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相关论文: Making graphene visible

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The visibility of graphene sheets on different types of substrates has been investigated both theoretically and experimentally. Although single layer graphene is observable on various types of dielectrics under an optical microscope, it is…

材料科学 · 物理学 2009-12-29 Guoquan Teo , Haomin Wang , Yihong Wu , Jun Zhang , Zaibing Guo , Zhenhua Ni , Zexiang Shen

We model the optical visibility of monolayer and bilayer graphene deposited on a silicon/silicon oxide substrate or thermally annealed on the surface of silicon carbide. We consider reflection and transmission setups, and find that…

介观与纳米尺度物理 · 物理学 2008-02-25 D. S. L. Abergel , A. Russell , Vladimir I. Fal'ko

In order to take advantage of the enormous potential of graphene for future electronic micro-circuits and other applications it is necessary to develop reliable, rapid and widely applicable methods to visualize graphene based structures. We…

介观与纳米尺度物理 · 物理学 2010-12-15 Hugo Gonçalves , Michael Belsley , Cacilda Moura , Tobias Stauber , Peter Schellenberg

Exfoliated graphene monolayers are identified by optical inspection. In order to improve the monolayer detection, we investigate the angle dependence of the optical contrast of graphene on a 90nm SiO$_2$/Si substrate. We observe a…

介观与纳米尺度物理 · 物理学 2009-10-14 Victor Yu , Michael Hilke

Graphene based sheets have stimulated great interest due to their superior mechanical, electrical and thermal properties. A general visualization method that allows quick observation of these single atomic layers would be highly desirable…

材料科学 · 物理学 2009-12-15 Jaemyung Kim , Laura J. Cote , Franklin Kim , Jiaxing Huang

Graphene constitutes one of the key elements in many functional van der Waals heterostructures. However, it has negligible optical visibility due to its monolayer nature. Here we study the visibility of graphene in various van der Waals…

Monoatomic layers of graphite can be electrically contacted and used as building blocks for new promising devices. These experiment are today possible thanks to the fact that very thin graphite can be identified on a dielectric substrate…

介观与纳米尺度物理 · 物理学 2008-08-21 S. Roddaro , P. Pingue , V. Piazza , V. Pellegrini , F. Beltram

Graphene consists of single or few layers of crystalline ordered carbon atoms. Its visibility on oxidized silicon (Si/SiO\_2) enabled its discovery and spawned numerous studies of its unique electronic properties. The combination of…

材料科学 · 物理学 2009-10-26 M. Friedemann , K. Pierz , R. Stosch , F. J. Ahlers

We demonstrate that it is possible to mechanically exfoliate graphene under ultra high vacuum conditions on the atomically well defined surface of single crystalline silicon. The flakes are several hundred nanometers in lateral size and…

材料科学 · 物理学 2015-06-05 O. Ochedowski , G. Begall , N. Scheuschner , M. El Kharrazi , J. Maultzsch , M. Schleberger

Graphite is a well-studied material with known electronic and optical properties. Graphene, on the other hand, which is just one layer of carbon atoms arranged in a hexagonal lattice, has been studied theoretically for quite some time but…

介观与纳米尺度物理 · 物理学 2015-05-13 F. Molitor , D. Graf , C. Stampfer , T. Ihn , K. Ensslin

We investigate graphene and graphene layers on different substrates by monochromatic and white-light confocal Rayleigh scattering microscopy. The image contrast depends sensitively on the dielectric properties of the sample as well as the…

We show that it is possible to prepare and identify ultra--thin sheets of graphene on crystalline substrates such as SrTiO$_3$, TiO$_2$, Al$_2$O$_3$ and CaF$_2$ by standard techniques (mechanical exfoliation, optical and atomic force…

材料科学 · 物理学 2009-11-06 S. Akcoeltekin , M. El Kharrazi , B. Koehler , A. Lorke , M. Schleberger

Graphene and related two-dimensional materials are promising candidates for atomically thin, flexible, and transparent optoelectronics. In particular, the strong light-matter interaction in graphene has allowed for the development of…

The formation of epitaxial graphene on SiC is monitored in-situ using low-energy electron diffraction (LEED). The possibility of using LEED as an in-situ thickness monitor of the graphene is examined. The ratio of primary diffraction spot…

材料科学 · 物理学 2010-11-23 P. J. Fisher , Luxmi , N. Srivastava , S. Nie , R. M. Feenstra

Graphene is only one atom thick, optically transparent, chemically inert and an excellent conductor. These properties seem to make this material an excellent candidate for applications in various photonic devices that require conducting but…

Results of a study on the electrochemical properties of exfoliated single and multilayer graphene flakes are presented. Graphene flakes were deposited on silicon/silicon oxide wafers to enable fast and accurate characterization by optical…

介观与纳米尺度物理 · 物理学 2011-10-11 Anna T. Valota , Ian A. Kinloch , Kostya S. Novoselov , Cinzia Casiraghi , Axel Eckmann , Ernie W. Hill , Robert A. W. Dryfe

Graphene is of increasing interest for optoelectronic applications exploiting light detection, light emission and light modulation. Intrinsically light matter interaction in graphene is of a broadband type. However by integrating graphene…

While silicon has dominated solid-state electronics for more than four decades, a variety of new materials have been introduced into photonics to expand the accessible wavelength range and to improve the performance of photonic devices. For…

介观与纳米尺度物理 · 物理学 2010-09-24 Thomas Mueller , Fengnian Xia , Phaedon Avouris

Depth profiling of graphene with high-resolution ion beam analysis is a practical method for analysis of monolayer thicknesses of graphene. Not only is the energy resolution sufficient to resolve graphene from underlying SiC, but by use of…

材料科学 · 物理学 2011-08-11 M. Copel , S. Oida , A. Kasry , A. A. Bol , J. B. Hannon , R. M. Tromp

Graphene is considered to be plasmon active only up to the infrared based on combined tight binding model and random phase approximation calculations. Here we show that the optical properties of graphene as measured by ellipsometry and…

介观与纳米尺度物理 · 物理学 2014-04-28 Philipp Lange , Günter Kewes , Nikolai Severin , Oliver Benson , Jürgen P. Rabe
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