English

Robust estimation based on one-shot device test data under log-normal lifetimes

Applications 2022-11-07 v1

Abstract

In this paper we present robust estimators for one-shot device test data under lognormal lifetimes. Based on these estimators, confidence intervals and Wald-type tests are also developed. Their robustness feature is illustrated through a simulation study and two numerical examples.

Cite

@article{arxiv.2211.02118,
  title  = {Robust estimation based on one-shot device test data under log-normal lifetimes},
  author = {N. Balakrishnan and E. Castilla},
  journal= {arXiv preprint arXiv:2211.02118},
  year   = {2022}
}
R2 v1 2026-06-28T05:08:47.641Z