相关论文: Calibration of oscillation amplitude in Dynamic Sc…

Dynamic phase microscopy has been applied for measurements of nanometer-scale displacements of a piezoelectric scanner. This scanner, which was designed for calibration purposes for scanning probe microscopy and TEM, exhibited a linear and…

A high-accuracy calibration of inductive coil sensors based on Printed Circuit Board (PCB), commonly used in rotating coil field measurements of particle accelerator magnets, is presented. The amplitude and phase of signals with and without…

The extensive research and development of micromechanical resonators is trying to allow the use of these devices for highly sensitive applications. Microcantilevers are some of the simplest MEMS structure and had been proved to be a good…

We demonstrate a microfabricated optomechanical accelerometer that is capable of percent-level accuracy without external calibration. To achieve this capability, we use a mechanical model of the device behavior that can be characterized by…

Sensitive transduction of the motion of a microscale cantilever is central to many applications in mass, force, magnetic resonance, and displacement sensing. Reducing cantilever size to nanoscale dimensions can improve the bandwidth and…

The radiation-pressure driven interaction of a coherent light field with a mechanical oscillator induces correlations between the amplitude and phase quadratures of the light. These correlations result in squeezed light -- light with…

Atomic Force Microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity…

A scanning force microscope was implemented operating at temperatures below 4.2K and in magnetic fields up to 8T. Piezoelectric quartz tuning forks were employed for non optical tip-sample distance control in the dynamic operation mode.…

We present an innovative technique which allows the simultaneous measurement of the dielectric constant of a material at many frequencies, spanning a four orders of magnitude range chosen between 10 --2 Hz and 10 4 Hz. The sensitivity and…

In this study, we investigated the dynamics of a droplet impacting and oscillating a polycarbonate cantilever beam of nine varying lengths. We analyzed the cantilever's damping and vibration frequency in relation to a resonance length,…

We investigate the dynamics of mechanical resonators subject to excitations comprising of an oscillating or harmonic part, whose amplitude decays exponentially in time. We call these complex frequency excitations and show that the resulting…

Based on the observation that application phases exhibit varying degrees of sensitivity to noise (i.e., accuracy loss) in computation during execution, this paper explores how Dynamic Precision Scaling (DPS) can maximize power efficiency by…

Balancing high sensitivity with a broad dynamic range is a fundamental challenge in measurement science, as improving one often compromises the other. While traditional quantum metrology has prioritized enhancing local sensitivity, a large…

We study in detail the recent suggestions by Tshiprut et al. [Phys. Rev. Lett. 95, 016101 (2005)] to tune tribological properties at the nanoscale by subjecting a substrate to periodic mechanical oscillations. We show that both in…

This paper is a theoretical and a numerical investigation of the stability of a tip-cantilever system used in noncontact atomic force microscopy (NC-AFM) when it oscillates close to a surface. No additional dissipative force is considered.…

Scanning Thermal Microscopy (SThM) is a scanning probe technique aimed at quantitative characterization of local thermal properties at the length scale down to tens of nanometers. With many probe designs and approaches to interpretation of…

Optical tweezers find applications in various fields, ranging from biology to physics. One of the fundamental steps necessary to perform quantitative measurements using trapped particles is the calibration of the tweezer's spring constant.…

Reliable operation of frequency modulation mode atomic force microscopy (FM-AFM) depends on a clean resonance of an AFM cantilever. It is recognized that the spurious mechanical resonances which originate from various mechanical components…

We describe a method for feedback-regulation of a microcantilever's response using optical radiation pressure. One laser measures the position of the cantilever and another laser applies a force that is a phase-shifted function of that…

An experimental arrangement and a set of experiments are developed to generate empirical evidence of the effect of noise on a rotating, macro-scale cantilever structure. The experiment is a controlled representation of a rotating machinery…