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We present the development of extended diffraction tomography, a new approach to the solution of the linear seismic waveform inversion problem. This method has several appealing features, such as the use of arbitrary depth-dependent…

On-chip optical trapping systems allow for high scalability and lower the barrier to access. Systems capable of trapping multiple particles typically come with high cost and complexity. Here we present a technique for making parabolic…

Determining crystal structures from powder X-ray diffraction (PXRD) has been a significant challenge in materials science, particularly when experimental data contain noise or the target structure has a high complexity. While recent AI…

We consider the following geometric optics problem: Construct a system of two reflectors which transforms a spherical wavefront generated by a point source into a beam of parallel rays. This beam has a prescribed intensity distribution. We…

The increased sensitivity of future radio telescopes will result in requirements for higher dynamic range within the image as well as better resolution and immunity to interference. In this paper we propose a new matrix formulation of the…

The optical aberrations of a system can be described in terms of the wave aberrations, defined as the departure from the ideal spherical wavefront; or the ray aberrations, which are in turn the deviations from the paraxial ray intersection…

Lamellar gratings are widely used diffractive optical elements; gratings etched into Si can be used as structural elements or prototypes of structural elements in integrated electronic circuits. For the control of the lithographic…

We have designed, optimized, fabricated and characterized highly reflective quasi-omnidirectional (angular range of $0-60^\circ$) multilayered structures with a wide spectral range. Two techniques, chirping (a continuous change in…

A refined model of an extreme ultraviolet (EUV) mask stack consisting of the Mo/Si multilayer coated by a Ru protective layer and a TaBN/TaBO absorber layer was developed to facilitate accurate simulations of EUV mask performance for…

The imaging problem of a specular reflector is revisited. Retaining terms through second order in the reflector surface expansion, we derive the form of the aberration-limiting aperture for arbitrary magnification assuming no bandwidth…

Highly directional radiation from photonic structures is important for many applications, including high power photonic crystal surface emitting lasers, grating couplers, and light detection and ranging devices. However, previous…

MeV ultrafast electron diffraction (MUED) is a pump-probe technique used to study the dynamic structural evolution of materials. An ultrashort laser pulse triggers structural changes, which are then probed by an ultrashort relativistic…

The possibility to obtain a three-dimensional representation of a single object with sub-$\mu$m resolution is crucial in many fields, from material science to clinical diagnostics. This is typically achieved through tomography, which…

The interest in using optical transition radiation (OTR) in high energy (multiGeV) beam diagnostics has motivated theoretical and experimental investigations on the limitations brought by diffraction on the attainable resolution. This paper…

Rather than using an adaptive optics (AO) system to correct a telescope s entire pupil, it can instead be used to more finely correct a smaller sub-aperture. Indeed, existing AO systems can be used to correct a sub-aperture 1/3 to 1/2 the…

Far-field characterization of small objects is severely constrained by the diffraction limit. Existing tools achieving sub-diffraction resolution often utilize point-by-point image reconstruction via scanning or labelling. Here, we present…

In this paper a theory of reflective X-ray multilayer structures with a graded (slowly varying) period based on the coupled waves method and quasi-classical asymptotic expansions is reported. A number of exact solutions of the coupled wave…

We demonstrate high resolution extreme ultraviolet (EUV) coherent diffractive imaging in the most general reflection geometry by combining ptychography with tilted plane correction. This method makes it possible to image extended surfaces…

When a sample's X-ray diffraction pattern (XRD) is measured, the corresponding crystal structure is usually determined by searching for similar XRD patterns in the database. However, if a similar XRD pattern is not found, it is tremendously…

We introduce a novel learning-based method to reconstruct the high-quality geometry and complex, spatially-varying BRDF of an arbitrary object from a sparse set of only six images captured by wide-baseline cameras under collocated point…