相关论文: Calibration of oscillation amplitude in Dynamic Sc…

We discuss the Brownian thermal noise which affects the cantilever dynamics of a dAFM (dynamic atomic force microscope), both when it works in air and in presence of water. Our scope is to accurately describe the cantilever dynamics, and to…

Virtually all commercial instruments for the measurement of the oscillator PM noise make use of the Cross Spectrum method (arXiv:1004.5539 [physics.ins-det], 2010). High sensitivity is achieved by correlation and averaging on two equal…

Here we obtain analytical expressions for the frequency response of a cantilever beam in the presence of ambient fluid. The advantage of our approach, besides its simplicity of use, is that it explicitly contains the viscosity and the…

Determining sensor parameters is a prerequisite for quantitative force measurement. Here we report a direct, high-precision calibration method for quartz tuning fork(TF) sensors that are popular in the feld of nanomechanical measurement. In…

We present a method of broadening the dynamic range of optical interferometric detection of cantilever displacement. The key idea of this system is to use a wavelength-tunable laser source. The wavelength is subject to proportional-integral…

We study the mechanical fluctuations of a micrometer sized silicon cantilever subjected to a strong heat flow, thus having a highly non-uniform local temperature. In this non-equilibrium steady state, we show that fluctuations are…

An interferometric method is implemented in order to accurately assess the thermal fluctuations of a micro-cantilever sensor in liquid environments. The power spectrum density (PSD) of thermal fluctuations together with Sader's model of the…

Optical beam deflection is a popular method to measure the deformation of micromechanical devices. As it measures mostly a local slope, its sensitivity depends on the location and size of the optical spot. We present a method to evaluate…

Optical tweezers and AFM cantilevers are often calibrated by fitting their experimental powerspectra of Brownian motion. We demonstrate here that if this is done with typical weighted least-squares methods the result is a bias of relative…

Electrostatic force microscopy at cryogenic temperatures is used to probe the electrostatic interaction of a conductive atomic force microscopy tip and electronic charges trapped in localized states in an insulating layer on a…

We experimentally surpass the 3dB limit to steady state parametric squeezing of a mechanical oscillator. The localization of a AFM cantilever, achieved by optimal estimation, is enhanced by up to 6.2 dB in one position quadrature when a…

Non-invasive thermal noise calibration of both torsional and flexural eigenmodes is performed on numerous cantilevers of 10 different types. We show that for all tipless and short-tipped cantilevers, the ratio of torsional to flexural mode…

We consider an oscillator model to describe qualitatively friction force for an atomic force mi-croscope (AFM) tip driven on a surface described by periodic potential. It is shown that average value of the friction force could be controlled…

We consider the process of spin relaxation in the oscillating cantilever-driven adiabatic reversals technique in magnetic resonance force microscopy. We simulated the spin relaxation caused by thermal excitations of the high frequency…

Atomic force microscope (AFM) users often calibrate the spring constants of cantilevers using functionality built into individual instruments. This is performed without reference to a global standard, which hinders robust comparison of…

Quantifying the tip-sample interaction at the nanoscale in Amplitude Modulation mode AFM is challenging, especially when measuring in liquids. Here, we derive formulas for the tip-sample conservative and dissipative interactions and…

An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (OBD) method to infer the deflection of the cantilever. The…

We report on progress in developing compact sensors for atomic force microscopy (AFM), in which the mechanical transducer is integrated with near-field optical readout on a single chip. The motion of a nanoscale, doubly-clamped cantilever…

Optical tweezers (OT) have become an essential technique in several fields of physics, chemistry, and biology as precise micromanipulation tools and microscopic force transducers. Quantitative measurements require the accurate calibration…

A spreadsheet algorithm is given for the atomic force microscope that accounts for non-linear behavior in the deflection of the cantilever and in the photo-diode response. In addition, the data analysis algorithm takes into account…