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Multi-tip scanning tunneling microscopy (STM) is a powerful method to perform charge transport measurements at the nanoscale. With four STM tips positioned on the surface of a sample, four-point resistance measurements can be performed in…

介观与纳米尺度物理 · 物理学 2022-01-28 A. Leis , V. Cherepanov , B. Voigtländer , F. S. Tautz

We discuss the effect of the local field polarization in metallic nanostructures where large field enhancements can be induced by excitation of localized surface plasmons. To demonstrate the importance of these effects, we study a few model…

化学物理 · 物理学 2007-05-23 E. C. Le Ru , P. G. Etchegoin

Accurately measuring the size, morphology, and structure of nanoparticles is very important, because they are strongly dependent on their properties for many applications. In this paper, we present a deep-learning based method for…

The effect of non-planar substrate surface on homogeneity and quality of cold sprayed (CS) deposits was studied by scanning acoustic microscopy (SAM). Fe coatings were cold sprayed onto Al substrates containing artificially introduced…

Transmission Electron Microscopy (TEM) is a powerful tool for imaging material structure and characterizing material chemistry. Recent advances in data collection technology for TEM have enabled high-volume and high-resolution data…

计算机视觉与模式识别 · 计算机科学 2021-08-24 Josh Kacher , Yao Xie , Sven P. Voigt , Shixiang Zhu , Henry Yuchi , Jordan Key , Surya R. Kalidindi

Real-space mapping of doping concentration in semiconductor devices is of great importance for the microelectronic industry. In this work, a scanning microwave impedance microscope (MIM) is employed to resolve the local conductivity…

介观与纳米尺度物理 · 物理学 2013-01-08 Worasom Kundhikanjana , Yongliang Yang , Qiaochu Tang , Kun Zhang Keji Lai , Yue Ma , Mike Kelly , Xinxin Li , Zhi-Xun Shen

Scanning Electron Microscopy (SEM) images often suffer from noise contamination, which degrades image quality and affects further analysis. This research presents a complete approach to estimate their Signal-to-Noise Ratio (SNR) and noise…

机器学习 · 计算机科学 2025-10-10 D. Chee Yong Ong , I. Bukhori , K. S. Sim , K. Beng Gan

Scanning Probe Microscopy is used to study and quantify the nanoscale electric phenomena in the two classes of oxide systems, namely transport at electroactive grain boundaries and surface behavior of ferroelectric materials. Scanning…

材料科学 · 物理学 2007-05-23 Sergei V. Kalinin

Modeling artificial scanning electron microscope (SEM) and scanning ion microscope images has recently become important. This is because of the need to provide repeatable images with a priori determined parameters. Modeled artificial images…

仪器与探测器 · 物理学 2015-05-19 Petr Cizmar , Andras E. Vladar , Michael T. Postek

Electron spectroscopy implemented in electron microscopes provides high spatial resolution, down to the atomic scale, of the chemical, electronic, vibrational and optical properties of materials. In this review, we will describe how…

材料科学 · 物理学 2025-11-11 Luiz H. G. Tizei , Yves Auad , Florian Castioni , Mathieu Kociak

Mass spectrometry imaging (MSI) enables label-free visualization of molecular distributions across tissue samples but generates large and complex datasets that require effective peak picking to reduce data size while preserving meaningful…

计算机视觉与模式识别 · 计算机科学 2026-03-12 Philipp Weigand , Nikolas Ebert , Shad A. Mohammed , Denis Abu Sammour , Carsten Hopf , Oliver Wasenmüller

Electrochemistry is the underlying mechanism in a variety of energy conversion and storage systems, and it is well known that the composition, structure, and properties of electrochemical materials near active interfaces often deviates…

材料科学 · 物理学 2018-02-07 Ahmad Eshghinejad , Ehsan Nasr Esfahani , Chihou Lei , Jiangyu Li

Circular dichroism spectroscopy is an essential technique for understanding molecular structure and magnetic materials, but spatial resolution is limited by the wavelength of light, and sensitivity sufficient for single-molecule…

Coherent spin resonance methods, such as nuclear magnetic resonance and electron spin resonance spectroscopy, have led to spectrally highly sensitive, non-invasive quantum imaging techniques. Here, we propose a pump-probe spin resonance…

量子物理 · 物理学 2024-12-02 Philipp Haslinger , Stefan Nimmrichter , Dennis Rätzel

Motivated by the importance of magnetization dynamics in nanomagnets for the development and optimization of magnetic devices and sensors, we measured and modeled spin wave spectra in patterned elliptical nanomagnets. Ferromagnetic…

材料科学 · 物理学 2021-02-03 H. T. Nembach , R. D. McMichael , M. L. Schneider , J. M. Shaw , T. J. Silva

Scanning transmission electron microscopy (STEM) is a powerful tool to reveal the morphologies and structures of materials, thereby attracting intensive interests from the scientific and industrial communities. The outstanding spatial…

图像与视频处理 · 电气工程与系统科学 2024-09-26 Hanlei Zhang , Jincheng Bai , Xiabo Chen , Can Li , Chuanjian Zhong , Jiye Fang , Guangwen Zhou

We use a cooled Scanning Probe Microscope (SPM) to electron motion in nanoscale devices. The charged tip of the SPM is raster scanned at a constant height above the surface as the conductance of the device is measured. The image charge…

介观与纳米尺度物理 · 物理学 2017-03-08 Sagar Bhandari , Gil-Ho Lee , Philip Kim , Robert M. Westervelt

Electron tomography in materials science has flourished with the demand to characterize nanoscale materials in three dimensions (3D). Access to experimental data is vital for developing and validating reconstruction methods that improve…

Observing the individual building blocks of matter is one of the primary goals of microscopy. The invention of the scanning tunneling microscope [1] revolutionized experimental surface science in that atomic-scale features on a solid-state…

材料科学 · 物理学 2008-08-04 Jannik C. Meyer , C. O. Girit , M. F. Crommie , A. Zettl

Single-particle cryo-electron microscopy (cryo-EM) is a leading technology to resolve the structure of molecules. Early in the process, the user detects potential particle images in the raw data. Typically, there are many false detections…

图像与视频处理 · 电气工程与系统科学 2023-03-08 Gili Weiss-Dicker , Amitay Eldar , Yoel Shkolinsky , Tamir Bendory