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We study the charge transfer dynamics between a silicon quantum dot and an individual phosphorous donor using the conduction through the quantum dot as a probe for the donor ionization state. We use a silicon n-MOSFET (metal oxide field…

介观与纳米尺度物理 · 物理学 2015-06-04 G. Mazzeo , E. Prati , M. Belli , G. Leti , S. Cocco , M. Fanciulli , F. Guagliardo , G. Ferrari

We observe anomalous charge modulations induced by ionized indium impurities on the surface of the semiconductor black phosphorus by scanning tunneling microscopy (STM). When the impurities are switched into a negatively charged state by…

Experimental and theoretical work on the ionization of deep impurity centers in the alternating terahertz field of high-intensity far-infrared laser radiation, with photon energies tens of times lower than the impurity ionization energy, is…

凝聚态物理 · 物理学 2007-05-23 S. D. Ganichev , I. N. Yassievich , W. Prettl

The demonstration of universal quantum logic operations near the fault-tolerance threshold establishes ion-implanted near-surface donor atoms as a plausible platform for scalable quantum computing in silicon. The next technological step…

We report scanning tunneling microscopy studies of individual adatoms deposited on an InSb(110) surface. The adatoms can be reproducibly dropped off from the STM tip by voltage pulses, and impact tunneling into the surface by up to ~100x.…

We report low frequency charge noise measurement on silicon substrates with different phosphorus doping densities. The measurements are performed with aluminum single electron transistors (SETs) at millikelvin temperatures where the…

介观与纳米尺度物理 · 物理学 2009-11-10 A. J. Ferguson , V. C. Chan , A. R. Hamilton , R. G. Clark

Atomic-scale understanding of phosphorous donor wave functions underpins the design and optimisation of silicon based quantum devices. The accuracy of large-scale theoretical methods to compute donor wave functions is dependent on…

材料科学 · 物理学 2017-10-03 M. Usman , B. Voisin , J. Salfi , S. Rogge , L. C. L. Hollenberg

We present a tight-binding study of donor impurities in Si, demonstrating the adequacy of this approach for this problem by comparison with effective mass theory and experimental results. We consider the response of the system to an applied…

凝聚态物理 · 物理学 2009-11-10 A. S. Martins , R. B. Capaz , Belita Koiller

Dangling bonds (DBs) are common defects in silicon that affect its electronic performance by trapping carriers at the in-gap levels. For probing the electrical properties of individual DBs, a scanning tunneling microscope (STM) is an…

材料科学 · 物理学 2025-10-20 T. V. Pavlova , V. M. Shevlyuga

Atomic-scale disorder shapes the potential energy landscape traversed by photoexcited charge carriers, while the carriers themselves also dynamically reshape this landscape. However, resolving ultrafast photocarrier motion at atomic length…

介观与纳米尺度物理 · 物理学 2026-04-29 Vedran Jelic , Kaedon Cleland-Host , Stefanie Adams , Mohamed Hassan , Austin Hayes , Tyler L. Cocker

Semiconductor devices continue to press into the nanoscale regime, and new applications have emerged for which the quantum properties of dopant atoms act as the functional part of the device, underscoring the necessity to probe the quantum…

介观与纳米尺度物理 · 物理学 2015-05-13 I. Kuljanishvili , C. Kayis , J. F. Harrison , C. Piermarocchi , T. A. Kaplan , S. H. Tessmer , L. N. Pfeiffer , K. W. West

As the ultimate miniaturization of semiconductor devices approaches, it is imperative that the effects of single dopants be clarified. Beyond providing insight into functions and limitations of conventional devices, such information enables…

介观与纳米尺度物理 · 物理学 2016-10-27 Mohammad Rashidi , Jacob Burgess , Marco Taucer , Roshan Achal , Jason L. Pitters , Sebastian Loth , Robert A. Wolkow

We have used a low-temperature scanning tunneling microscope (STM) to study the surface of heavily doped semiconductor InAs crystals. The crystals are cleaved in situ along the (110) plane. Apart from atomically flat areas, we also observe…

材料科学 · 物理学 2007-05-23 A. Depuydt , C. Van Haesendonck , N. S. Maslova , V. I. Panov , V. V. Rakov , S. V. Savinov

The ability to control single dopants in solid-state devices has opened the way towards reliable quantum computation schemes. In this perspective it is essential to understand the impact of interfaces and electric fields, inherent to…

介观与纳米尺度物理 · 物理学 2015-06-23 B. Voisin , J. Salfi , J. Bocquel , R. Rahman , S. Rogge

We have used the mechanical motion of a carbon nanotube (CNT) as a probe of the average charge on a quantum dot. Variations of the resonance frequency and the quality factor are determined by the change in average charge on the quantum dot…

The miniaturization of semiconductor devices to the scales where small numbers of dopants can control device properties requires the development of new techniques capable of characterizing their dynamics. Investigating single dopants…

Donor spin qubits in silicon offer one- and two-qubit gates with fidelities beyond 99%, coherence times exceeding 30 seconds, and compatibility with industrial manufacturing methods. This motivates the development of large-scale quantum…

Here we report the direct observation of single electron charging of a single atomic Dangling Bond (DB) on the H-Si(100) 2x1 surface. The tip of a scanning tunneling microscope is placed adjacent to the DB to serve as a single electron…

介观与纳米尺度物理 · 物理学 2015-06-15 Marco Taucer , Lucian Livadaru , Paul G. Piva , Roshan Achal , Hatem Labidi , Jason L. Pitters , Robert A. Wolkow

We carry out a detailed investigation of neutral ($D^0$) and charged ($D^-$) impurity states of hydrogen-like donors in spherical semiconductor quantum dots. The investigation is carried out within the effective mass theory (EMT). We take…

介观与纳米尺度物理 · 物理学 2009-11-10 R. K. Pandey , Manoj K. Harbola , Vijay A. Singh

We present a complete theoretical treatment of Stark effects in doped silicon, whose predictions are supported by experimental measurements. A multi-valley effective mass theory, dealing non-perturbatively with valley-orbit interactions…

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