相关论文: Characterization of multilayer stack parameters fr…

Efficient characterization of surface compositions across high-dimensional materials spaces is critical for accelerating the discovery of surface-dominated functional materials. While X-ray photoelectron spectroscopy allows detailed surface…

Consistent inference of the electron density and temperature has been carried out with multiple heterogeneous plasma diagnostic data sets at Wendelstein 7-X. The predictive models of the interferometer, Thomson scattering and helium beam…

Optical spectroscopy is indispensable for research and development in nanoscience and nanotechnology, microelectronics, energy, and advanced manufacturing. Advanced optical spectroscopy tools often require both specifically designed…

Structural coloration is commonly modeled using wave optics for reliable and photorealistic rendering of natural, quasi-periodic and complex nanostructures. Such models often rely on dense, preliminary or preprocessed data to accurately…

Deep classifiers are known to rely on spurious features $\unicode{x2013}$ patterns which are correlated with the target on the training data but not inherently relevant to the learning problem, such as the image backgrounds when classifying…

We consider different approaches to simulate a modern X-ray beamline. Several methodologies with increasing complexity are applied to discuss the relevant parameters that quantify the beamline performance. Parameters such as flux,…

Scanning electron microscopy (SEM) is indispensable in diverse applications ranging from microelectronics to food processing because it provides large depth-of-field images with a resolution beyond the optical diffraction limit. However,…

Polarized neutron reflectometry (PNR) have developed theoretically and experimentally in the past decades. In order to resolve the phase problem in neutron reflectometry, several simulation methods have been proposed such as reference layer…

Advances in vectorial polarisation-resolved imaging are bringing new capabilities to applications ranging from fundamental physics through to clinical diagnosis. Imaging polarimetry requires determination of the Mueller matrix (MM) at every…

The progression of X-ray technology introduces diverse image styles that need to be adapted to the preferences of radiologists. To support this task, we introduce a novel deep learning-based metric that quantifies style differences of…

Here a new microscopic method is proposed to image and characterize very thin samples like few-layer materials, organic molecules, and nanostructures with nanometer or sub-nanometer resolution using electron beams of energies lower than 20…

The paper presents an innovative methodology based on the use of a new predictive algorithm created by the researchers capable of obtaining the elastic modulus of a plastic material manufactured with MEX and its mechanical behaviour in the…

Parameter-efficient fine-tuning (PEFT) techniques, such as adapter tuning, aim to fine-tune a pre-trained language model (PLM) using a minimal number of parameters for a specific task or profile. Although adapter tuning provides increased…

Given that the physical properties of polymeric liquids extend on a wide range of lengthscales, it is computationally convenient to represent them by coarse-grained (CG) descriptions at various granularities to investigate local and global…

Nickel carbon based multi-layers are a viable route towards future hard X-ray and soft $\gamma$-ray focusing telescopes. Here, we study the Pulsed Laser Deposition growth conditions of such bilayers by Reflective High Energy Electron…

Extending our prior work, we propose a multi-energy X-ray measurement model incorporating material variability with energy correlations to enable the analysis and exploration of the performance of X-ray imaging and sensing systems. Based on…

Adapting Vision Language Segmentation Models (VLSMs) to medical imaging domains requires significant computational overhead when using conventional fine-tuning approaches. Existing Parameter-Efficient Fine-Tuning (PEFT) methods apply…

Using polarization measurements in remote sensing and optical studies allows retrieving more information. We consider relationship between the reflection coefficients of plane and rough surfaces for linearly polarized waves. Certain…

Thin planar pixel modules are promising candidates to instrument the inner layers of the new ATLAS pixel detector for HL-LHC, thanks to the reduced contribution to the material budget and their high charge collection efficiency after…

Field-of-view and resolution trade-offs in X-Ray micro-computed tomography (micro-CT) imaging limit the characterization, analysis and model development of multi-scale porous systems. To this end, we developed an applied methodology…