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相关论文: Standard Cell Library Design and Optimization Meth…

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While standard cell layouts are drawn with minimum design rules to maximize the benefit of design area shrinkage, the complicated design rules have caused difficulties with signal routes accessing the pins in standard cell layouts. As a…

其他计算机科学 · 计算机科学 2018-05-30 Yongfu Li , Wan Chia Ang , Chin Hui Lee , Kok Peng Chua , Yoong Seang Jonathan Ong , Chiu Wing Colin Hui

Custom standard cell libraries can improve the final quality of the corresponding VLSI designs but properly customizing standard cell libraries remains challenging due to the complex characteristics of the VLSI designs. This paper presents…

硬件体系结构 · 计算机科学 2022-07-26 Tingyuan Liang , Jingsong Chen , Lei Li , Wei Zhang

The development of a standard cell library involves characterization of a number of gate-level circuits at various cell-level abstractions. Verifying the behavior of these cells largely depends on the manual skills of the circuit designers.…

While standard cell layouts are drawn with minimum design rules for maximum benefit of design area shrinkage, the complicated design rules begin to cause difficulties with signal routes accessing the pins in standard cell layouts. Multiple…

其他计算机科学 · 计算机科学 2018-05-28 Yongfu Li , Chin Hui Lee , Wan Chia Ang , Kok Peng Chua , Yoong Seang Jonathan Ong , Chiu Wing Colin Hui

To tackle the complexity of state-of-the-art electronic systems, silicon foundries continuously shrink the technology nodes and electronic design automation (EDA) vendors offer hierarchical design flows to decompose systems into smaller…

其他计算机科学 · 计算机科学 2021-09-13 Linan Cao , Simon J. Bale , Martin A. Trefzer

Design technology co-optimization (DTCO) plays a critical role in achieving optimal power, performance, and area (PPA) for advanced semiconductor process development. Cell library characterization is essential in DTCO flow, but traditional…

机器学习 · 计算机科学 2024-03-20 Tianliang Ma , Guangxi Fan , Zhihui Deng , Xuguang Sun , Kainlu Low , Leilai Shao

Starting from 22-nm, a standard cell must be designed to be full lithography-compliant, which includes Design Rule Check, Design-for-Manufacturability and Double-Patterning compliant. It has become a great challenge for physical layout…

其他计算机科学 · 计算机科学 2018-05-29 Yongfu Li , Wan Chia Ang , Chin Hui Lee , Kok Peng Chua , Yoong Seang Jonathan Ong , Chiu Wing Colin Hui

Self-aligned double patterning (SADP) has become a promising technique to push pattern resolution limit to sub-22nm technology node. Although SADP provides good overlay controllability, it encounters many challenges in physical design…

硬件体系结构 · 计算机科学 2014-02-12 Jhih-Rong Gao , Bei Yu , Ru Huang , David Z. Pan

Hardware design workflows rely on Process Design Kits (PDKs) from different fabrication nodes, each containing standard cell libraries optimized for speed, power, or density. Engineers typically navigate between the design and target PDK to…

计算与语言 · 计算机科学 2025-07-01 Manar Abdelatty , Jacob Rosenstein , Sherief Reda

This paper presents a design space exploration for SABER, one of the finalists in NIST's quantum-resistant public-key cryptographic standardization effort. Our design space exploration targets a 65nm ASIC platform and has resulted in the…

密码学与安全 · 计算机科学 2021-09-17 Malik Imran , Felipe Almeida , Jaan Raik , Andrea Basso , Sujoy Sinha Roy , Samuel Pagliarini

We design quantum circuits by using the standard cell approach borrowed from classical circuit design, which can speed-up the layout of circuits with a regular structure. Our standard cells are general and can be used for all types of…

量子物理 · 物理学 2024-04-10 Evan E. Dobbs , Joseph S. Friedman , Alexandru Paler

Rapid Single Flux Quantum (RSFQ) circuits are the most evolved superconductor logic family. However, the need to clock each cell and the deep pipeline causes a complex clock network with a large skew. This results in lower throughput and…

As the feature size of semiconductor process further scales to sub-16nm technology node, triple patterning lithography (TPL) has been regarded one of the most promising lithography candidates. M1 and contact layers, which are usually…

硬件体系结构 · 计算机科学 2014-02-12 Bei Yu , Xiaoqing Xu , Jhih-Rong Gao , David Z. Pan

At advanced process nodes, lithography weakpoints can exist in physical layouts of integrated circuit designs even if the layouts pass design rule checking (DRC). Existence of lithography weakpoints in a physical layout can cause…

其他计算机科学 · 计算机科学 2018-10-04 I-Lun Tseng , Yongfu Li , Valerio Perez , Vikas Tripathi , Zhao Chuan Lee , Jonathan Yoong Seang Ong

High quality standard cell layout automation in advanced technology nodes is still challenging in the industry today because of complex design rules. In this paper we introduce an automatic standard cell layout generator called NVCell that…

机器学习 · 计算机科学 2021-07-16 Haoxing Ren , Matthew Fojtik , Brucek Khailany

Digital In-memory computing improves energy efficiency and throughput of a data-intensive process, which incur memory thrashing and, resulting multiple same memory accesses in a von Neumann architecture. Digital in-memory computing involves…

硬件体系结构 · 计算机科学 2021-08-11 Veerendra S Devaraddi , Joycee M. Mekie

The integration of silicon photonics (SiPh) and phase change materials (PCMs) has created a unique opportunity to realize adaptable and reconfigurable photonic systems. In particular, the nonvolatile programmability in PCMs has made them a…

新兴技术 · 计算机科学 2023-03-29 Amin Shafiee , Benoit Charbonnier , Sudeep Pasricha , Mahdi Nikdast

This paper presents the physical design exploration of a domain-specific processor (DSIP) architecture targeted at machine learning (ML), addressing the challenges of interconnect efficiency in advanced Angstrom-era technologies. The design…

Automated design of neural network architectures tailored for a specific task is an extremely promising, albeit inherently difficult, avenue to explore. While most results in this domain have been achieved on image classification and…

计算机视觉与模式识别 · 计算机科学 2019-05-20 Vladimir Nekrasov , Hao Chen , Chunhua Shen , Ian Reid

Transistor topology optimization is a critical step in standard cell design, directly dictating diffusion sharing efficiency and downstream routability. However, identifying optimal topologies remains a persistent bottleneck, as…

机器学习 · 计算机科学 2026-04-17 Zhan Song , Yu-Tung Liu , Chen Chen , Guoheng Sun , Jiaqi Yin , Chia-tung Ho , Ang Li , Haoxing Ren , Cunxi Yu
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