相关论文: Robust inference for non-destructive one-shot devi…
One-shot devices data represent an extreme case of interval censoring.Some kind of one-shot units do not get destroyed when tested, and so, survival units can continue within the test providing extra information about their lifetime.…
A one-shot device is a unit that operates only once, after which it is either destroyed or needs to be rebuilt. For this type of device, the operational status can only be assessed at a specific inspection time, determining whether failure…
Accelerated life-tests (ALTs) are used for inferring lifetime characteristics of highly reliable products. In particular, step-stress ALTs increase the stress level at which units under test are subject at certain pre-fixed times, thus…
Many modern products exhibit high reliability under normal operating conditions. Conducting life tests under these conditions may result in very few observed failures, insufficient for accurate inferences. Instead, accelerated life tests…
Accelerated life tests (ALTs) play a crucial role in reliability analyses, providing lifetime estimates of highly reliable products. Among ALTs, step-stress design increases the stress level at predefined times, while maintaining a constant…
Many modern products exhibit high reliability, often resulting in long times to failure. Consequently, conducting experiments under normal operating conditions may require an impractically long duration to obtain sufficient failure data for…
Many modern products are highly reliable, often exhibiting long lifetimes. As a result, conducting experiments under normal operating conditions can be prohibitively time-consuming to collect sufficient failure data for robust statistical…
In this paper we present robust estimators for one-shot device test data under lognormal lifetimes. Based on these estimators, confidence intervals and Wald-type tests are also developed. Their robustness feature is illustrated through a…
Many products in engineering are highly reliable with large mean lifetimes to failure. Performing lifetests under normal operations conditions would thus require long experimentation times and high experimentation costs. Alternatively,…
Accelerated life-testing (ALT) is a very useful technique for examining the reliability of highly reliable products. It allows testing the products at higher than usual stress conditions to induce failures more quickly and economically than…
The present study aims to determine the lifetime prognosis of highly durable nondestructive one-shot devices (NOSD) units under a step-stress accelerated life testing (SSALT) experiment applying a cumulative risk model (CRM). In an SSALT…
In the literature, the reliability analysis of one-shot devices is found under accelerated life testing in the presence of various stress factors. The application of one-shot devices can be extended to the bio-medical field, where we often…
Most work on one-shot devices assume that there is only one possible cause of device failure. However, in practice, it is often the case that the products under study can experience any one of various possible causes of failure. Robust…
The prevalence of one-shot devices is quite prolific in engineering and medical domains. Unlike typical one-shot devices, nondestructive one-shot devices (NOSD) may survive multiple tests and offer additional data for reliability…
In this paper, we develop robust estimators and tests for one-shot device testing under proportional hazards assumption based on divergence measures. Through a detailed Monte Carlo simulation study and a numerical example, the developed…
Accelerated life testing (ALT) is a method of reducing the lifetime of components through exposure to extreme stress. This method of obtaining lifetime information involves the design of a testing experiment, i.e., an accelerated test plan.…
This paper develops a new family of estimators, the minimum density power divergence estimators (MDPDEs), for the parameters of the one-shot device model as well as a new family of test statistics, Z-type test statistics based on MDPDEs,…
In this paper, we investigate accelerated life testing (ALT) models based on the Weibull distribution with stress-dependent shape and scale parameters. Temperature and voltage are treated as stress variables influencing the lifetime…
This paper presents a robust method for estimating copula models to evaluate dependence between failure modes in one-shot devices-systems designed for single use and destroyed upon activation. Traditional approaches, such as maximum…
Accelerated degradation tests are used to provide accurate estimation of lifetime properties of highly reliable products within a relatively short testing time. There data from particular tests at high levels of stress (e.\,g.\ temperature,…