Robust estimation based on one-shot device test data under log-normal lifetimes
Applications
2022-11-07 v1
Abstract
In this paper we present robust estimators for one-shot device test data under lognormal lifetimes. Based on these estimators, confidence intervals and Wald-type tests are also developed. Their robustness feature is illustrated through a simulation study and two numerical examples.
Cite
@article{arxiv.2211.02118,
title = {Robust estimation based on one-shot device test data under log-normal lifetimes},
author = {N. Balakrishnan and E. Castilla},
journal= {arXiv preprint arXiv:2211.02118},
year = {2022}
}
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