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High resolution Atomic Force Microscopy (AFM) and Scanning Tunnelling Microscopy (STM) imaging with functionalized tips is well established, but a detailed understanding of the imaging mechanism is still missing. We present a numerical…

介观与纳米尺度物理 · 物理学 2014-08-27 Prokop Hapala , Georgy Kichin , Christian Wagner , F. Stefan Tautz , Ruslan Temirov , Pavel Jelinek

Scanning tunneling microscope (STM) is a powerful tool for studying the structural and electronic properties of materials at the atomic scale. The combination of low temperature and high magnetic field for STM and related spectroscopy…

We introduce a statistical correlation analysis method to obtain information on the local geometry and orientation of the tip used in scanning tunneling microscopy (STM) experiments based on large scale simulations. The key quantity is the…

材料科学 · 物理学 2015-03-17 Gábor Mándi , Gilberto Teobaldi , Krisztián Palotás

Scanning tunneling microscopes (STM) are used extensively for studying and manipulating matter at the atomic scale. In spite of the critical role of the STM tip, the control of the atomic-scale shape of STM tips remains a poorly solved…

介观与纳米尺度物理 · 物理学 2017-12-11 Sumit Tewari , Koen M. Bastiaans , Milan P. Allan , Jan M. van Ruitenbeek

Spin-polarized scanning tunneling microscopy (SP-STM) experiments on ultrathin films with non-collinear spin textures demonstrate that resonant tunneling allows for atomic-scale spin-sensitive imaging in real space at tip-sample distances…

应用物理 · 物理学 2020-03-30 Anika Schlenhoff , Stepan Kovarik , Stefan Krause , Roland Wiesendanger

A sparse modeling approach is proposed for analyzing scanning tunneling microscopy topography data, which contains numerous peaks corresponding to surface atoms. The method, based on the relevance vector machine with $\mathrm{L}_1$…

数据分析、统计与概率 · 物理学 2018-03-13 Masamichi J. Miyama , Koji Hukushima

The spin-polarized scanning tunnelling microscope (STM) can in principle resolve not only the electronic, but also the magnetic surface structure. We model recent STM measurements achieving magnetic resolution on the atomic scale by a…

材料科学 · 物理学 2009-11-07 W. A. Hofer , A. J. Fisher

Recently, the family of high-resolution scanning probe imaging techniques using decorated tips has been complimented by a method based on inelastic electron tunneling spectroscopy (IETS). The new technique resolves the inner structure of…

介观与纳米尺度物理 · 物理学 2014-12-03 Prokop Hapala , F. Stefan Tautz , Ruslan Temirov , Pavel Jelínek

A Scanning Tunneling Microscope (STM) is one of the most important scanning probe tools available to study and manipulate matter at the nanoscale. In a STM, a tip is scanned on top of a surface with a separation of a few \AA. Often, the…

We propose an atom-superposition-based method for simulating spin-polarized scanning tunneling microscopy (SP-STM) from first principles. Our approach provides bias dependent STM images in high spatial resolution, with the capability of…

材料科学 · 物理学 2011-11-28 Krisztián Palotás , Werner A. Hofer , László Szunyogh

Scanning tunnelling microscopy (STM) enables atomic-resolution imaging and atom manipulation, but its utility is often limited by tip degradation and slow serial data acquisition. Fabrication adds another layer of complexity since the tip…

计算机视觉与模式识别 · 计算机科学 2025-10-31 Nikola L. Kolev , Tommaso Rodani , Neil J. Curson , Taylor J. Z. Stock , Alberto Cazzaniga

A simple, reliable method for preparation of bulk Cr tips for Scanning Tunneling Microscopy (STM) is proposed and its potentialities in performing high-quality and high-resolution STM and Spin Polarized-STM (SP-STM) are investigated. Cr…

We extend the orbital-dependent electron tunneling model implemented within the three-dimensional (3D) Wentzel-Kramers-Brillouin (WKB) atom-superposition approach for simulating scanning tunneling microscopy (STM) by including arbitrary tip…

材料科学 · 物理学 2013-10-15 Gábor Mándi , Norbert Nagy , Krisztián Palotás

The Field Ion Microscope (FIM) can be used to characterize the atomic configuration of the apex of sharp tips. These tips are well suited for Scanning Probe Microscopy (SPM) since they predetermine SPM resolution and electronic structure…

介观与纳米尺度物理 · 物理学 2012-08-07 William Paul , Yoichi Miyahara , Peter Grütter

Here we show scanning tunnelling microscopy (STM), non-contact atomic force microscopy (AFM) and inelastic electron tunnelling spectroscopy (IETS) measurements on organic molecule with a CO- terminated tip at 5K. The high-resolution…

Scanning probe microscopy (SPM) images of regularly arranged spatially periodic objects can be processed crystallographically. The resulting information may be used to remove from the SPM image distortions that are due to a less than…

材料科学 · 物理学 2020-12-16 Peter Moeck

We describe a first principles method to calculate scanning tunneling microscopy (STM) images, and compare the results to well-characterized experiments combining STM with atomic force microscopy (AFM). The theory is based on density…

介观与纳米尺度物理 · 物理学 2018-09-14 Alexander Gustafsson , Norio Okabayashi , Angelo Peronio , Franz J. Giessibl , Magnus Paulsson

The plasmonic tip of a scanning tunnelling microscope (STM) is functionalized with a single fluorescent molecule and is scanned on a plasmonic substrate. The tunneling current flowing through the tip-molecule-substrate junction generates a…

Based on Bardeen's perturbative approach to tunneling, we have found an expression for the current between tip and sample, which can be efficiently coded in order to perform fast ab initio simulations of STM images. Under the observation…

材料科学 · 物理学 2007-05-23 Oscar Paz , Jose M. Soler

We consider a scanning tunneling microscope (STM) such that tunneling occurs through two atomically sharp protrusions on its tip. When the two protrusions are separated by at least several atomic spacings, the differential conductance of…

凝聚态物理 · 物理学 2009-10-28 Michael E. Flatte' , Jeff M. Byers
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