pattern. Using a spectroscopic…

材料科学 · 物理学 2012-11-21 F. de la Peña , N. Barrett , L. F. Zagonel , M. Walls , O. Renault

We present an alternative methodology for calculating the quasi-particle energy, energy loss, and optical spectra of a molecule deposited on graphene or a metallic substrate. To test the accuracy of the method it is first applied to the…

介观与纳米尺度物理 · 物理学 2014-08-28 V. Despoja , I. Lončarić , D. J. Mowbray , L. Marušić

The two innermost layers of the ALICE inner tracking system are instrumented with silicon pixel detectors. Single chip assembly prototypes of the ALICE pixels have been tested in high energy particle beams at the CERN SPS. Detection…

核实验 · 物理学 2009-11-11 D. Elia

We probe the local inhomogeneities of the electronic properties of graphene at the nanoscale using scanning probe microscopy techniques. First, we focus on the study of the electronic inhomogeneities caused by the graphene-substrate…

介观与纳米尺度物理 · 物理学 2012-10-16 A. Castellanos-Gomez , Arramel , M. Wojtaszek , R. H. M. Smit , N. Tombros , N. Agraït , B. J. van Wees , G. Rubio-Bollinger

Dielectrophoretic (DEP) sensing is an extremely important sensing modality that enables the rapid capture and detection of polarizable particles of nano-scale size. This makes it a versatile tool for applications in medical diagnostics,…

介观与纳米尺度物理 · 物理学 2025-11-26 Nezhueyotl Izquierdo , Ruixue Li , Peter R. Christenson , Sang-Hyun Oh , Steven J. Koester

The formation of graphene on the (0001) surface of SiC (the Si-face) is studied by atomic force microscopy, low-energy electron microscopy, and scanning tunneling microscopy/spectroscopy. The graphene forms due to preferential sublimation…

材料科学 · 物理学 2023-05-03 Luxmi , N. Srivastava , R. M. Feenstra , P. J. Fisher

We study structural and electronic properties of graphene grown on SiC substrate using scanning tunneling microscope (STM), spot-profile-analysis low energy electron diffraction (SPA-LEED) and angle resolved photoemission spectroscopy…

介观与纳米尺度物理 · 物理学 2017-07-19 Lunan Huang , Yun Wu , M. T. Hershberger , Daixiang Mou , Ben Schrunk , Michael C. Tringides , Myron Hupalo , Adam Kaminski

Point Projection Microscopy (PPM) is used to image suspended graphene using low-energy electrons (100-200eV). Because of the low energies used, the graphene is neither damaged or contaminated by the electron beam. The transparency of…

介观与纳米尺度物理 · 物理学 2015-03-18 J. Y. Mutus , L. Livadaru , J. T. Robinson , R. Urban , M. H. Salomons , M. Cloutier , P. E. Sheehan , R. A. Wolkow