相关论文: Characterization of multilayer stack parameters fr…
X-ray photoelectron spectroscopy (XPS) is among the most widely used methods for surface characterization. Currently, the analysis of XPS data is almost exclusively based on the main emission peak of a given element and the rest of the…
Sculptured copper thin films were deposited on glass substrates, using different deposition rates. The nano-structure and morphology of the films were obtained, using X-ray diffraction (XRD), atomic force microscopy (AFM) and scanning…
The Multi-Layer Thin Films Problem is a materials science problem that aims to enhance the reflectance of a metallic substrate by designing multi-layer coatings composed of different dielectric materials and thicknesses. While previous…
To reduce operation-and-maintenance expenses (OPEX) and to ensure optical network survivability, optical network operators need to detect and diagnose faults in a timely manner and with high accuracy. With the rapid advancement of telemetry…
Segmentation and analysis of individual pores and grains of mudrocks from scanning electron microscope images is non-trivial because of noise, imaging artifacts, variation in pixel grayscale values across images, and overlaps in grayscale…
Handling various objects with different colors is a significant challenge for image colorization techniques. Thus, for complex real-world scenes, the existing image colorization algorithms often fail to maintain color consistency. In this…
Near total reflection regime has been widely used in X-ray science, specifically in grazing incidence small angle X-ray scattering and in hard X-ray photoelectron spectroscopy. In this work, we introduce some practical aspects of using near…
Vision-Language Models (VLMs) have demonstrated impressive performance on various visual tasks, yet they still require adaptation on downstream tasks to achieve optimal performance. Recently, various adaptation technologies have been…
Scanning transmission electron microscopy (STEM) has advanced rapidly in the last decade thanks to the ability to correct the major aberrations of the probe forming lens. Now atomic-sized beams are routine, even at accelerating voltages as…
Scanning transmission electron microscopy (STEM) has become a cornerstone instrument for semiconductor materials metrology, enabling nanoscale analysis of complex multilayer structures that define device performance. Developing effective…
Four-dimensional scanning transmission electron microscopy (4D-STEM) provides rich, atomic-scale insights into materials structures. However, extracting specific physical properties - such as polarization directions essential for…
Continuous and global detection of large methane emissions is a crucial step for global warming mitigation. Satellite observations, such as from S5P/TROPOMI, combined with plume detection algorithms, can play a key role in this effort.…
Dislocations control the mechanical behavior of crystalline materials, yet their quantitative characterization in bulk has remained elusive. Transmission Electron Microscopy provides atomic-scale resolution but is restricted to thin foils,…
Metasurfaces based on gap surface-plasmon resonators allow one to arbitrarily control the phase, amplitude and polarization of reflected light with high efficiency. However, the performance of densely-packed metasurfaces is reduced, often…
We describe in this paper a new, public software for accurate "PSF-matched" multiband photometry for images of different resolution and depth, that we have named ConvPhot, of which we analyse performances and limitations. It is designed to…
Underwater image enhancement has become an attractive topic as a significant technology in marine engineering and aquatic robotics. However, the limited number of datasets and imperfect hand-crafted ground truth weaken its robustness to…
Neural surface reconstruction methods typically treat camera poses as fixed values, assuming perfect accuracy from Structure-from-Motion (SfM) systems. This assumption breaks down with imperfect pose estimates, leading to distorted or…
The construction of low mass vertex detectors with a high level of system integration is of great interest for next generation collider experiments. Radiation length images with a sufficient spatial resolution can be used to measure and…
X-ray photoelectron diffraction (XPD) has developed into a powerful technique for the structural analysis of solids. Extension of the technique into the hard-X-ray range (hXPD) gives access to true bulk information. Here we give a status…
A standard quarter-wavelength multilayer optical coating will produce the highest reflectivity for a given number of coating layers, but in general it will not yield the lowest thermal noise for a prescribed reflectivity. Coatings with the…