面向 nEXO 实验的滨松 VUV4 MPPC 特性表征
天体物理仪器与方法
2019-07-24 v3 仪器与探测器
摘要
在本文中，我们报告了作为 nEXO 实验液氙闪烁光探测方案开发一部分的滨松 VUV4（型号：S13370-6152）真空紫外（VUV）灵敏硅光电倍增管（SiPM）的特性表征。在 TRIUMF 的专用装置中测量了多种 SiPM 特性，如：暗噪声、增益、关联雪崩、直接串扰和光子探测效率（PDE）。SiPM 在 范围内进行了表征。在 V 过压和 下，我们报告在触发脉冲后 区间内每次脉冲的关联雪崩（CA）数为 。在相同设置下，暗噪声（DN）速率为 。CA 数和 DN 速率均满足 nEXO 指标。在 、平均波长 下测量了两台滨松 VUV4 器件的 PDE。在 V 和 V 过压下，我们报告的 PDE 分别为 和 ，对应的饱和 PDE 分别为 和 。两个值均远低于滨松所宣称的 饱和 PDE。更一般地，第二台在 V 过压下测试的器件低于 nEXO 的 PDE 要求。第一台则给出了勉强接近 nEXO 指标的 PDE。这表明，若适度改进，滨松 VUV4 MPPC 可考虑作为 nEXO 探测器最终设计中 FBK-LF SiPM 的替代方案。
引用
@article{arxiv.1903.03663,
title = {Characterization of the Hamamatsu VUV4 MPPCs for nEXO},
author = {G. Gallina and P. Giampa and F. Retiere and J. Kroeger and G. Zhang and M. Ward and P. Margetak and G. Lic and T. Tsang and L. Doria and S. Al Kharusi and M. Alfaris and G. Anton and I. J. Arnquist and I. Badhrees and P. S. Barbeau and D. Beck and V. Belov and T. Bhatta and J. Blatchford and J. P. Brodsky and E. Brown and T. Brunner and G. F. Cao and L. Cao and W. R. Cen and C. Chambers and S. A. Charlebois and M. Chiu and B. Cleveland and M. Coon and A. Craycraft and J. Dalmasson and T. Daniels and L. Darroch and S. J. Daugherty and A. De St. Croix and A. Der Mesrobian-Kabakian and R. DeVoe and J. Dilling and Y. Y. Ding and M. J. Dolinski and A. Dragone and J. Echevers and M. Elbeltagi and L. Fabris and D. Fairbank and W. Fairbank and J. Farine and S. Feyzbakhsh and R. Fontaine and P. Gautam and G. Giacomini and R. Gornea and G. Gratta and E. V. Hansen and M. Heffner and E. W. Hoppe and J. Hoßl and A. House and M. Hughes and Y. Ito and A. Iverson and A. Jamil and M. J. Jewell and X. S. Jiang and A. Karelin and L. J. Kaufman and D. Kodroff and T. Koffas and R. Krucken and A. Kuchenkov and K. S. Kumar and Y. Lana and A. Larson and B. G. Lenardo and D. S. Leonarda and S. Lik and Z. Li and C. Licciardi and Y. H. Linw and P. Lv and R. MacLellan and T. McElroy and M. Medina-Peregrina and T. Michel and B. Mong and D. C. Moore and K. Murray and P. Nakarmi and R. J. Newby and Z. Ning and O. Njoya and F. Nolet and O. Nusair and K. Odgers and A. Odian and M. Oriunno and J. L. Orrell and G. S. Ortega and I. Ostrovskiy and C. T. Overman and S. Parent and A. Piepkez and A. Pocar and J. -F. Pratte and D. Qiu and V. Radeka and E. Raguzin and S. Rescia and M. Richman and A. Robinson and T. Rossignol and P. C. Rowson and N. Roy and R. Saldanha and S. Sangiorgio and K. Skarpaas VIII and A. K. Soma and G. St-Hilaire and V. Stekhanov and T. Stiegler and X. L. Sun and M. Tarka and J. Todd and T. Tolba and T. I. Totev and R. Tsang and F. Vachon and V. Veeraraghavan and G. Visser and J. -L. Vuilleumier and M. Wagenpfeil and M. Walent and Q. Wang and J. Watkins and M. Weber and W. Wei and L. J. Wen and U. Wichoski and S. X. Wu and W. H. Wu and X. Wu and Q. Xia and H. Yang and L. Yang and Y. -R. Yen and O. Zeldovich and J. Zhao and Y. Zhou and T. Ziegler},
journal= {arXiv preprint arXiv:1903.03663},
year = {2019}
}