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Orientation determination does not necessarily require complete knowledge of the local atomic arrangement in a material. We present a method for microstructural phase discrimination and orientation analysis of phases for which there is only…

材料科学 · 物理学 2019-06-06 Aimo Winkelmann , Grzegorz Cios , Tomasz Tokarski , Gert Nolze , Ralf Hielscher , Tomasz Kocieł

Switchable order parameters in ferroic materials are essential for functional electronic devices, yet disruptions of the ordering can take the form of planar boundaries or defects that exhibit distinct properties. Characterizing the…

The use of highly sensitive pixelated direct detectors has dramatically improved the performance of high energy instrumentation such as transmission electron microscopy. Here, we describe a recently developed monolithic active pixel sensor…

High-contrast scattered light observations have revealed the surface morphology of several dozens of protoplanetary disks at optical and near-infrared wavelengths. Inclined disks offer the opportunity to measure part of the phase function…

地球与行星天体物理 · 物理学 2016-12-07 T. Stolker , C. Dominik , M. Min , A. Garufi , G. D. Mulders , H. Avenhaus

Diffraction patterns of electrons are believed to resemble those of electromagnetic waves (EMW). I performed a series of experiments invoked to show that the periodicity of peaks in the diffraction diagram of electrons is concerned with the…

综合物理 · 物理学 2010-02-23 Victor V. Demjanov

The dynamics of photo-excited charge carriers, particularly their transport and interactions with defects and interfaces, play an essential role in determining the performance of a wide range of solar and optoelectronic devices. A thorough…

材料科学 · 物理学 2017-08-07 Bolin Liao , Ebrahim Najafi

In a recently developed methodology termed photon induced near-field electron microscopy (PINEM), the inelastic scattering of electrons off illuminated nanostructures provides direct experimental access to the structure of optical…

介观与纳米尺度物理 · 物理学 2024-05-21 Niklas Müller , Gerrit Vosse , Ferdinand Evers , Sascha Schäfer

Twisted 2D material heterostructures provide an exciting platform for investigating new fundamental physical phenomena. Many of the most interesting behaviours emerge at small twist angles, where the materials reconstruct to form areas of…

Electron microscopy (EM) is a foundational tool for directly assessing the structure of materials. Recent advances in direct electron detectors have improved signal-to noise ratios via single-electron counting. However, accurately counting…

Realization of graphene moir\'e superstructures on the surface of 4d and 5d transition metals offers templates with periodically modulated electron density, which is responsible for a number of fascinating effects, including the formation…

材料科学 · 物理学 2013-01-18 E. N. Voloshina , E. Fertitta , A. Garhofer , F. Mittendorfer , M. Fonin , A. Thissen , Yu. S. Dedkov

Interactions between photons and electrons are ubiquitous in astrophysics. Photons can be down scattered (Compton scattering) or up scattered (inverse Compton scattering) by moving electrons. Inverse Compton scattering, in particular, is an…

高能天体物理现象 · 物理学 2023-04-05 Anderson C. M. Lai , Kenny C. Y. Ng

A new tool providing material contrast control in scanning electron microscopy (SEM) is demonstrated. The approach is based on deep-UV illumination during SEM imaging and delivers a novel material based contrast as well as higher resolution…

仪器与探测器 · 物理学 2016-04-07 Gediminas Seniutinas , Armandas Balcytis , Saulius Juodkazis

Polarisation imaging is used to distinguish objects and surface characteristics that are otherwise not visible with black-and-white or colour imaging. Full-Stokes polarisation imaging allows complex image processing like water glint…

Optical methods for monitoring the electrochemical reaction at the interface are advantageous because of their table-top setup and ease of integration into reactors. Here we apply EDL-modulation microscopy to one of the main components of…

化学物理 · 物理学 2023-03-21 Zhu Zhang , Sanli Faez

The use of electron mirrors in aberration correction and surface-sensitive microscopy techniques such as low-energy electron microscopy has been established. However, in this work, by implementing an easy to construct, fully electrostatic…

Most material discrimination in security inspections is based on dual-energy x-ray imaging, which enables the determination of a material's effective atomic number (Zeff) as well as electron density and its consequent classification as…

材料科学 · 物理学 2023-08-16 A. Astolfo , I. G. Haig , D. Bate , A. Olivo , P. Modregger

We propose a new scanning transmission electron microscopy (STEM) technique that can realize the three-dimensional (3D) characterization of vacancies, lighter and heavier dopants with high precision. Using multislice STEM imaging and…

材料科学 · 物理学 2016-07-12 Jared M. Johnson , Soohyun Im , Jinwoo Hwang

Imaging terrestrial exoplanets around nearby stars is a formidable technical challenge, requiring the development of coronagraphs to suppress the stellar halo of diffracted light at the location of the planet. In this review, we derive the…

天体物理仪器与方法 · 物理学 2025-06-04 Matthew A. Kenworthy , Sebastiaan Y. Haffert

High angular resolution electron backscatter diffraction (HR-EBSD) affords an increase in angular resolution, as compared to 'conventional' Hough transform based EBSD, of two orders of magnitude, enabling measurements of relative…

仪器与探测器 · 物理学 2017-10-03 T Ben Britton , James L R Hickey

Knowledge of molecular structure is paramount in understanding, and ultimately influencing, chemical reactivity. For nearly a century, diffractive imaging has been used to identify the structures of many biologically-relevant gas-phase…

化学物理 · 物理学 2020-03-09 Kasra Amini , Jens Biegert