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相关论文: Machine Learning Analysis of Perovskite Oxides Gro…

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Perovskite oxides such as LaFeO$_3$ are a well-studied family of materials that possess a wide range of useful and novel properties. Successfully synthesizing perovskite oxide samples usually requires a significant number of growth attempts…

材料科学 · 物理学 2025-04-09 Patrick T. Gemperline , Rajendra Paudel , Rama K. Vasudevan , Ryan B. Comes

In situ reflective high-energy electron diffraction (RHEED) is widely used to monitor the surface crystalline state during thin-film growth by molecular beam epitaxy (MBE) and pulsed laser deposition. With the recent development of machine…

We show that reflection high-energy electron diffraction (RHEED) can be used as a highly sensitive tool to track surface and resulting film stoichiometry in adsorption-limited molecular beam epitaxy of (001) SrTiO3 thin films. Even under…

材料科学 · 物理学 2015-03-17 Adam P. Kajdos , Susanne Stemmer

Reflection high-energy electron diffraction (RHEED) is a powerful tool in molecular beam epitaxy (MBE), but RHEED images are often difficult to interpret, requiring experienced operators. We present an approach for automated surveillance of…

介观与纳米尺度物理 · 物理学 2023-06-09 Abdourahman Khaireh-Walieh , Alexandre Arnoult , Sébastien Plissard , Peter R. Wiecha

Pulsed Laser Deposition in molecular-beam epitaxy environment (Laser-MBE) has been used to grow high quality BaCuOx/CaCuO2 superlattices. In situ Reflection High Energy Electron Diffraction (RHEED) shows that the growth mechanism is…

Reflection High-Energy Electron Diffraction (RHEED) is a powerful tool to probe the surface reconstruction during MBE growth. However, raw RHEED patterns are difficult to interpret, especially when the wafer is rotating. A more accessible…

介观与纳米尺度物理 · 物理学 2025-08-12 Abdourahman Khaireh-Walieh , Alexandre Arnoult , Sébastien Plissard , Peter R. Wiecha

The use of reflection high energy electron diffraction (RHEED) plays a critical role for in-situ characterization in molecular beam epitaxy, pulsed laser deposition and sputtering. While sensitive to crystal symmetries and morphology, it is…

The use of oxide materials in oxide electronics requires their controlled epitaxial growth. Recently, it was shown that Reflection High Energy Electron Diffraction (RHEED) allows to monitor the growth of oxide thin films even at high oxygen…

材料科学 · 物理学 2009-11-07 D. Reisinger , B. Blass , J. Klein , J. B. Philipp , M. Schonecke , A. Erb , L. Alff , R. Gross

Reflection high-energy electron diffraction (RHEED) is a powerful tool for characterizing crystal surface structures. However, the setup geometry leads to distorted and complicated patterns, which are not straightforward to link to the…

材料科学 · 物理学 2022-08-25 Chong Liu , Kai Chang , Ke Zou

The epitaxial deposition of the first oxide buffer layer (seed layer) on biaxially textured Ni tape for coated conductors is a critical step that is dependent on the atomistic surface condition of the metal. We present a study of the…

超导电性 · 物理学 2007-05-23 C. Cantoni , D. K. Christen , R. Feenstra , A. Goyal , G. W. Ownby , D. M. Zehner , D. P. Norton

We present a pulsed laser deposition (PLD) system that can monitor growth by simultaneously using in situ optical spectroscopic ellipsometry (SE) and reflection high-energy electron diffraction (RHEED). The RHEED precisely monitors the…

材料科学 · 物理学 2013-09-09 J. H. Gruenewald , J. Nichols , S. S. A. Seo

Epitaxial Fe film has been grown on ion beam sputtered MgO(001) substrate by electron beam evaporation. Reflection high energy electron diffraction (RHEED) and transport measurements (TM) were performed simultaneously during the growth of…

材料科学 · 物理学 2024-01-11 Md. Shahid Jamal , Dileep Kumar

During layer-by-layer homoepitaxial growth, both the Reflection High-Energy Electron Diffraction (RHEED) intensity and the x-ray reflection intensity will oscillate, and each complete oscillation indicates the addition of one monolayer of…

Transition metal oxide heterostructures and interfaces host a variety of exciting quantum phases and can be grown with atomic-scale precision by utilising the intensity oscillations of $in$ $situ$ reflection high-energy electron diffraction…

材料科学 · 物理学 2017-08-02 T. W. Zhang , Z. W. Mao , Z. B. Gu , Y. F. Nie , X. Q. Pan

Molecular beam epitaxy (MBE) is a state-of-the-art technique for depositing thin films with precise stoichiometric control. However, when depositing oxides of perovskite-type ABO3, this process becomes challenging as controlling the flux…

Materials synthesis optimization is constrained by serial feedback processes that rely on manual tools and intuition across multiple siloed modes of characterization. We automate and generalize feature extraction of reflection high-energy…

We investigate the influence of step edge diffusion (SED) and desorption on Molecular Beam Epitaxy (MBE) using kinetic Monte-Carlo simulations of the solid-on-solid (SOS) model. Based on these investigations we propose two strategies to…

统计力学 · 物理学 2009-10-31 S. Schinzer , M. Sokolowski , M. Biehl , W. Kinzel

Antiperovskites, or inverse perovskites, have recently emerged as a material class with a plethora of promising electronic properties. This perspective describes the molecular beam epitaxy (MBE) growth of oxide antiperovskites Sr$_3$PbO and…

材料科学 · 物理学 2022-07-05 H. Nakamura , D. Huang , H. Takagi

Using kinetic Monte-Carlo simulations of a Solid-on-Solid model we investigate the influence of step edge diffusion (SED) and evaporation on Molecular Beam Epitaxy (MBE). Based on these investigations we propose two strategies to optimize…

材料科学 · 物理学 2009-10-31 S. Schinzer , M. Sokolowski , M. Biehl , W. Kinzel

The evolution of RHEED reflexes intensity during reconstructed transitions characterizes (often implicitly) reconstructed surface state peculiarities. The approaches of a correct RHEED data interpretation, aimed at obtaining information…

材料科学 · 物理学 2017-12-18 A. V. Vasev , M. A. Putyato , V. V. Preobrazhenskii
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