相关论文: Characterization of multilayer stack parameters fr…
The detection of spatial or temporal variations in very thin samples has important applications in the biological sciences. For example, cellular membranes exhibit changes in lipid composition and order, which in turn modulate their…
We describe measurements of the X-ray reflectance in the range 2 to 10 keV of samples representative of coated silicon wafers that are proposed for the fabrication of the XEUS (X-ray Evolving Universe Spectrometer) mission. We compare the…
As properties of mono- to few layers of exfoliated van der Waals heterostructures are heavily dependent on their thicknesses, accurate thickness measurement becomes imperative in their study. Commonly used atomic force microscopy and Raman…
In this article, a general model for 1D thermal wave interference is derived for multi-layered coating systems on a thermally thick substrate using the same principles as for the well established one-layered and two-layered coating cases.…
Material recognition methods use image context and local cues for pixel-wise classification. In many cases only a single image is available to make a material prediction. Image sequences, routinely acquired in applications such as mutliview…
In this contribution, cylindrical samples consisting of monodisperse soft (rubber) and stiff (glass) particles are pre-stressed under uniaxial compression. Acoustic P-waves at ultrasound frequencies are superimposed into prepared samples…
Residual stress and plastic strain in additive manufactured materials can exhibit significant microscopic variation at the powder scale, profoundly influencing the overall properties of printed components. This variation depends on…
We present a non-destructive, spatially resolved thickness characterization method for rhombohedral (3R) molybdenum disulfide (MoS$_2$) on polydimethylsiloxane (PDMS) substrates. Unlike broadband spectroscopic approaches, the proposed…
GRS 1915+105 has been in a bright flux state for more than 2 decades, but in 2018 a significant drop in flux was observed, partly due to changes in the central engine along with increased X-ray absorption. The aim of this work is to explore…
Many Multi-View-Stereo algorithms extract a 3D mesh model of a scene, after fusing depth maps into a volumetric representation of the space. Due to the limited scalability of such representations, the estimated model does not capture fine…
Two-dimensional (2D) layered materials have been extensively studied owing to their fascinating and technologically relevant properties. Their functionalities can be often tailored by the interlayer stacking pattern. Low-frequency (LF)…
Optical multilayer thin-films are fundamental components that enable the precise control of reflectance, transmittance, and phase shift in the design of photonic systems. Rapid and accessible simulation of these structures holds critical…
X-ray fluorescence spectroscopy (XRF) plays an important role for elemental analysis in a wide range of scientific fields, especially in cultural heritage. XRF imaging, which uses a raster scan to acquire spectra across artworks, provides…
Characterizing the intensity, phase, and polarization of engineered light is fundamental to understanding and applying metasurfaces. However, existing characterization frameworks are hindered by several limitations, most notably their…
We report on the development of a large-volume, wide field-of-view time projection chamber (TPC) for X-ray polarimetry, featuring a triple-GEM amplification stage and optical readout. Originally developed within the CYGNO program for…
The new generation of X-ray polarisation detectors, gas pixel detectors, which will be employed by the future space missions IXPE and eXTP, allows for spatially resolved X-ray polarisation studies. This will be of particular interest for…
We propose PRM, a novel photometric stereo based large reconstruction model to reconstruct high-quality meshes with fine-grained local details. Unlike previous large reconstruction models that prepare images under fixed and simple lighting…
We test the reproducibility of X-ray reflectometry(XRR) measurements and optimizations using an National Metrology Institute of Japan (NMIJ)/National Institute of Advanced Industrial Science and Technology (AIST) pre-standard. Based on…
We are developing instrumentation for a telescope design capable of measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics. Multilayer-coated mirrors are key to this approach, being used as Bragg…
For reconstruction of the spatial structure of many-component objects, it is proposed to use multi-radiography with detection of X-ray by combined detector arrays using detectors of ``scintillator-photodiode'' type. A theoretical model has…