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We present first-principles total-energy electronic-structure calculations that provide the microscopic mechanism of the Ag atom diffusion between the half unit cells (HUCs) on the Si(111)-(7x7) surface with and without the tip of the…

材料科学 · 物理学 2017-02-08 Batnyam Enkhtaivan , Atsushi Oshiyama

We describe a first principles method to calculate scanning tunneling microscopy (STM) images, and compare the results to well-characterized experiments combining STM with atomic force microscopy (AFM). The theory is based on density…

介观与纳米尺度物理 · 物理学 2018-09-14 Alexander Gustafsson , Norio Okabayashi , Angelo Peronio , Franz J. Giessibl , Magnus Paulsson

In this work we have used focused electron beam induced deposition of cobalt to functionalize atomic force microscopy Akiyama tips for application in magnetic force microscopy. The grown tips have a content of 90% Co after exposure to…

介观与纳米尺度物理 · 物理学 2017-09-19 Markus Stiller , Jose Barzola-Quiquia , Pablo D. Esquinazi , Soraya Sangiao , Jose M. De Teresa , Jan Meijer , Bernd Abel

We report theoretical results predicting the atomic manipulation of a silver atom on a Si(001) surface by a scanning probe tip, and providing insight into the manipulation phenomena. A molecular mechanics technique has been used, the system…

材料科学 · 物理学 2009-09-29 Laurent Pizzagalli , Alexis Baratoff

The noncontact (van der Waals) friction is an interesting physical effect which has been the subject of controversial scientific discussion. The "direct" friction term due to the thermal fluctuations of the electromagnetic field leads to a…

量子物理 · 物理学 2016-10-13 U. D. Jentschura , M. Janke , M. DeKieviet

We present conductance measurements of a ballistic circular stadium influenced by a scanning gate. When the tip depletes the electron gas below, we observe very pronounced and regular fringes covering the entire stadium. The fringes…

介观与纳米尺度物理 · 物理学 2016-10-31 A. A. Kozikov , R. Steinacher , C. Rössler , T. Ihn , K. Ensslin , C. Reichl , W. Wegscheider

In atomic force microscopy (AFM), the angle relative to the vertical ($\theta_{i}$) that the tip apex of a cantilever moves is determined by the tilt of the probe holder and the geometries of the cantilever and actuated eigenmode $i$. Even…

介观与纳米尺度物理 · 物理学 2017-08-01 Joseph L. Garrett , Lisa J. Krayer , Kevin J. Palm , Jeremy N. Munday

Direct time-varying tip-sample force measurements by torsional harmonic cantilevers facilitate detailed investigations of the cantilever dynamics in tapping-mode atomic force microscopy. Here we report experimental evidence that the…

仪器与探测器 · 物理学 2008-11-26 Ozgur Sahin

It has been shown that electron transitions, as measured in a scanning tunnelling microscope (STM), are related to chemical interactions in a tunnelling barrier. Here, we show that the shape and apparent height of subatomic features in an…

材料科学 · 物理学 2009-11-11 Linda Zotti , Werner A. Hofer , Franz J. Giessibl

The aim of this article is to provide a complete analysis of the behavior of a noncontact atomic force microscope (NC-AFM). We start with a review of the equations of motion of a tip interacting with a surface in which the stability…

原子与分子团簇 · 物理学 2016-08-16 Gérard Couturier , Rodolphe Boisgard , Laurent Nony , Jean-Pierre Aimé

Atomic Force Microscopy - Infrared (AFM-IR) has emerged as a useful technique for measuring absorption spectra with spatial resolution better than the optical diffraction limit. The technique relies on the movement of a probe for atomic…

应用物理 · 物理学 2024-01-17 Luca Quaroni

We present a theoretical study of the measurements of photoinduced force microscopy (PiFM) for composite molecular systems. Using the discrete dipole approximation, we calculate the self-consistent response electric field of the entire…

We perform detailed numerical simulations of field ion microscopy images of faceted crystals and compare them with experimental observations. In contrast to the case of crystals with a smooth surface, for a faceted topography we find…

介观与纳米尺度物理 · 物理学 2009-09-17 Daniel Niewieczerzal , Czeslaw Oleksy , Andrzej Szczepkowicz

While the fundamental limit on the resolution achieved in an atomic force microscope (AFM) is clearly related to the tip radius, the fact that the tip can creep and/or wear during an experiment is often ignored. This is mainly due to the…

介观与纳米尺度物理 · 物理学 2015-06-12 Sergio Santos , Victor Barcons , Josep Font , Neil H Thomson

A numerical analysis of the origin of the atomic-scale contrast in Kelvin probe force microscopy (KPFM) is presented. Atomistic simulations of the tip-sample interaction force field have been combined with a non-contact Atomic Force…

原子与分子团簇 · 物理学 2009-07-24 Laurent Nony , Adam S. Foster , Franck Bocquet , Christian Loppacher

Small, controllable, highly accessible quantum systems can serve as probes at the single quantum level to study multiple physical effects, for example in quantum optics or for electric and magnetic field sensing. The applicability of…

Multi-tip scanning tunneling microscopy (STM) is a powerful method to perform charge transport measurements at the nanoscale. With four STM tips positioned on the surface of a sample, four-point resistance measurements can be performed in…

介观与纳米尺度物理 · 物理学 2022-01-28 A. Leis , V. Cherepanov , B. Voigtländer , F. S. Tautz

A statistical analysis of interstellar He+ pickup ion measurements from SOHO/CTOF combined with magnetic field data from WIND/MFI enable quantitative study of wave-particle interactions in the inner heliosphere for the first time. Magnetic…

天体物理学 · 物理学 2007-05-23 L. Saul , E. Moebius , C. W. Smith , P. Bochsler , H. Gruenwaldt , B. Klecker , F. Ipavich

Experiments with electron or ion matter waves require a coherent, monochromatic and long-term stable source with high brightness. These requirements are best fulfilled by single atom tip (SAT) field emitters. The performance of an iridium…