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Piezoresponse force microscopy (PFM) has been widely used for nanoscale analysis of piezoelectric properties and ferroelectric domains. Although PFM is useful because of its simple and nondestructive features, PFM measurements can be…

应用物理 · 物理学 2023-05-09 Jaegyu Kim , Seongwoo Cho , Jiwon Yeom , Seongmun Eom , Seungbum Hong

Piezoresponse Force Microscopy (PFM) is one of the most widespread methods for investigating and visualizing ferroelectric domain structures down to the nanometer length scale. PFM makes use of the direct coupling of the piezoelectric…

Piezoresponse Force Microscopy (PFM) has emerged as a primary tool for imaging, domain engineering, and switching spectroscopy on ferroelectric materials. Quantitative interpretation of PFM data including measurements of the intrinsic width…

材料科学 · 物理学 2007-05-23 Anna N. Morozovska , Svetlana L. Bravina , Eugene A. Eliseev , Sergei V. Kalinin

Piezoresponse force microscopy (PFM) is a powerful characterization technique to readily image and manipulate ferroelectrics domains. PFM gives insight into the strength of local piezoelectric coupling as well as polarization direction…

Piezoresponse Force Spectroscopy (PFS) has emerged as a powerful technique for probing highly localized switching behavior and the role of microstructure and defects on switching. The application of a dc bias to a scanning probe microscope…

A nanometric needle sensor mounted in an Atomic Force Microscopy allows systematic picometer-range distance measurements. This force sensing device is used in Piezoresponse Force Microscopy (PFM) as a distance sensor, by employing the…

材料科学 · 物理学 2017-12-01 A. Gomez , H. T. T Nong , S. Mercone , T. Puig , X. Obradors

Ferroelectric domain imaging with piezoresponse force microscopy (PFM) relies on the converse piezoelectric effect: a voltage applied to the sample leads to mechanical deformations. In case of PFM one electrode is realized by the tip,…

材料科学 · 物理学 2015-06-25 T. Jungk , A. Hoffmann , E. Soergel

Piezoresponse Force Spectroscopy (PFS) is a powerful method widely used for measuring the nanoscale ferroelectric responses of the materials. However, it is found that certain non-ferroelectric materials can also generate similar responses…

材料科学 · 物理学 2018-09-13 Yue Liu , Yao Sun , Wanheng Lu , Hongli Wang , Zhongting Wang , Bingxue Yu , Tao Li , Kaiyang Zeng

Piezoresponse force microscopy (PFM) is a powerful tool for probing nanometer-scale ferroelectric and piezoelectric properties. Hysteretic switching of the phase and amplitude of the PFM response are believed to be the hallmark of…

材料科学 · 物理学 2016-10-04 Shilpa Sanwlani , Mohammad Balal , Shubhra Jyotsna , Goutam Sheet

The contrast mechanism for ferroelectric domain imaging via piezoresponse force microscopy (PFM) is investigated. A novel analysis of PFM measurements is presented which takes into account the background caused by the experimental setup.…

材料科学 · 物理学 2016-08-31 T. Jungk , A. Hoffmann , E. Soergel

To achieve quantitative interpretation of Piezoresponse Force Microscopy (PFM), including resolution limits, tip bias- and strain-induced phenomena and spectroscopy, analytical representations for tip-induced electroelastic fields inside…

材料科学 · 物理学 2009-11-10 Sergei V. Kalinin , Edgar Karapetian , Mark Kachanov

The rapid development of nanoscience and nanotechnology in the last two decades was stimulated by the emergence of scanning probe microscopy (SPM) techniques capable of accessing local material properties, including transport, mechanical,…

Piezoresponse Force Microscopy (PFM), as a powerful nanoscale characterization technique, has been extensively utilized to elucidate diverse underlying physics of ferroelectricity. However, the intensive study of conventional PFM has…

应用物理 · 物理学 2021-02-16 Qibin Zeng , Hongli Wang , Qicheng Huang , Zhen Fan , Kaiyang Zeng

At first sight piezoresponse force microscopy (PFM) seems an ideal technique for the determination of piezoelectric coefficients (PCs), thus making use of its ultra-high vertical resolution (<0.1 pm/V). Christman et al. \cite{Chr98} first…

材料科学 · 物理学 2009-11-13 T. Jungk , A. Hoffmann. , E. Soergel

Piezoresponse force microscopy (PFM) has been used extensively for exploring nanoscale ferro/piezoelectric phenomena over the past two decades. The imaging mechanism of PFM is based on the detection of the electromechanical (EM) response…

材料科学 · 物理学 2017-04-04 Daehee Seol , Bora Kim , Yunseok Kim

The interpretation of ferroelectric domain images obtained with piezoresponse force microscopy (PFM) is discussed. The influences of an inherent experimental background on the domain contrast in PFM images (enhancement, nulling, inversion)…

材料科学 · 物理学 2007-08-08 T. Jungk , A. Hoffmann , E. Soergel

Piezoresponse force microscopy (PFM) is a powerful tool widely used to characterize piezoelectricity and ferroelectricity at the nanoscale. However, it is necessary to distinguish microscopic mechanisms between piezoelectricity and…

Coupling between electrical and mechanical phenomena is a near-universal characteristic of inorganic and biological systems alike, with examples ranging from ferroelectric perovskites to electromotor proteins in cellular membranes.…

材料科学 · 物理学 2016-11-15 Sergei V. Kalinin , Andrei Rar , Stephen Jesse

Piezoelectric semiconductor III-Nitride nanostructures have received increasing interest as an alternative material for energy harvesters, sensors, and self-sustainable electronics, demanding well-clarification of their piezoelectric…

材料科学 · 物理学 2020-12-08 L. Jaloustre , S. Le-Denmat , T. Auzelle , M. Azadmand , L. Geelhaar , F. Dahlem , R. Songmuang

The structure of a single antiparallel ferroelectric domain wall in LiNbO3 is quantitatively mapped by piezoelectric force microscopy (PFM) with calibrated probe geometry. The PFM measurements are performed for 49 probes with the radius…

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