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相关论文: Low-noise top-gate graphene transistors

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We demonstrate graphene thickness-graded transistors with high electron mobility and low 1/f noise (f is a frequency). The device channel is implemented with few-layer graphene with the thickness varied from a single layer in the middle to…

介观与纳米尺度物理 · 物理学 2015-06-03 Guanxiong Liu , Sergey Rumyantsev , Michael Shur , Alexander A. Balandin

We present the results of the experimental investigation of the low - frequency noise in bilayer graphene transistors. The back - gated devices were fabricated using the electron beam lithography and evaporation. The charge neutrality point…

材料科学 · 物理学 2009-11-13 Q. Shao , G. Liu , D. Teweldebrhan , A. A. Balandin , S. Roumyantesv , M. Shur , D. Yan

This letter investigates the bias-dependent low frequency noise of single layer graphene field-effect transistors. Noise measurements have been conducted with electrolyte-gated graphene transistors covering a wide range of gate and drain…

介观与纳米尺度物理 · 物理学 2018-10-22 Nikolaos Mavredakis , Ramon Garcia Cortadella , Andrea Bonaccini Calia , Jose A. Garrido , David Jiménez

We fabricated a large number of single and bilayer graphene transistors and carried out a systematic experimental study of their low-frequency noise characteristics. A special attention was given to determining the dominant noise sources in…

材料科学 · 物理学 2015-05-19 S. Rumyantsev , G. Liu , W. Stillman , M. Shur , A. A. Balandin

We have investigated the low-frequency 1/f noise of both suspended and on-substrate graphene field-effect transistors and its dependence on gate voltage, in the temperature range between 300K and 30K. We have found that the noise amplitude…

材料科学 · 物理学 2012-04-09 Yan Zhang , E. E. Mendez , Xu Du

We report the 1/f noise characteristics at low-frequency in graphene field-effect transistors that utilized a high-k dielectric tantalum oxide encapsulated layer (a few nanometers thick) placed by atomic layer deposition on Si3N4. A…

材料科学 · 物理学 2021-03-30 Yifei Wang , Vinh X. Ho , Zachary. N. Henschel , Michael P. Cooney , Nguyen Q. Vinh

Low-frequency noise with a spectral density that depends inversely on frequency (f) has been observed in a wide variety of systems including current fluctuations in resistors, intensity fluctuations in music and signals in human cognition.…

介观与纳米尺度物理 · 物理学 2015-06-16 Alexander A. Balandin

Low-frequency 1/f noise in electronics is a conductance fluctuation, that has been expressed in terms of a mobility "$\alpha$-noise" by Hooge and Kleinpenning. Understanding this noise in graphene is a key towards high-performance…

介观与纳米尺度物理 · 物理学 2023-04-18 A. Schmitt , D. Mele , M. Rosticher , T. Taniguchi , K. Watanabe , C. Maestre , C. Journet , V. Garnier , G. Fève , J. M. Berroir , C. Voisin , B. Plaçais , 1 , E. Baudin

We have investigated low-frequency 1/f noise in the boron nitride - grapheme - boron nitride heterostructure field - effect transistors on Si/SiO2 substrates (f is a frequency). The device channel was implemented with a single layer…

介观与纳米尺度物理 · 物理学 2015-08-11 Maxim A. Stolyarov , Guanxiong Liu , Sergey L. Rumyantsev , Michael Shur , Alexander A. Balandin

We have investigated the low frequency (f) flicker (also called 1/f) noise of single-layer graphene devices on h-BN (placed on SiO2/Si) along with those on SiO2/Si. We observe that the devices fabricated on h-BN have on average one order of…

介观与纳米尺度物理 · 物理学 2015-09-30 Morteza Kayyalha , Yong P. Chen

We present low-frequency electrical resistance fluctuations, or noise, in graphene-based field-effect devices with varying number of layers. In single-layer devices the noise magnitude decreases with increasing carrier density, which…

介观与纳米尺度物理 · 物理学 2010-06-09 Atindra Nath Pal , Arindam Ghosh

This letter investigates low frequency 1/ f noise in hBN encapsulated graphene device in a dual gated geometry. The noise study is performed as a function of top gate carrier density (nT G) at different back gate densities (nBG). The noise…

介观与纳米尺度物理 · 物理学 2023-09-22 Aaryan Mehra , Roshan Jesus Mathew , Chandan Kumar

We investigated the effect of the electron-beam irradiation on the level of the low-frequency 1/f noise in graphene devices. It was found that 1/f noise in graphene reveals an anomalous characteristic - it reduces with increasing…

介观与纳米尺度物理 · 物理学 2015-06-12 Md. Zahid Hossain , Sergey Rumyantsev , Michael S. Shur , Alexander A. Balandin

We report on the transport and low-frequency noise measurements of MoS2 thin-film transistors with "thin" (2-3 atomic layers) and "thick" (15-18 atomic layers) channels. The back-gated transistors made with the relatively thick MoS2…

介观与纳米尺度物理 · 物理学 2023-07-19 S. L. Rumyantsev , C. Jiang , R. Samnakay , M. S. Shur , A. A. Balandin

We demonstrate that the low-frequency resistance fluctuations, or noise, in bilayer graphene is strongly connected to its band structure, and displays a minimum when the gap between the conduction and valence band is zero. Using…

介观与纳米尺度物理 · 物理学 2010-06-09 Atindra Nath Pal , Arindam Ghosh

We show that vapors of different chemicals produce distinguishably different effects on the low-frequency noise spectra of graphene. It was found in a systematic study that some gases change the electrical resistance of graphene devices…

Top-gated graphene transistors operating at high frequencies (GHz) have been fabricated and their characteristics analyzed. The measured intrinsic current gain shows an ideal 1/f frequency dependence, indicating an FET-like behavior for…

其他凝聚态物理 · 物理学 2015-05-13 Yu-Ming Lin , Keith A. Jenkins , Alberto Valdes-Garcia , Joshua P. Small , Damon B. Farmer , Phaedon Avouris

In this letter we present the results of systematic experimental investigations of the effect of different chemical environments on the low frequency resistance fluctuations of single layer graphene field effect transistors (SLG-FET). The…

介观与纳米尺度物理 · 物理学 2015-10-29 Kazi Rafsanjani Amin , Aveek Bid

Low-frequency noise (LFN) variability in graphene transistors (GFETs) is for the first time researched in this work. LFN from an adequate statistical sample of long-channel solution-gated single-layer GFETs is measured in a wide range of…

We report results of investigation of the low-frequency excess noise in device channels made from topological insulators - a new class of materials with a bulk insulating gap and conducting surface states. The thin-film bismuth selenide…

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