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相关论文: Thermionic Emission as a tool to study transport i…

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This paper discusses how classical transport theories such as the thermionic emission, can be used as a powerful tool for the study and the understanding of the most complex mechanisms of transport in Fin Field Effect Transistors (FinFETs).…

介观与纳米尺度物理 · 物理学 2011-11-28 G. C. Tettamanzi , A. Paul , S. Lee , G. Klimeck , S. Rogge

We report on DC and microwave electrical transport measurements in silicon-on-insulator CMOS nano-transistors at low and room temperature. At low source-drain voltage, the DC current and RF response show signs of conductance quantization.…

介观与纳米尺度物理 · 物理学 2014-10-09 A. C. Betz , S. Barraud , Q. Wilmart , B. Plaçais , X. Jehl , M. Sanquer , M. F. Gonzalez - Zalba

Channel conductance measurements can be used as a tool to study thermally activated electron transport in the sub-threshold region of state-of-art FinFETs. Together with theoretical Tight-Binding (TB) calculations, this technique can be…

Thermal transport in high-electron-mobility-transistor (HEMT) structures grown on 4H-SiC substrates by metalorganic-vapour-phase epitaxy (MOCVD) is systematically investigated. The thermal conductivity of the GaN channel and AlN buffer…

材料科学 · 物理学 2025-10-15 Dat Q. Tran , Minho Kim , Okhyun Nam , Vanya Darakchieva , Plamen P. Paskov

Several models of thermionic energy nanoconverters have been proposed to study the transport phenomena that take place in electronic devices. For example, in resonant tunneling junctions those phenomena are manifested through the…

介观与纳米尺度物理 · 物理学 2020-06-02 G. Valencia-Ortega , L. A. Arias-Hernandez

Using single-crystal transistors, we have performed a systematic experimental study of electronic transport through oxidized copper/rubrene interfaces as a function of temperature and bias. We find that the measurements can be reproduced…

材料科学 · 物理学 2009-11-13 A. S. Molinari , I. Gutierrez Lezama , P. Parisse , T. Takenobu , Y. Iwasa , A. F. Morpurgo

We present systematic thermal conductivity measurements of suspended thin graphite ribbons, 234-527 nm thick, using a four-probe 3-omega method. Unlike recent reports of phonon hydrodynamics and exceptionally high thermal conductivity in…

介观与纳米尺度物理 · 物理学 2025-09-16 Wonjae Jeon , Yu Pei , Xun Li , Lucas Lindsay , Sangyeop Lee , Renkun Chen

We measure hole transport in poly(3-hexylthiophene) field effect transistors with channel lengths from 3 $\mu$m down to 200 nm, from room temperature down to 10 K. Near room temperature effective mobilities inferred from linear regime…

介观与纳米尺度物理 · 物理学 2007-05-23 B. H. Hamadani , D. Natelson

This paper analyzes a transient method for the characterization of low-resistance thermal interfaces of microelectronic packages. The transient method can yield additional information about the package not available with traditional static…

综合物理 · 物理学 2008-01-08 B. Smith , T. Brunschwiler , B. Michel

We study mechanism of magnetic energy transport, motivated by recent measurements of the thermal conductivity in low dimensional quantum magnets. We point out a possible mechanism of enhancement of the thermal conductivity in gapped…

材料科学 · 物理学 2009-11-07 Keiji Saito , Seiji Miyashita

We developed a novel contactless frequency-domain approach to study thermal transport, which is particularly convenient when thermally anisotropic materials are considered. The method is based on a similar line-shaped heater geometry as…

Using a one-dimensional tight-binding Anderson model, we study a disordered nanowire in the presence of an external gate which can be used for depleting its carrier density (field effect transistor device configuration). In this first…

介观与纳米尺度物理 · 物理学 2014-05-01 Riccardo Bosisio , Geneviève Fleury , Jean-Louis Pichard

We investigate theoretically the thermoelectric transport through a circuit implementation of the three-channel "charge" Kondo model quantum simulator [Z. Iftikhar et al., Science 360, 1315 (2018)]. The universal temperature scaling law of…

介观与纳米尺度物理 · 物理学 2020-07-09 T. K. T. Nguyen , M. N. Kiselev

We investigate the thermodynamics of simple (non-interacting) transport models beyond the scope of weak coupling. For a single fermionic or bosonic level -- tunnel-coupled to two reservoirs -- exact expressions for the stationary matter and…

统计力学 · 物理学 2015-07-20 Gabriel E. Topp , Tobias Brandes , Gernot Schaller

A recently developed model that unifies the ballistic and diffusive transport mechanisms is applied in a theoretical study of carrier transport across potential barriers at grain boundaries in microcrystalline semiconducting materials. In…

材料科学 · 物理学 2009-11-07 T. Weis , R. Lipperheide , U. Wille , S. Brehme

Raman thermometry is advantageous for measuring the thermal transport of low-dimensional materials due to its non-contact nature. Transient Raman methods have improved the accuracy of steady-state Raman thermometry by removing the need for…

应用物理 · 物理学 2024-07-02 Taocheng Yu , Yilu Fu , Chenguang Fu , Tiejun Zhu , Wee-Liat Ong

The recent excitement about Dirac and Weyl fermion systems has renewed interest in magnetotransport properties of multi-carrier systems. However, the complexity of their analysis, even in the simplest two-carrier case, has hampered a good…

介观与纳米尺度物理 · 物理学 2019-04-24 G. Eguchi , S. Paschen

We generalize the fermionic renormalization group method to describe analytically transport through a double barrier structure in a one-dimensional system. Focusing on the case of weakly interacting electrons, we investigate thoroughly the…

强关联电子 · 物理学 2009-11-07 D. G. Polyakov , I. V. Gornyi

Transport measurements on thin films of NdNiO$_3$ reveal a crossover to a regime of pronounced nonlinear conduction below the well-known metal-insulator transition temperature. The evolution of the transport properties at temperatures well…

强关联电子 · 物理学 2015-04-08 Will J. Hardy , Heng Ji , Evgeny Mikheev , Susanne Stemmer , Douglas Natelson

GaN-based HEMTs have the potential to be widely used in high-power and high-frequency electronics while their maximum output powers are limited by high channel temperature induced by near-junction Joule-heating, which degrades device…

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