Manipulating low-dimensional materials down to the level of single atoms with electron irradiation

T. Susi; J. C. Meyer; J. Kotakoski

doi:10.1016/j.ultramic.2017.03.005

Manipulating low-dimensional materials down to the level of single atoms with electron irradiation

Materials Science 2017-03-08 v1

Authors: T. Susi , J. C. Meyer , J. Kotakoski

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Abstract

Recent advances in scanning transmission electron microscopy (STEM) instrumentation have made it possible to focus electron beams with sub-atomic precision and to identify the chemical structure of materials at the level of individual atoms. Here we discuss the dynamics that are observed in the structure of low-dimensional materials under electron irradiation, and the potential use of electron beams for single-atom manipulation. As a demonstration of the latter capability, we show how momentum transfer from the electrons of a 60-keV {\AA}ngstr\"om-sized STEM probe can be used to move silicon atoms embedded in the graphene lattice with atomic precision.

Keywords

low-dimensional materials electron irradiation scanning transmission electron microscopy single-atom manipulation graphene momentum transfer

Cite

@article{arxiv.1703.02429,
  title  = {Manipulating low-dimensional materials down to the level of single atoms with electron irradiation},
  author = {T. Susi and J. C. Meyer and J. Kotakoski},
  journal= {arXiv preprint arXiv:1703.02429},
  year   = {2017}
}

Comments

partly review (Fig. 1-3) and partly new results (Fig. 4-5)

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