相关论文: Modeling and Simulation of Electromigration Behavi…

In this paper, we modeled and simulated uneven current distribution for on-die interconnect structure. We show significant difference when considering uneven current distribution. Finite Element Method approach is used to analyze various…

In this paper, we briefly introduce physical foundations of electromigration (EM) and present a few classical EMrelated theories. We discuss physical parameters affecting EM wire lifetime and we introduce some background related to the…

Electromigration (EM) is a key reliability issue in deeply scaled technology nodes. Traditional EM methods first filter immortal wires using the Blech criterion, and then perform EM analysis based on Black's equation on the remaining wires.…

Electromigration (EM) is one of the major concerns in the reliability analysis of very large scale integration (VLSI) systems due to the continuous technology scaling. Accurately predicting the time-to-failure of integrated circuits (IC)…

Reliability is a fundamental requirement in any microprocessor to guarantee correct execution over its lifetime. The design rules related to reliability depend on the process technology being used and the expected operating conditions of…

The electromigration (EM) of metallic lines is studied in terms of competition between two percolative processes taking place in a random resistor network. The effects associated with the transport of mass and with the consequent growth of…

With 3D-stacked DRAM architectures becoming more prevalent, it has become important to find ways to characterize and mitigate the adverse effects that can hinder their inherent access parallelism and throughput. One example of such…

Electromigration phenomena in metallic lines are studied by using a biased resistor network model. The void formation induced by the electron wind is simulated by a stochastic process of resistor breaking, while the growth of mechanical…

The electronic interconnections in the state-of-the-art integrated circuit manufacturing have been scaled down to the micron or sub-micron scale. This results in a dramatic increase in the current density passing through interconnections,…

The spread of viruses in biological networks, computer networks, and human contact networks can have devastating effects; developing and analyzing mathematical models of these systems can be insightful and lead to societal benefits. Prior…

As integrated circuit technologies are moving to smaller technology nodes, Electromigration (EM) has become one of the most challenging problems facing the EDA industry. While numerical approaches have been widely deployed since they can…

This paper proposes a distributed optimization-based algorithm for electric vehicle (EV) charging and discharging, incorporating EV customer economics and distribution network constraints enforced on an unbalanced distribution grid.…

This paper proposes a time-zone vector autoregression (VAR) model to investigate comovements in the global financial market. Analyzing daily data from 36 national equity markets, we explore the subprime and European debt crises using static…

Electromagnetic transient (EMT) simulation is a crucial tool for power system dynamic analysis because of its detailed component modeling and high simulation accuracy. However, it suffers from computational burdens for large power grids…

Traditional methodologies for analyzing electromigration (EM) in VLSI circuits first filter immortal wires using Blech's criterion, and then perform detailed EM analysis on the remaining wires. However, Blech's criterion was designed for…

The increasing frequency of extreme weather events poses significant risks to power distribution systems, leading to widespread outages and severe economic and social consequences. This paper presents a novel simulation framework for…

This paper proposes a gamma process for modelling the damage that accumulates over time in the lumber used in structural engineering applications when stress is applied. The model separates the stochastic processes representing features…

It is very important to locate the short-circuit fault in a power system quickly and accurately. Electromagnetic time reversal (EMTR) has drawn increasing attention because of its clear physical background and excellent performance. This…

Electron transfer (ET) across molecular chains including an impurity is studied based on a recently improved real-time path integral Monte Carlo (PIMC) approach [J. Chem. Phys. {\bf 121}, 12696 (2004)]. The reduced electronic dynamics is…

Channel coherence time has been widely regarded as a critical parameter in the design of mobile systems. However, a prominent challenge lies in integrating electromagnetic (EM) polarization effects into the derivation of the channel…