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Atomic force microscopy using a magnetic tip is a promising tool for investigating conductivity on the nano-scale. By the oscillating magnetic tip eddy currents are induced in the conducting parts of the sample which can be detected in the…

原子物理 · 物理学 2009-11-13 Tino Roll , Marion Meier , Ulrich Fischer , Marika Schleberger

The atomic force microscope (AFM) is a versatile, high-resolution tool used to characterize the topography and material properties of a large variety of specimens at nano-scale. The interaction of the micro-cantilever tip with the specimen…

材料科学 · 物理学 2011-09-05 David Busch , Qingze Zou , Baskar Ganapathysubramanian

A nanoscopy technique that can characterize light-matter interactions with ever increasing spatial resolution and signal-to-noise ratio (SNR) is desired for spectroscopy at molecular levels. Photoinduced force microscopy (PiFM) with…

应用物理 · 物理学 2018-10-17 Mohsen Rajaei , Mohammad Ali Almajhadi , Jinwei Zeng , H. Kumar Wickramasinghe

Tip enhanced IR spectra and imaging have been widely used in cutting-edge studies for the in-depth understanding of the composition, structure and function of interfaces at the nanoscale. However, molecular monolayer sensitivity has only…

Magnetic force microscopy (MFM) allows detection of stray magnetic fields around magnetic materials and the two-dimensional visualization of these fields. This paper presents a theoretical analysis of the oscillations of an MFM tip above a…

应用物理 · 物理学 2018-12-31 Fujio Wakaya , Kenta Oosawa , Masahiro Kajiwara , Satoshi Abo , Mikio Takai

In order to confirm the strong Van der Waals force in the nucleon-nucleon interaction, it is proposed to measure precisely the angular distribution of the cross section of the low energy ($T_{lab}=20 \sim 30MeV.$) proton-proton scattering.…

高能物理 - 唯象学 · 物理学 2007-05-23 Tetsuo Sawada

In scanning gate microscopy, where the tip of a scanning force microscope is used as a movable gate to study electronic transport in nanostructures, the shape and magnitude of the tip-induced potential are important for the resolution and…

介观与纳米尺度物理 · 物理学 2009-11-13 A. E. Gildemeister , T. Ihn , M. Sigrist , K. Ensslin , D. C. Driscoll , A. C. Gossard

We present a new approach to tuning fork-based atomic force microscopy for utilizing advanced "tip-on-chip" probes with high sensitivity and broad compatibility. Usually, such chip-like probes with a size reaching 2 mm x 2 mm drastically…

Electron paramagnetic resonance (EPR) performed with a scanning tunneling microscope (STM) allows for probing the spin excitation of single atomic species with MHz energy resolution. One of the basic applications of conventional EPR is the…

介观与纳米尺度物理 · 物理学 2021-11-10 Tom S. Seifert , Stepan Kovarik , Pietro Gambardella , Sebastian Stepanow

The optical transmission and reflection in between two metalized optical fiber tips is studied in the optical near-field and far-field domains. Besides aluminum-coated tips for near-field scanning optical microscopy (NSOM), specifically…

Magnetic force microscopy (MFM) measurements generally provide phase images which represent the signature of domain structures on the surface of nanomaterials. To quantitatively determine magnetic stray fields based on an MFM image requires…

数据分析、统计与概率 · 物理学 2020-02-20 Xiukun Hu , Gaoliang Dai , Sibylle Sievers , Alexander Fernández Scarioni , Volker Neu , Mark Bieler , Hans Werner Schumacher

Enabling dexterous manipulation and safe human-robot interaction, soft robots are widely used in numerous surgical applications. One of the complications associated with using soft robots in surgical applications is reconstructing their…

机器人学 · 计算机科学 2023-04-26 Amirhosein Alian , George Mylonas , James Avery

Tip functionalization in AFM allows imaging organic nano-structures with sub-molecular resolution. Here, recent progress by using atomically defined copper-oxide tips is discussed. With their outstanding rigidity and elemental selectivity…

材料科学 · 物理学 2025-10-22 Harry Mönig

We present polynomial force reconstruction from experimental intermodulation atomic force microscopy (ImAFM) data. We study the tip-surface force during a slow surface approach and compare the results with amplitude-dependence force…

介观与纳米尺度物理 · 物理学 2013-02-08 Daniel Platz , Daniel Forchheimer , Erik A. Tholen , David B. Haviland

In the Tapping mode, a variation of the oscillation amplitude and phase as a function of the tip sample distance is the necessary measurement to access quantitatively to the properties of the surface. In the present work, we give a…

原子与分子团簇 · 物理学 2016-08-16 Jean-Pierre Aimé , Rodolphe Boisgard , Laurent Nony , Gérard Couturier

We analyse how a probing particle modifies infrared electromagnetic near fields. The particle, assimilated to both electric and magnetic dipoles, represents the tip of an apertureless scanning optical near-field microscope (SNOM). We show…

Atomic force microscopy (AFM) has been constantly supporting nanosciences and nanotechnologies for over 30 years, being present in many fields from condensed matter physics to biology. It enables measuring very weak forces at the nanoscale,…

仪器与探测器 · 物理学 2021-09-07 L Schwab , P Allain , N Mauran , X Dollat , L Mazenq , D Lagrange , M Gély , S Hentz , G Jourdan , I Favero , B Legrand

The oscillating magnetic field produced by unbalanced currents in radio-frequency ion traps induces transition frequency shifts and sideband transitions that can be harmful to precision spectroscopy experiments. Here, we describe a…

The dynamic characteristics of a tip oscillating in the nc-AFM mode in close vicinity to a Cu(100)-surface are investigated by means of phase variation experiments in the constant amplitude mode. The change of the quality factor upon…

原子与分子团簇 · 物理学 2007-05-23 Oliver Pfeiffer , Laurent Nony , Roland Bennewitz , Alexis Baratoff , Ernst Meyer

We use a 1.0-um-wide patterned Cu wire with an integrated nanomagnetic tip to measure the statistical nuclear polarization of 19F in CaF2 by magnetic resonance force microscopy (MRFM). With less than 350 uW of dissipated power, we achieve…

其他凝聚态物理 · 物理学 2007-06-27 M. Poggio , C. L. Degen , C. T. Rettner , H. J. Mamin , D. Rugar