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相关论文: Strain determination in the Si channel above a sin…

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Strain-engineering in SiGe nanostructures is fundamental for the design of optoelectronic devices at the nanoscale. Here we explore a new strategy, where SiGe structures are laterally confined by the Si substrate, to obtain high tensile…

In this paper, we propose a new trench power MOSFET with strained Si channel that provides lower on resistance than the conventional trench MOSFET. Using a 20% Ge mole fraction in the Si1-xGex body with a compositionally graded Si1-xGex…

材料科学 · 物理学 2010-08-19 Raghvendra S. Saxena , M. Jagadesh Kumar

The recently developed precession electron diffraction (PED) technique in scanning transmission electron microscopy (STEM) has been used to elucidate the local strain distribution and crystalline misorientation in CMOS fabricated strained…

Strain at surfaces and interfaces play an important role in the optical and electronic properties of materials. MeV ion-induced strain determination in single crystal silicon substrates and in Ag (nanoisland)/Si(111) at surface and…

材料科学 · 物理学 2015-06-25 J. Ghatak , B. Satpati , M. Umananda , P. V. Satyam , K. Akimoto , K. Ito , T. Emoto

Adding sufficient tensile strain to Ge can turn the material to a direct bandgap group IV semiconductor emitting in the mid-infrared wavelength range. However, highly strained-Ge cannot be directly grown on Si due to its large lattice…

In this letter we not only show improvement in the performance but also in the reliability of 30nm thick biaxially strained SiGe (20%Ge) channel on Si p-MOSFETs. Compared to Si channel, strained SiGe channel allows larger hole mobility…

介观与纳米尺度物理 · 物理学 2015-05-20 Shweta Deora , Abhijeet Paul , R. Bijesh , Jeff Huang , Gerhard Klimeck , Gennadi Bersuker , P. D. Krisch , Raj Jammy

Strain is commonly used in metal-oxide-semiconductor technologies to boost on-state performance. This booster has been in production for at least a decade. Despite this, a systematic study of the impact of strain on off-state leakage…

介观与纳米尺度物理 · 物理学 2025-02-03 Felipe Murphy-Armando , Chang Liu , Yi Zhao , Ray Duffy

The notion of a spin field effect transistor, where transistor action is realized by manipulating the spin degree of freedom of charge carriers instead of the charge degree of freedom, has captivated researchers for at least three decades.…

介观与纳米尺度物理 · 物理学 2023-06-21 Supriyo Bandyopadhyay

Electron diffraction through a thin patterned silicon membrane can be used to create complex spatial modulations in electron distributions by varying the intensity of different reflections using parameters such as crystallographic…

加速器物理 · 物理学 2019-05-30 L. E. Malin , W. S. Graves , M. Holl , J. C. H. Spence , E. A. Nanni , R. K. Li , X. Shen , S. Weathersby

The electronic properties of a field-effect transistor with two different structures of MoSi$_2$N$_4$ and WSi$_2$N$_4$ monolayers as the channel material in the presence of biaxial strain are investigated. The band structures show that…

材料科学 · 物理学 2022-06-09 Nayereh Ghobadi , Manouchehr Hosseini , Shoeib Babaee Touski

The Si(111)7x7 surface was observed by reflection electron microscopy (REM) and scanning tunneling microscopy (STM) simultaneously in an ultra-high vacuum electron microscope. The distance between the STM tip and the Si surface was detected…

材料科学 · 物理学 2007-05-23 Y. Naitoh , K. Takayanagi , Y. Ohshima , H. Hirayama

Moir\'e fringes are used throughout a wide variety of applications in physics and engineering to bring out small variations in an underlying lattice by comparing with another reference lattice. This method was recently demonstrated in…

应用物理 · 物理学 2020-02-06 Viveksharma Prabhakara , Daen Jannis , Armand Béché , Hugo Bender , Johan Verbeeck

The development of Si-compatible active photonic devices is a high priority in computer and modern electronics industry. Ge is compatible with Si and is a promising light emission material. Nearly all Ge-on-Si materials reported so far were…

材料科学 · 物理学 2018-11-20 Yize Stephanie Li , John Nguyen

Traps at the semiconductor-oxide interface are considered as a major source of instability in strained Ge/SiGe quantum devices, yet the quantified study of their cryogenic behavior remains limited. In this work, we investigate…

Stacking multiple SiSiGe channels in advanced logic devices faces severe thermal budget accumulation, which degrades interfaces via Ge-Si interdiffusion and strain relaxation.This strategy lowers the Ge diffusion coefficient to 5.6-7% of…

材料科学 · 物理学 2026-05-08 Wenlong Yao , Zhigang Li , Guobin Bai , Jianfeng Gao , Jiahan Yu , Junfeng Li , Xiaolei Wang , Jun Luo

Understanding irradiation-induced strain in silicon carbide (SiC) is essential for designing radiation-tolerant ceramic materials. However, conventional methods often fail to resolve nanoscale strain gradients, especially in polycrystalline…

In newly discovered topological crystalline insulators (TCIs), the unique crystalline protection of the surface state (SS) band structure has led to a series of intriguing predictions of strain generated phenomena, from the appearance of…

介观与纳米尺度物理 · 物理学 2015-11-20 Ilija Zeljkovic , Daniel Walkup , Badih Assaf , Kane L Scipioni , R. Sankar , Fangcheng Chou , Vidya Madhavan

Strain is a powerful experimental tool to explore new electronic states and understand unconventional superconductivity. Here, we investigate the effect of uniaxial strain on the nematic and superconducting phase of single crystal FeSe…

Strain and composition play a fundamental role in semiconductor physics, since they are means to tune the electronic and optical properties of a material and hence develop new devices. Today it is still a challenge to measure strain in…

For nanoscale CMOS applications, strained-silicon devices have been receiving considerable attention owing to their potential for achieving higher performance and compatibility with conventional silicon processing. In this work, an…

介观与纳米尺度物理 · 物理学 2010-08-19 Vivek Venkataraman , Susheel Nawal , M. Jagadesh Kumar
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