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We report the study of single dangling bonds (DB) on the hydrogen terminated silicon (100) surface using a low temperature scanning tunneling microscope (LT-STM). By investigating samples prepared with different annealing temperatures, we…

Dangling bonds (DBs) are common defects in silicon that affect its electronic performance by trapping carriers at the in-gap levels. For probing the electrical properties of individual DBs, a scanning tunneling microscope (STM) is an…

材料科学 · 物理学 2025-10-20 T. V. Pavlova , V. M. Shevlyuga

As the ultimate miniaturization of semiconductor devices approaches, it is imperative that the effects of single dopants be clarified. Beyond providing insight into functions and limitations of conventional devices, such information enables…

介观与纳米尺度物理 · 物理学 2016-10-27 Mohammad Rashidi , Jacob Burgess , Marco Taucer , Roshan Achal , Jason L. Pitters , Sebastian Loth , Robert A. Wolkow

The miniaturization of semiconductor devices to the scales where small numbers of dopants can control device properties requires the development of new techniques capable of characterizing their dynamics. Investigating single dopants…

Here we report the direct observation of single electron charging of a single atomic Dangling Bond (DB) on the H-Si(100) 2x1 surface. The tip of a scanning tunneling microscope is placed adjacent to the DB to serve as a single electron…

介观与纳米尺度物理 · 物理学 2015-06-15 Marco Taucer , Lucian Livadaru , Paul G. Piva , Roshan Achal , Hatem Labidi , Jason L. Pitters , Robert A. Wolkow

Nitrogen-vacancy (NV) centers in diamond are among the most promising solid-state qubit candidates, owing to their exceptionally long spin coherence times, efficient spin-photon coupling, room-temperature operation, and steadily advancing…

量子物理 · 物理学 2025-04-21 Arjun Raghavan , Seokjin Bae , Nazar Delegan , F. Joseph Heremans , Vidya Madhavan

Many new material systems are being explored to enable smaller, more capable and energy efficient devices. These bottom up approaches for atomic and molecular electronics, quantum computation, and data storage all rely on a well-developed…

材料科学 · 物理学 2020-02-11 Roshan Achal , Mohammad Rashidi , Jeremiah Croshaw , Taleana Huff , Robert A. Wolkow

The conductance-voltage spectrum of molecular nanostructures measured by scanning tunneling spectroscopy (STS) is generally assumed to reflect the local density of states of the molecule. This excludes the possibility of observing negative…

介观与纳米尺度物理 · 物理学 2009-10-31 Yongqiang Xue , Supriyo Datta , Seunghun Hong , R. Reifenberger , Jason I. Henderson , Cliff P. Kubiak

Negative differential resistance remains an attractive but elusive functionality, so far only finding niche applications. Atom scale entities have shown promising properties, but viability of device fabrication requires fuller understanding…

Understanding carrier trapping in solids has proven key to semiconductor technologies but observations thus far have relied on ensembles of point defects, where the impact of neighboring traps or carrier screening is often important. Here,…

介观与纳米尺度物理 · 物理学 2023-06-05 Artur Lozovoi , YunHeng Chen , Gyorgy Vizkelethy , Edward Bielejec , Johannes Flick , Marcus W. Doherty , Carlos A. Meriles

The ability to control single dopants in solid-state devices has opened the way towards reliable quantum computation schemes. In this perspective it is essential to understand the impact of interfaces and electric fields, inherent to…

介观与纳米尺度物理 · 物理学 2015-06-23 B. Voisin , J. Salfi , J. Bocquel , R. Rahman , S. Rogge

It is discovered that the zero-dimensional character of the silicon atom dangling bond (DB) state allows controlled formation and occupation of a new form of quantum dot assemblies. Whereas on highly doped n-type substrates isolated DBs are…

During fabrication and scanning-tunneling-microscope (STM) imaging of dangling bonds (DBs) on a hydrogenated silicon surface, we consistently observed halo-like features around isolated DBs for specific imaging conditions. These surround…

介观与纳米尺度物理 · 物理学 2015-03-19 Lucian Livadaru , Jason Pitters , Marco Taucer , Robert A. Wolkow

We show how to properly extract the local charge order in two-dimensional materials from scanning tunneling microscopy/spectroscopy (STM/STS) measurements. When the charge order presents spatial variations at the atomic scale inside the…

Paramagnetic point defects in silicon provide qubits that could open up pathways towards silicon-technology based, low-cost, room-temperature (RT) quantum sensing. The silicon dangling bond (db) is a natural candidate, given its…

介观与纳米尺度物理 · 物理学 2024-02-27 J. Möser , H. Popli , T. H. Tennahewa , T. Biktagirov , J. Behrends , W. Akhtar , H. Malissa , C. Boehme , W. G. Schmidt , U. Gerstmann , K. Lips

Intrinsic carrier transport properties of single-walled carbon nanotubes are probed by two parallel methods on the same individual tubes: the contactless dielectric force microscopy (DFM) technique and the conventional field-effect…

介观与纳米尺度物理 · 物理学 2015-02-11 Yize Stephanie Li , Jun Ge , Jinhua Cai , Jie Zhang , Wei Lu , Jia Liu , Liwei Chen

Controlling doping is essential for a successful integration of semiconductor materials into device technologies. However, the assessment of doping levels and the distribution of charge carriers in carbon nanotubes or other nanoscale…

Scanning Tunneling Spectroscopy (STS) is a unique technique to probe the local density of states (LDOS) at the atomic scale by measuring the tunneling conductance between a sharp tip and a sample surface. However, the technique suffers of…

The molecular dark state participates in many important photon-induced processes, yet is typically beyond the optical-spectroscopic measurement due to the forbidden transition dictated by the selection rule. In this work, we propose to use…

量子物理 · 物理学 2021-11-09 Guohui Dong , Zhubin Hu , Xiang Sun , Hui Dong

We report fast, simultaneous charge sensing and transport measurements of gate-defined carbon nanotube quantum dots. Aluminum radio frequency single electron transistors (rf-SETs) capacitively coupled to the nanotube dot provide…

介观与纳米尺度物理 · 物理学 2009-11-11 M. J. Biercuk , D. J. Reilly , T. M. Buehler , V. C. Chan , J. M. Chow , R. G. Clark , C. M. Marcus
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