使用过渡边传感器阵列的稀浓度辐射敏感系统的L边光谱学
仪器与探测器
2018-01-17 v2
摘要
我们展示了0.5 mM水溶液铁氰化物的铁L边X射线吸收光谱与谐振非弹性X射线散射(RIXS)测量。这些测量证明了高通量过渡边传感器(TES)光谱仪能够为稀浓度和辐射敏感样品访问丰富的软X射线(100-2000eV)光谱区间。我们的低浓度数据与常规基于光栅的光谱仪记录的高浓度测量一致。这些结果表明，由高通量TES光谱仪获取的软X射线RIXS光谱可用于研究生物、化学和催化相关的稀浓度金属中心配合物的局部电子结构。特别是，TES光谱仪具有表征辐射和温度敏感样品冷冻溶液的独特能力。
引用
@article{arxiv.1706.09878,
title = {L-Edge Spectroscopy of Dilute, Radiation-Sensitive Systems Using a Transition-Edge-Sensor Array},
author = {Charles J. Titus and Michael L. Baker and Sang Jun Lee and Hsiao-mei Cho and William B. Doriese and Joseph W. Fowler and Kelly Gaffney and Johnathon D. Gard and Gene C. Hilton and Chris Kenney and Jason Knight and Dale Li and Ron Marks and Michael P. Minitti and Kelsey M. Morgan and Galen C. O'Neil and Carl D. Reintsema and Daniel R. Schmidt and Dimosthenis Sokaras and Daniel S. Swetz and Joel N. Ullom and Tsu-Chien Weng and Christopher Williams and Betty A. Young and Kent D. Irwin and Edward I. Solomon and Dennis Nordlund},
journal= {arXiv preprint arXiv:1706.09878},
year = {2018}
}
备注
19 pages, 4 figures