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相关论文: Simulation of ion-implanted boron redistribution u…

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It has been shown that many of the phenomena related to the formation of "tails" in the low-concentration region of ion-implanted impurity distribution are due to the anomalous diffusion of nonequilibrium impurity interstitials. These…

材料科学 · 物理学 2015-05-30 O. I. Velichko , A. P. Kavaliova

A two stream model of boron diffusion in silicon has been developed. The model is intended for simulation of transient enhanced diffusion including redistribution of ion-implanted boron during low temperature annealing. The following…

材料科学 · 物理学 2011-05-24 O. I. Velichko , A. A. Hundorina

A model of the interstitial diffusion of ion-implanted boron during rapid thermal annealing of silicon layers previously amorphized by implantation of germanium has been proposed. It is supposed that the boron interstitials are generated…

材料科学 · 物理学 2009-05-01 O. I. Velichko , N. V. Kniazhava

It has been shown that during thermal treatments of silicon layers preamorphized by germanium implantation and then implanted with boron ions the transport of impurity atoms occurs right up to a temperature of 850^{\circ}C due to migration…

材料科学 · 物理学 2011-06-20 O. I. Velichko , A. A. Hundorina , V. V. Axenov

A theoretical investigation of the microscopic mechanisms provided the transient enhanced diffusion of boron atoms during rapid thermal annealing of silicon substrates doped by high fluence ion implantation was carried out. To compare the…

介观与纳米尺度物理 · 物理学 2010-07-23 O. I. Velichko , A. A. Hundoryna

A model of interstitial impurity migration is proposed which explains the redistribution of ion-implanted boron in low-temperature annealing of nonamorphized silicon layers. It is supposed that nonequilibrium boron interstitials are…

材料科学 · 物理学 2015-04-15 O. I. Velichko

To simulate the transient enhanced diffusion near the surface or interface, a set of equations describing the impurity diffusion and quasichemical reactions of dopant atoms and point defects in ion-implanted layers is proposed and analyzed.…

材料科学 · 物理学 2007-05-23 O. I. Velichko , Yu. P. Shaman , A. K. Fedotov , A. V. Masanik

Modeling of ion-implanted boron redistribution in silicon crystals during low-temperature annealing with a small thermal budget has been carried out. It was shown that formation of "tails"' in the low-concentration region of impurity…

材料科学 · 物理学 2015-06-05 O. I. Velichko , A. P. Kavaliova

Modeling of the long-range migration of boron interstitials during low temperature annealing of ion-implanted silicon crystals has been carried out.

材料科学 · 物理学 2012-07-04 O. I. Velichko , A. P. Kavaliova

The analytical solutions of the equations describing impurity diffusion due to migration of nonequilibrium impurity interstitials were obtained for the impurity redistribution during ion implantation at elevated temperatures and for…

材料科学 · 物理学 2008-02-24 O. I. Velichko , N. A. Sobolevskaya

The mechanism underlying the long-range interstitial migration of nonequilibrium impurity interstitial species is used to simulate arsenic redistribution in ion implantation. An excellent agreement of the calculated arsenic concentration…

材料科学 · 物理学 2015-06-11 O. I. Velichko

The model of hydrogen migration and of the reactions of hydrogen atoms with electrically active impurity, developed earlier, has been applied to simulate hydrogen diffusion and passivation process during plasma deuteration of silicon…

材料科学 · 物理学 2015-06-12 O. I. Velichko , Yu. P. Shaman , A. P. Kovaliova

Modeling of the phosphorus radiation-enhanced diffusion in the course of implantation of high-energy protons into an elevated-temperature silicon substrate and during its treatment in a hydrogen-containing plasma with addition of a…

材料科学 · 物理学 2014-10-24 O. I. Velichko

An analytical solution of the equations describing impurity diffusion due to the migration of nonequilibrium impurity interstitial atoms was obtained for the case of the Robin boundary condition on the surface of a semiconductor. The…

材料科学 · 物理学 2008-02-26 O. I. Velichko , N. A. Sobolevskaya

Laser blow-off injections of aluminum and tungsten have been performed on the DIII-D tokamak to investigate the variation of impurity transport in a set of dedicated ion and electron heating scans with a fixed value of the external torque.…

Modeling of radiation-enhanced diffusion of boron and phosphorus atoms during irradiation of silicon substrates respectively with high- and low-energy protons was carried out. The results obtained confirm the previously arrived conclusion…

材料科学 · 物理学 2014-07-15 Oleg Velichko

The equation of impurity diffusion due to formation, migration, and dissolution of the pairs "impurity atom - intrinsic point defect" taking into account the nonuniform distributions of nonequilibrium point defects and drift of the pairs in…

材料科学 · 物理学 2011-06-14 O. I. Velichko , V. A. Burko

The model of transient enhanced diffusion of ion-implanted As is formulated and the finite-difference method for numerical solution of the system of equations obtained is developed. The nonuniform distribution of point defects near the…

材料科学 · 物理学 2007-05-23 O. I. Velichko , A. M. Mironov , V. A. Tsurko , G. M. Zayats

Spatiotemporal dynamics of electron-hole pairs locally excited in a silicon-on-insulator structure by indirect interband absorption are studied by measuring differential transmission caused by free-carrier absorption of a probe pulse tuned…

介观与纳米尺度物理 · 物理学 2009-11-13 Hui Zhao

Long-timescale simulations of the diffusion of a H$_2$O admolecule on the (0001) basal plane of ice Ih were carried out over a temperature range of 100 to 200 K using the adaptive kinetic Monte Carlo method and TIP4P/2005f interaction…

计算物理 · 物理学 2015-08-04 Andreas Pedersen , Leendertjan Karssemeijer , Herma M. Cuppen , Hannes Jónsson
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