相关论文: Dark Field X-ray Microscopy Below Liquid-Helium Te…
Recent developments in x-ray science provide methods to probe deeply embedded mesoscale grain structures and spatially resolve them using dark field x-ray microscopy (DFXM). Extending this technique to investigate weak diffraction signals…
Dark-field X-ray microscopy (DFXM) is a nondestructive full-field imaging technique providing three dimensional mapping of microstructure and local strain fields in deeply embedded crystalline elements. This is achieved by placing an…
The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and…
Dark-field X-ray microscopy (DFXM) is a novel X-ray imaging technique developed at synchrotrons to image along the diffracted beam with a real space resolution of ~100 nm and reciprocal space resolution of $10^{-4}$. Recent implementations…
Dark Field X-ray Microscopy (DFXM) has advanced 3D non-destructive, high-resolution imaging of strain and orientation in crystalline materials, enabling the study of embedded structures in bulk. However, the photon-intensive nature of…
Dark-field X-ray Microscopy (DFXM) is a novel diffraction-based imaging technique that non-destructively maps the local deformation from crystalline defects in bulk materials. While studies have demonstrated that DFXM can spatially map 3D…
Dark field X-ray microscopy (DXFM) can visualize microstructural distortions in bulk crystals. Using the femtosecond X-ray pulses generated by X-ray free-electron lasers (XFEL), DFXM can achieve sub-{\mu}m spatial resolution and <100 fs…
A pump-probe dark-field X-ray microscopy (DFXM) experiment was carried out at the Advanced Photon Source (APS) with nanosecond drive laser pulses and hybrid mode X-ray probe pulses. We observe a thermal decay due to laser-induced heat…
We present a multi-purpose mirror furnace designed for synchrotron X-ray experiments. The furnace is optimized specifically for dark-field X-ray microscopy (DFXM) of crystalline materials at the beamline ID06 of the ESRF. The furnace can…
We introduce a scattering-type scanning near-field infrared microscope (s-SNIM) for the local scale near- field sample analysis and spectroscopy from room (RT) down to liquid helium (LHe) temperatures. The extension of s-SNIM down to T = 5K…
Dark Field X-ray Microscopy (DFXM) is a full-field imaging technique for non-destructive 3D mapping of orientation and strain in crystalline elements. The new DFXM beamline at ID03, developed as part of the ESRF Phase II Upgrade Project…
Dislocations control the mechanical behavior of crystalline materials, yet their quantitative characterization in bulk has remained elusive. Transmission Electron Microscopy provides atomic-scale resolution but is restricted to thin foils,…
Dark-Field X-ray Microscopy (DFXM) is a diffraction-based synchrotron imaging techique capable of imaging defects in the bulk of extended crystalline samples. We present numerical simulations of image-formation in such a microscope using…
Dark-field x-ray microscopy utilizes Bragg diffraction to collect full-field x-ray images of "mesoscale" structure of ordered materials. Information regarding the structural heterogeneities and their physical implications is gleaned through…
Resolving how defects emerge and interact within the hierarchical structure of polycrystalline materials remains a core challenge in materials science. Grain-mapping methods such as three-dimensional X-ray diffraction (3DXRD) and…
Understanding and manipulating two-dimensional materials for real-world applications remains challenging due to a lack of effective and high-throughput characterization techniques. Soft X-ray time-of-flight photoemission electron microscopy…
Spatially resolved strain measurements are crucial to understanding the properties of engineering materials. Although strain measurements utilizing techniques such as transmission electron microscopy and electron backscatter diffraction…
The current progress of materials science regarding multifunctional materials (MFM) has put forward the challenges to understand the microscopic origin of their properties. Most of such MFMs have magneto-elastic correlations. To investigate…
To advance the use of thermally-activated magnetic materials in device applications it is necessary to examine their behaviour on the localised scale in operando conditions. Equi-atomic FeRh undergoes a magnetostructural transition from an…
Scanning Thermal Microscopy (SThM) has become an important measurement tool for characterizing the thermal properties of materials at the nanometer scale. This technique requires a SThM probe that combines an Atomic Force Microscopy (AFM)…