Instrumentation and Detectors · Physics
Resonance frequency shift of strongly heated micro-cantilevers
Felipe Aguilar Sandoval, Mickael Geitner, Éric Bertin, Ludovic Bellon
2015-06-23
Instrumentation and Detectors · Physics
Optical diffraction for measurements of nano-mechanical bending
Rodolfo I. Hermans, Benjamin Dueck, Joseph Wafula Ndieyira, Rachel A. McKendry +1
2016-06-06
Quantum Physics · Physics
Optimizing the Signal to Noise Ratio of a Beam Deflection Measurement with Interferometric Weak Values
David J. Starling, P. Ben Dixon, Andrew N. Jordan, John C. Howell
2009-10-14
Applied Physics · Physics
Low-temperature AFM with a microwave cavity optomechanical transducer
Ermes Scarano, Elisabet K. Arvidsson, August K. Roos, Erik Holmgren +3
2025-07-01
Soft Condensed Matter · Physics
Microrheology measurements with a hanging-fiber AFM probe
Clemence Devailly, Justine Laurent, Audrey Steinberger, Ludovic Bellon +1
2013-11-12
Instrumentation and Detectors · Physics
Wide-Dynamic-Range Cantilever Magnetometry Using a Fiber-Optic Interferometer and its Application to High-frequency Electron Spin Resonance Spectroscopy
Hideyuki Takahashi, Tsubasa Okamoto, Eiji Ohmichi, Hitoshi Ohta
2016-11-02
Soft Condensed Matter · Physics
High Resolution Viscosity Measurement by Thermal Noise Detection
Felipe Aguilar Sandoval, Manuel Sepúlveda, Ludovic Bellon, Francisco Melo
2015-11-11
Quantum Physics · Physics
Ultrasensitive Beam Deflection Measurement via Interferometric Weak Value Amplification
P. Ben Dixon, David J. Starling, Andrew N. Jordan, John C. Howell
2009-06-29
Applied Physics · Physics
Multiphysics optomechanical sensing of a liquid on the micron scale
Hamidreza Neshasteh, Amideddin Mataji-Kojouri, Clément Le Fur, Ilan Shlesinger +5
2025-03-14
Applied Physics · Physics
Nanomechanical Design Strategy for Single-Mode Optomechanical Measurement
Giada La Gala, John P. Mathew, Pascal Neveu, Ewold Verhagen
2022-02-23
Mesoscale and Nanoscale Physics · Physics
Multidimensional optomechanical cantilevers for high frequency atomic force microscopy
C. Doolin, P. H. Kim, B. D. Hauer, A. J. R MacDonald +1
2014-03-11
Instrumentation and Detectors · Physics
Dynamic Calibration of Higher Eigenmode Parameters of a Cantilever in Atomic Force Microscopy Using Tip-Surface Interactions
Stanislav S. Borysov, Daniel Forchheimer, David B. Haviland
2014-12-01