相关论文: Calibration of oscillation amplitude in Dynamic Sc…
Amplitude-modulation atomic force microscopy (AM-AFM) measures nanoscale surface structures by detecting changes in the cantilever oscillation amplitude, contributing to materials research. AM-AFM can non-destructively observe fragile…
Friction measurements in the range of several meters per second are still of great interests. With the atomic force microscopy (AFM), the oscilaltion situation of the quartz crystal resonators of 3MHz resonance frequency are studied. And…
Atomic force microscopy (AFM) is a powerful tool to investigate interaction forces at the micro and nanoscale. Cantilever stiffness, dimensions and geometry of the tip can be chosen according to the requirements of the specific application,…
We present a simple theoretical framework to describe the thermal noise of a microscopic mechanical beam in a viscous fluid: we use the Sader approach to describe the effect of the surrounding fluid (added mass and viscous drag), and the…
A room-temperature mechanical oscillator undergoes thermal Brownian motion with an amplitude much larger than the amplitude associated with a single phonon of excitation. This motion can be read out and manipulated using laser light using a…
We present a way of measuring with high precision the anharmonicity of a quantum oscillator coupled to an optical field via radiation pressure. Our protocol uses a sequence of pulsed interactions to perform a loop in the phase space of the…
In multifrequency atomic force microscopy higher eigenmodes are externally excited to enhance resolution and contrast while simultaneously increasing the number of experimental observables with the use of gentle forces. Here, the…
Optically levitated nanoparticles offer enormous potential for precision sensing. However, as for any other metrology device, the absolute measurement performance of a levitated-particle sensor is limited by the accuracy of the calibration…
A flexible apparatus for calibration of the absolute flux at the focal plane of the X-ray Source of a Powder Diffractometer, based on a fast scintillator counter, is presented. The measured fluxes, depending on the high voltage on the X-ray…
This work is a theoretical investigation of the stability of the non-linear behavior of an oscillating tip-cantilever system used in dynamic force microscopy. Stability criterions are derived that may help to a better understanding of the…
In atomic force microscopy (AFM), the exchange and alignment of the AFM cantilever with respect to the optical beam and position-sensitive detector (PSD) are often performed manually. This process is tedious and time-consuming and sometimes…
Optical tweezers are highly versatile laser traps for neutral microparticles, with fundamental applications in physics and in single molecule cell biology. Force measurements are performed by converting the stiffness response to…
Squeezing the quadrature noise of a harmonic oscillator used as a sensor can enhance its sensitivity in certain measurment schemes. The canonical approach, based on parametric modulation of the oscillation frequency, is usually limited to a…
A dual-excitation method for resonant-frequency tracking in scanning probe microscopy based on amplitude detection is developed. This method allows the cantilever to be operated at or near resonance for techniques where standard phase…
Precise extraction of sinusoidal vibration parameters is essential for the dynamic calibration of vibration sensors, such as accelerometers. However, several standard methods have not yet been optimized for large background noise. In this…
Cross-spectrum analysis is a commonly-used technique for the detection of phase and amplitude noise of a signal in the presence of interfering noise. It extracts the desired correlated noise from two time series in the presence of…
We present a versatile and highly configurable scanning acoustic platform. This platform, comprising of a high frequency transducer, bespoke positioning system and temperature-regulated sample unit, enables the acoustic probing of materials…
Higher harmonic modes in nanoscale silicon cantilevers and microscale quartz tuning forks are detected and characterized using a custom scanning optical homodyne interferometer. Capable of both mass and force sensing, these resonators…
Optical tactile sensors provide robots with rich force information for robot grasping in unstructured environments. The fast and accurate calibration of three-dimensional contact forces holds significance for new sensors and existing…
This paper presents an analytical formulation for correcting the diffraction associated to the second harmonic of an acoustic wave, more compact than that usually used. This new formulation, resulting from an approximation of the correction…