Single atoms can be considered as basic objects for electron microscopy to test the microscope performance and basic concepts for modeling of image contrast. In this work high-resolution transmission electron microscopy was applied to image single platinum atoms in an aberration-corrected transmission electron microscope. The atoms are deposited on a self-assembled monolayer substrate which induces only negligible contrast. Single-atom contrast simulations were performed on the basis of Weickenmeier-Kohl and Doyle-Turner scattering factors. Experimental and simulated intensities are in full agreement on an absolute scale.
@article{arxiv.1009.2393,
title = {Quantitative High-Resolution Transmission Electron Microscopy of Single Atoms},
author = {B. Gamm and R. Popescu and H. Blank and R. Schneider and A. Beyer and A. Gölzhäuser and D. Gerthsen},
journal= {arXiv preprint arXiv:1009.2393},
year = {2011}
}