相关论文: Creation and Fixing of Lithography Hotspots with S…

Continuous technology scaling and the introduction of advanced technology nodes in Integrated Circuit (IC) fabrication is constantly exposing new manufacturability issues. One such issue, stemming from complex interaction between design and…

As technology scaling is approaching the physical limit, lithography hotspot detection has become an essential task in design for manufacturability. While the deployment of pattern matching or machine learning in hotspot detection can help…

Machine learning-based lithography hotspot detection has been deeply studied recently, from varies feature extraction techniques to efficient learning models. It has been observed that such machine learning-based frameworks are providing…

Pattern matching design verification has gained noticeable attention in semiconductor technologies as it can precisely identify more localized problematic areas (weakpoints) in the layout. To address these weakpoints, engineers adopt…

Layout hotpot detection is one of the main steps in modern VLSI design. A typical hotspot detection flow is extremely time consuming due to the computationally expensive mask optimization and lithographic simulation. Recent researches try…

Mapper algorithm can be used to build graph-based representations of high-dimensional data capturing structurally interesting features such as loops, flares or clusters. The graph can be further annotated with additional colouring of…

Recent advances in VLSI fabrication technology have led to die shrinkage and increased layout density, creating an urgent demand for advanced hotspot detection techniques. However, by taking an object detection network as the backbone,…

In many advanced network analysis applications, like social networks, e-commerce, and network security, hotspots are generally considered as a group of vertices that are tightly connected owing to the similar characteristics, such as common…

In Directed Self Assembly (DSA), poor printing of guiding templates can cause misassembly resulting in high defect probability. Therefore, hotspots should be avoided in the choice of the DSA groups. Accordingly, Directed Self-Assembly (DSA)…

In this paper, we present a YOLO-based framework for layout hotspot detection, aiming to enhance the efficiency and performance of the design rule checking (DRC) process. Our approach leverages the YOLOv8 vision model to detect multiple…

At advanced process nodes, lithography weakpoints can exist in physical layouts of integrated circuit designs even if the layouts pass design rule checking (DRC). Existence of lithography weakpoints in a physical layout can cause…

In this paper we present EPIC, an efficient and effective predictor for IC manufacturing hotspots in deep sub-wavelength lithography. EPIC proposes a unified framework to combine different hotspot detection methods together, such as machine…

Providing architectural support is crucial for newly arising applications to achieve high performance and high system efficiency. Currently there is a trend in designing accelerators for special applications, while arguably a debate is…

Analog layout synthesis requires some elements in the circuit netlist to be matched and placed symmetrically. However, the set of symmetries is very circuit-specific and a versatile algorithm, applicable to a broad variety of circuits, has…

Properly benchmarking Automated Program Repair (APR) systems should contribute to the development and adoption of the research outputs by practitioners. To that end, the research community must ensure that it reaches significant milestones…

In the constraint programming framework, state-of-the-art static and dynamic decomposition techniques are hard to apply to problems with complete initial constraint graphs. For such problems, we propose a hybrid approach of these techniques…

Design patterns being applied more and more to solve the software engineering difficulties in the object oriented software design procedures. So, the design pattern detection is widely used by software industries. Currently, many solutions…

Space and time are two critical components of many real world systems. For this reason, analysis of anomalies in spatiotemporal data has been a great of interest. In this work, application of tensor decomposition and eigenspace techniques…

The optimizations of the track fittings require complex simulations of silicon strip detectors to be compliant with the fundamental properties of the hit heteroscedasticity. Many different generations of random numbers must be available…

Hierarchical crack patterns that arise during the drying of thin films of colloidal dispersions or polymer solutions on a solid substrate are of interest both from a fundamental standpoint and in the context of the creation of transparent…