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Aberration-corrected scanning electron microscopy (AC-STEM) can provide valuable information on the atomic structure of nanoclusters, an essential input for gaining an understanding of their physical and chemical properties. A systematic…

材料科学 · 物理学 2021-05-11 Kusse S. Bersha , Alejandro Peña-Torres , Hannes Jónsson

Atoms can be extracted from a trapped Bose-Einstein condensate (BEC) by driving spin-flips to untrapped states. The coherence properties of the BEC are transfered to the released atoms, creating a coherent beam of matter refered to as an…

We consider tunneling of two interacting atoms with an even spatial symmetry. The atoms are prepared in two lowest excited states with respect to relative and center-of-mass motions. We observe monotonic and non-monotonic dependence of the…

原子物理 · 物理学 2018-06-27 I. S. Ishmukhamedov , A. S. Ishmukhamedov

The miniaturization of semiconductor devices to the scales where small numbers of dopants can control device properties requires the development of new techniques capable of characterizing their dynamics. Investigating single dopants…

Vortices play a crucial role in determining the properties of superconductors as well as their applications. Therefore, characterization and manipulation of vortices, especially at the single vortex level, is of great importance. Among many…

We discuss the local cutting of single-walled carbon nanotubes by a voltage pulse to the tip of a scanning tunneling microscope. The tip voltage ($\mid V \mid \ge $~3.8 eV) is the key physical quantity in the cutting process. After…

材料科学 · 物理学 2009-10-31 Angel Rubio , S. Peter Apell , Liesbeth C. Venema , Cees Dekker

Scattering scanning near-field optical microscopy (s-SNOM) is a promising technique for overcoming Abbe diffraction limit and substantially enhancing the spatial resolution in spectroscopic imaging. The s-SNOM works by exposing an atomic…

量子物理 · 物理学 2024-03-22 Soheil Khajavi , Zahra Shaterzadeh-Yazdi , Ali Eghrari , Mohammad Neshat

Here, using low-temperature optical scanning tunneling microscopy (STM), we investigate inelastic light scattering (ILS) in the vicinity of a single-atom quantum point contact (QPC). A vibration mode localized at the single Ag adatom on the…

介观与纳米尺度物理 · 物理学 2023-12-12 Shuyi Liu , Franco P. Bonafe , Heiko Appel , Angel Rubio , Martin Wolf , Takashi Kumagai

Single atoms provide an ideal system for utilizing fundamental quantum functions. Their electrons have well-defined energy levels and spin properties. Even more importantly, for a given isotope -- say, $^{12}$C -- all the atoms are…

介观与纳米尺度物理 · 物理学 2022-09-23 Saban M. Hus , An-Ping Li

The platinum/iridium (Pt/Ir) alloy tip for scanning probe microscopy (SPM) was fabricated by amplitude-modulated alternating-current (AC) electropolishing. The clean tips with a radius of curvature less than 100 nm were reproducibly…

材料科学 · 物理学 2025-02-18 Yuto Nishiwaki , Toru Utsunomiya , Shu Kurokawa , Takashi Ichii

We have observed an aggregation of carbon or carbon derivatives on platinum and natively oxidized silicon surfaces during STM measurements in ultra-high vacuum on solvent-cleaned samples previously structured by e-beam lithography. We have…

介观与纳米尺度物理 · 物理学 2012-08-28 Dominik Stöffler , Hilbert von Löhneysen , Regina Hoffmann

A sparse modeling approach is proposed for analyzing scanning tunneling microscopy topography data, which contains numerous peaks corresponding to surface atoms. The method, based on the relevance vector machine with $\mathrm{L}_1$…

数据分析、统计与概率 · 物理学 2018-03-13 Masamichi J. Miyama , Koji Hukushima

Scanning tunneling microscopy (STM) provides real-space electronic state information at the atomic scale that is most commonly used to study materials surfaces. An intriguing extension of the method is attempt to study the electronic…

材料科学 · 物理学 2015-06-22 Andrei Malashevich , Eric I. Altman , Sohrab Ismail-Beigi

We analyze electrostatic interaction between a sharp conducting tip and a thin one-dimensional wire, e.g., a carbon nanotube, in a scanned gate microscopy (SGM) experiment. The problem is analytically tractable if the wire resides on a thin…

介观与纳米尺度物理 · 物理学 2010-04-02 Lingfeng M. Zhang , Michael M. Fogler

Scanning tunneling spectroscopy measures how a single electron with definite energy propagates between a sample surface and the tip of a scanning tunneling microscope. In the simplest description, the differential conductance measured is…

介观与纳米尺度物理 · 物理学 2019-05-07 Mikko M. Ervasti , Fabian Schulz , Peter Liljeroth , Ari Harju

Crystallographic image processing (CIP) techniques may be utilized in scanning probe microscopy (SPM) to glean information that has been obscured by signals from multiple probe tips. This may be of particular importance for scanning…

材料科学 · 物理学 2020-07-07 Jack C. Straton , Peter Moeck , Bill Moon , Taylor T. Bilyeu

A spectroscopic imaging-scanning tunneling microscope (SI-STM) allows the atomic scale visualization of surface electronic and magnetic structure of novel quantum materials with high energy resolution. To achieve the optimal performance,…

Atomic scale characterization and manipulation with scanning probe microscopy rely upon the use of an atomically sharp probe. Here we present automated methods based on machine learning to automatically detect and recondition the quality of…

介观与纳米尺度物理 · 物理学 2018-03-26 Mohammad Rashidi , Robert A. Wolkow

Single atoms can be considered as basic objects for electron microscopy to test the microscope performance and basic concepts for modeling of image contrast. In this work high-resolution transmission electron microscopy was applied to image…

材料科学 · 物理学 2011-09-21 B. Gamm , R. Popescu , H. Blank , R. Schneider , A. Beyer , A. Gölzhäuser , D. Gerthsen