相关论文: On BTI Aging Rejuvenation in Memory Address Decode…

Hardware aging poses a significant challenge for integrated circuits (ICs), leading to performance degradation and eventual failure. In this work, we focus on the aging of arithmetic multipliers, which are a cornerstone of modern computing…

Reliability has become an increasing concern in modern computing. Integrated circuits (ICs) are the backbone of modern computing devices across industries, including artificial intelligence (AI), consumer electronics, healthcare,…

Transistor aging phenomena manifest themselves as degradations in the main electrical characteristics of transistors. Over time, they result in a significant increase of cell propagation delay, leading to errors due to timing violations,…

Resource balancing has been effectively used to mitigate the long-term aging effects of Negative Bias Temperature Instability (NBTI) in multi-core and Graphics Processing Unit (GPU) architectures. In this work, we investigate this strategy…

Transistor aging is one of the major concerns that challenges designers in advanced technologies. It profoundly degrades the reliability of circuits during its lifetime as it slows down transistors resulting in errors due to timing…

Reliability is a crucial requirement in any modern microprocessor to assure correct execution over its lifetime. As mission critical components are becoming common in commodity systems; e.g., control of autonomous cars, the demand for…

Microcontrollers are increasingly present in embedded deployments and dependable systems, for which malfunctions due to hardware ageing can have severe impact. The lack of deployable techniques for ageing monitoring on these devices has…

The pivotal issue of reliability is one of colossal concern for circuit designers. The driving force is transistor aging, dependent on operating voltage and workload. At the design time, it is difficult to estimate close-to-the-edge…

This paper reports a novel approach that uses transistor aging in an integrated circuit (IC) to detect hardware Trojans. When a transistor is aged, it results in delays along several paths of the IC. This increase in delay results in timing…

Modern computing systems are embracing non-volatile memory (NVM) to implement high-capacity and low-cost main memory. Elevated operating voltages of NVM accelerate the aging of CMOS transistors in the peripheral circuitry of each memory…

Bias Temperature Instability (BTI) is a major reliability concern in CMOS technology, especially with High dielectric constant (High-\k{appa}/HK) metal gate (MG) transistors. In addition, the time independent process induced variation has…

Burn-in is accepted as a way to evaluate ageing effects in an accelerated manner. It has been suggested that burn-in stress may have a significant effect on the Negative Bias Temperature Instability (NBTI) of subthreshold CMOS circuits.…

Reliability management is one of the primary concerns in manycore systems design. Different aging mechanisms such as Negative-Bias Temperature Instability (NBTI), Electromigration (EM), and thermal cycling can reduce the reliability of…

The assessment of noise margins and the related probability of failure in digital cells has growingly become essential, as nano-scale CMOS and FinFET technologies are confronting reliability issues caused by aging mechanisms, such as NBTI,…

Container technology, as the key enabler behind microservice architectures, is widely applied in Cloud and Edge Computing. A long and continuous running of operating system (OS) host-ing container-based services can encounter software aging…

CMOS technology scaling makes aging effects an important concern for the design and fabrication of integrated circuits. Aging deterioration reduces the useful life of a circuit, making it fail earlier. This deterioration can affect all…

The relaxations of conductivity after a temporary change of carrier density n_s during the waiting time t_w have been studied in a strongly disordered two-dimensional electron system in Si. At low enough n_s < n_g (n_g - the glass…

Coded computation can be used to speed up distributed learning in the presence of straggling workers. Partial recovery of the gradient vector can further reduce the computation time at each iteration; however, this can result in biased…

Negative-Bias Temperature Instability is a dominant aging mechanism in nanoscale CMOS circuits such as microprocessors. With this aging mechanism, the rate of device aging is dependent not only on overall operating conditions, such as heat,…

Two-Phase TMR conserves energy by partitioning redundancy operations into two stages and making the execution of the third task copy optional, yet it remains susceptible to permanent faults. Reactive-TMR (R-TMR) counters this by isolating…