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SnS2 stands out as a highly promising two-dimensional material with significant potential for applications in the field of electronics. Numerous attempts have been undertaken to modulate the physical properties of SnS2 by doping with…

Nickel nitride (Ni-N) thin film samples were deposited using reactive magnetron sputtering process utilizing different partial flow of N2 (RN2). They were characterized using x-ray reflectivity (XRR), x-ray diffraction (XRD) and x-ray…

材料科学 · 物理学 2020-04-23 Nidhi Pandey , Mukul Gupta , Jochen Stahn

Using wide-band (0.5-6.5 eV) spectroscopic ellipsometry we study ultrathin [Bi(0.6-2.5 nm)-FeNi(0.8,1.2 nm)]N multilayer films grown by rf sputtering deposition, where the FeNi layer has a nanoisland structure and its morphology and…

This study presents a novel method for fabricating stoichiometric SnS thin films with large grain sizes via reactive sputtering using a metallic Sn target and sulfur plasma (S-plasma). Unlike conventional approaches that rely on toxic H2S…

材料科学 · 物理学 2025-03-24 Daiki Motai , Issei Suzuki , Taichi Nogami , Takahisa Omata

Imaging surfaces using low energy neutral atom scattering is a relatively recent development in the field of microscopy. In this work we demonstrate that this technique is sensitive enough to distinguish films as thin as a single monolayer…

化学物理 · 物理学 2022-03-02 Geetika Bhardwaj , Krishna Rani Sahoo , Rahul Sharma , Parswa Nath , Pranav R. Shirhatti

Here we report on the structural, optical, electrical and magnetic properties of Co-doped and (Co,Mo)-codoped SnO2 thin films deposited on r-cut sapphire substrates by pulsed laser deposition. Substrate temperature during deposition was…

材料科学 · 物理学 2013-07-09 S. Dalui , S. Rout , A. J. Silvestre , G. Lavareda , L. C. J. Pereira , P. Brogueira , O. Conde

A detailed nanoscale structural characterization was performed on high-quality La0.66Sr0.33MnO3 (LSMO) thin films of different thicknesses and deposited by pulsed laser deposition onto buffered Si (100) substrates. A multilayered structure…

材料科学 · 物理学 2020-09-16 Aneely Carrero , Augusto Roman , Myriam Aguirre , Laura B. Steren

We investigate the use of Low Energy Ion Scattering (LEIS) to characterize buried interfaces of ultra-thin films. LEIS spectra contain depth-resolved information in the so-called sub-surface signal. However, the exact correlation between…

材料科学 · 物理学 2023-06-02 Adele Valpreda , Jacobus M. Sturm , Andrey Yakshin , Marcelo Ackermann

Copper nanowires are widely used as on-chip interconnects due to superior conductivity. However, with aggressive Cu interconnect scaling, the diffusive surface scattering of electrons drastically increases the electrical resistivity. In…

Scalable architectures characterized by quantum bits (qubits) with low error rates are essential to the development of a practical quantum computer. In the superconducting quantum computing implementation, understanding and minimizing…

Thin Cr films 28-nm thick deposited on glass substrates were processed by scanning low-intensity femtosecond laser pulses with energy well below single-pulse damage threshold. Two types of laser-induced periodic surface structures (LIPSS)…

We report measurements of the inverse squared magnetic penetration depth, $\lambda^{-2}(T)$, in Pr$_{2-x}$Ce$_{x}$CuO$_{4-\delta}$ ($0.115 \leq x \leq 0.152$) superconducting films grown on SrTiO$_3$ (001) substrates coated with a buffer…

超导电性 · 物理学 2009-11-10 Mun-Seog Kim , John A. Skinta , Thomas R. Lemberger , A. Tsukada , M. Naito

The development of ferromagnet/heavy metal thin-film structures, such as CoFeB/Mo, with spin-orbit interaction requires advanced methods for their production and study. Polarized neutron reflectometry (PNR) provides unique insights into the…

Different thicknesses of cobalt thin films were growth by magnetron sputtering deposition techniques. The films thicknesses were determinated with X ray Photoelectron Spectroscopy (XPS) and Quartz Crystal Monitoring (QCM). XPS is also used…

材料科学 · 物理学 2009-10-29 Mustafa Erkovan

The structural interface properties of layered Pt/Ti/SiO2/Si electrodes have been investigated using high-resolution specular and diffuse x-ray reflectivity under grazing angles. Currently this multilayer system represents a technological…

材料科学 · 物理学 2007-05-23 M. Aspelmeyer , U. Klemradt , W. Hartner , H. Bachhofer , G. Schindler

Ultrathin sheets of MoS2 are a newly discovered 2D semiconductor that holds great promise for nanoelectronics. Understanding the pattern of current flow will be crucial for developing devices. In this talk, we present images of current flow…

介观与纳米尺度物理 · 物理学 2017-09-13 Sagar Bhandari , Ke Wang , Kenji Watanabe , Takashi Taniguchi , Philip Kim , Robert M. Westervelt

The physical properties of two-dimensional (2D) materials may drastically vary with their thickness profiles. Current thickness profiling methods for 2D material (e.g., atomic force microscopy and ellipsometry) are limited in measurement…

光学 · 物理学 2022-07-12 Yujie Nie , Nansen Zhou , Li Tao , Jinlong Zhu , Zhaoli Gao , Jianbin Xu , Renjie Zhou

Solid-state dewetting is the process by which thin solid films break up and retract on a substrate, forming nanostructures. While dewetting of single-crystalline films is understood as a surface-energy-driven process mediated by surface…

We present experimental XMLD spectra measured on epitaxial (001)-oriented thin Co$_{2}$FeSi films, which are rich in features and depend sensitively on the degree of atomic order and interdiffusion from capping layers. Al- and Cr-capped…

A method for combinatorial sputter deposition of thin films on microparticles is presented. The method is developed for a laboratory-scale magnetron sputter system and uses a piezoelectric actuator to agitate the microparticles through…

材料科学 · 物理学 2022-07-12 Florian Lourens , Alfred Ludwig